Effect of Solder Mask Thickness on Shear and Pull Tests of Lead-Free Solder Balls
The present study is aimed at investigating the effect of solder mask thickness on the solder ball shear test. Compared to the ball pull test, less brittle failures were found in the ball shear test. This is most likely caused by the support of solder mask. So far there is not publication reporting the effect of solder mask in detail. In this paper, specimens with various thicknesses of solder mask were fabricated and a series of ball shear tests were conducted. Cold ball pull (CBP) tests were performed as well for parallel studies. The attachment strength of solder balls under multiple reflows was evaluated as an index for comparison. The test results indicate that, in ball shear tests, brittle failures can be identified more easily in specimens with thinner solder mask after multiple reflows, especially for tests with higher shear speed and more reflows. No obvious effect of solder mask thickness on the ball pull test was found, regardless of different pulling speeds and multiple reflows.