Hydrogen silsesquioxane bilayer resists—Combining high resolution electron beam lithography and gentle resist removal

Author(s):  
Marcus Rommel ◽  
Jürgen Weis
1984 ◽  
Vol 44 (4) ◽  
pp. 468-469 ◽  
Author(s):  
P. M. Mankiewich ◽  
H. G. Craighead ◽  
T. R. Harrison ◽  
A. H. Dayem

2016 ◽  
Author(s):  
Stefan Pfirrmann ◽  
Robert Kirchner ◽  
Olga Lohse ◽  
Vitaliy A. Guzenko ◽  
Anja Voigt ◽  
...  

1991 ◽  
Vol 70 (3) ◽  
pp. 1793-1799 ◽  
Author(s):  
E. A. Dobisz ◽  
C. R. K. Marrian ◽  
R. J. Colton

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