Investigation of electron-beam-induced phase transitions in amorphous aluminum trifluoride thin films using transmission electron microscopy
1999 ◽
Vol 17
(2)
◽
pp. 403-410
◽
1995 ◽
Vol 10
(1)
◽
pp. 26-33
◽
1968 ◽
Vol 26
◽
pp. 392-393
2002 ◽
Vol 82
(15)
◽
pp. 2825-2839
◽
1971 ◽
Vol 29
◽
pp. 204-205
1972 ◽
Vol 30
◽
pp. 544-545
Transmission Electron Microscopy studies of texture of Cr underlayer of magnetic recording hard disk
1991 ◽
Vol 49
◽
pp. 580-581
1990 ◽
Vol 48
(2)
◽
pp. 336-337
1986 ◽
Vol 44
◽
pp. 88-91