A pattern generation technique for serial electron‐beam microfabrication systems

1975 ◽  
Vol 12 (6) ◽  
pp. 1246-1250 ◽  
Author(s):  
F. S. Ozdemir ◽  
C. R. Buckey ◽  
E. D. Wolf
2020 ◽  
Vol 5 (4) ◽  
pp. 121
Author(s):  
Sisca Octarina ◽  
Devi Gusmalia Juita ◽  
Ning Eliyati ◽  
Putra Bahtera Jaya Bangun

Cutting Stock Problem (CSP) is the determination of how to cut stocks into items with certain cutting rules. A diverse set of stocks is called multiple stock CSP. This study used Pattern Generation (PG) algorithm to determine cutting pattern, then formulated it into a Gilmore and Gomory model and solved by using Column Generation Technique (CGT). Set Covering model was generated from Gilmore and Gomory model. Based on the results, selected cutting patterns in the first stage can be used in the second stage. The combination of patterns generated from Gilmore and Gomory model showed that the use of stocks was more effective than Set Covering model.  


2003 ◽  
Vol 20 (2) ◽  
pp. 248 ◽  
Author(s):  
T. Idé ◽  
M. Suzuki ◽  
M. Noguchi ◽  
H. Mizuta ◽  
H. Numata ◽  
...  

2018 ◽  
Vol 9 ◽  
pp. 2581-2598 ◽  
Author(s):  
Lukas Keller ◽  
Michael Huth

Fabrication of three-dimensional (3D) nanoarchitectures by focused electron beam induced deposition (FEBID) has matured to a level that highly complex and functional deposits are becoming available for nanomagnetics and plasmonics. However, the generation of suitable pattern files that control the electron beam’s movement, and thereby reliably map the desired target 3D structure from a purely geometrical description to a shape-conforming 3D deposit, is nontrivial. To address this issue we developed several writing strategies and associated algorithms implemented in C++. Our pattern file generator handles different proximity effects and corrects for height-dependent precursor coverage. Several examples of successful 3D nanoarchitectures using different precursors are presented that validate the effectiveness of the implementation.


1982 ◽  
Vol 40 (1) ◽  
pp. 93-95 ◽  
Author(s):  
Paul H. Schmidt ◽  
David C. Joy ◽  
Martin L. Kaplan ◽  
William L. Feldmann

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