Dewetting of Polymer Bilayers: Morphology and Kinetics

1994 ◽  
Vol 366 ◽  
Author(s):  
Alessandro Faldi ◽  
Karen I. Winey ◽  
Russell J. Composto
Keyword(s):  
Atomic Force Microscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Weight Percent ◽  
Force Microscopy ◽  
Atomic Force ◽  
Polymer Bilayers ◽  
Hole Profile ◽  
Interfacial Thermodynamics ◽  
Kinetics Of

ABSTRACTThe kinetics of de-wetting a polycarbonate (PC) film from a poly(styrene-coacrylonitrile) (SAN) copolymer film was monitored using optical microscopy. Whereas the SAN layer was stable upon annealing at 190°C, the PC layer dewetted the SAN and formed holes whose diameter increased linearly with time. Auger electron spectroscopy measurements confirmed that PC was fully removed from the interior of the hole. Upon varying the AN content, the dewetting velocity was found to be a minimum near 0.27 weight percent AN. This result is consistent with the interfacial thermodynamics between PC and SAN. Atomic force microscopy was used to provide a unique image of the hole profile.

Copper Diffusion Into Aluminum-Silicon Metallizations by Accelerated Thermal and Electrical Stressing

1996 ◽  
Vol 428 ◽  
Author(s):  
G. O. Ramseyer ◽  
L. H. Walsh ◽  
J. V. Beasock ◽  
H. F. Helbig ◽  
R. C. Lacoe ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Depth Profiling ◽  
Copper Diffusion ◽  
Force Microscopy ◽  
Atomic Force ◽  
Line Widths ◽  
Electromigration Lifetime

AbstractPatterned 930 nm Al(1%-Si) interconnects over 147 nm of Cu were electromigration lifetime tested at 1.0–1.5 × 105 A/cm2 at 250 °C. The morphology of the surfaces of the electromigrated stripes with different line widths and times to failure were characterized by atomic force microscopy, and changes in surface roughness were compared. The diffusion of copper into the electromigrated aluminum stripes was determined by depth profiling using Auger electron spectroscopy. In particular, areas where hillocks formed were examined and compared to areas of median roughness.

scholarly journals Формирование упорядоченных кремниевых структур на поверхности графита

2019 ◽  
Vol 61 (8) ◽  
pp. 1532
Author(s):  
А.А. Ревегук ◽  
А.Е. Петухов ◽  
А.А. Вишнякова ◽  
А.В. Королева ◽  
Д.А. Пудиков ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electronic Structure ◽  
Surface Morphology ◽  
Auger Electron Spectroscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Force Microscopy ◽  
Final Structure ◽  
Atomic Force ◽  
Silicon Structures

The work investigated the formation possibility of ordered silicon structures, including silicene, on the graphite substrates surface. The various conditions influence on the silicon atoms deposition on the final structure was also studied. Surface morphology information was obtained by atomic force microscopy, and the electronic structure was measured by Auger electron spectroscopy.

Sign in / Sign up

Export Citation Format

Share Document