Evidence of Ge island formation during thermal annealing of SiGe alloys: Combined atomic force microscopy and Auger electron spectroscopy study
1998 ◽
Vol 16
(1)
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pp. 137
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1999 ◽
Vol 142
(1-4)
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pp. 591-597
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1989 ◽
Vol 23
(11)
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pp. 1969-1973
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Keyword(s):
1982 ◽
Vol 129
(2)
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pp. 406-408
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1997 ◽
Vol 25
(5)
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pp. 352-355
2006 ◽
Vol 83
(1)
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pp. 12-16
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Keyword(s):