Heterodyne Detection Signal Analysis in Apertureless Scanning Near-Field Optical Microscopy

Author(s):  
C. H. Chuang ◽  
Y. L. Lo

Apertureless scattering near-field optical microscopy (A-SNOM) is generally performed using a heterodyne detection technique since it provides a higher signal-to-noise (S/N) ratio than homodyne detection. Accordingly, this study constructs a robust interference-based model of the detection signal which takes account of both the tip enhancement phenomena and the tip reflective background electric field to analyze the amplitude and phase of heterodyne detection signals at different harmonics of the tip vibration frequency. The analytical results indicate that the high-order harmonic tip scattering noise decays more rapidly with a high-order Bessel function for small phase modulation depths than the near-field interaction signal. It is also shown that the signal contrast improves as the wavelength of the illuminating light source is increased or the incident angle is reduced. As compared with homodyne technique, it can be found the signal contrast is much improved in visible region in heterodyne technique. The results presented in this study provide an improved understanding of the complex signal detected in the heterodyne A-SNOM technique and suggest potential means of improving its S/N ratio such that the signal contrast of heterodyne A-SNOM can be improved.

Author(s):  
E. Betzig ◽  
M. Isaacson ◽  
H. Barshatzky ◽  
K. Lin ◽  
A. Lewis

The concept of near field scanning optical microscopy was first described more than thirty years ago1 almost two decades before the validity of the technique was verified experimentally for electromagnetic radiation of 3cm wavelength.2 The extension of the method to the visible region of the spectrum took another decade since it required the development of micropositioning and aperture fabrication on a scale five orders of magnitude smaller than that used for the microwave experiments. Since initial reports on near field optical imaging8-6, there has been a growing effort by ourselves6 and other groups7 to extend the technology and develop the near field scanning optical microscope (NSOM) into a useful tool to complement conventional (i.e., far field) scanning optical microscopy (SOM), scanning electron microscopy (SEM) and scanning tunneling microscopy. In the context of this symposium on “Microscopy Without Lenses”, NSOM can be thought of as an addition to the exploding field of scanned tip microscopy although we did not originally conceive it as such.


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