In situ stress measurements on niobium nitride thin films produced by hollow cathode enhanced direct current reactive magnetron sputtering

1991 ◽  
Vol 9 (4) ◽  
pp. 2442-2446 ◽  
Author(s):  
David F. Dawson‐Elli ◽  
David Plantz ◽  
Donald S. Stone ◽  
James E. Nordman
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