Internal thermal emission analysis of an IR seeker

1992 ◽  
Author(s):  
Daniel M. Brown
Keyword(s):  
Thermal Emission ◽  
Emission Analysis

Application of Backside Photo and Thermal Emission Microscopy Techniques to Advanced Memory Devices

1997 ◽  
Author(s):  
S.-S. Lee ◽  
J.-S. Seo ◽  
N.-S. Cho ◽  
S. Daniel
Keyword(s):  
Thermal Emission ◽  
Test Cases ◽  
Memory Devices ◽  
Front Side ◽  
Emission Analysis ◽  
Intensity Attenuation ◽  
Analysis Techniques ◽  
Defect Sites ◽  
Emission Microscopy ◽  
Microscopy Techniques

Abstract Both photo- and thermal emission analysis techniques are used from the backside of the die colocate defect sites. The technique is important in that process and package technologies have made front-side analysis difficult or impossible. Several test cases are documented. Intensity attenuation through the bulk of the silicon does not compromise the usefulness of the technique in most cases.

scholarly journals Heat-emission analysis of small combustion equipments for biomass

2011 ◽  
Vol 57 (No. 2) ◽  
pp. 37-50 ◽  
Author(s):  
J. Malaťák ◽  
L. Passian
Keyword(s):  
Hydrogen Chloride ◽  
Thermal Emission ◽  
Calorific Value ◽  
Heat Emission ◽  
Heat Output ◽  
Emission Analysis ◽  
Stoichiometric Analysis ◽  
Herbaceous Biomass ◽  
Elemental Analyses ◽  
Selection Of

The article addresses the urgent questions regarding the use of biomass as a fuel for combustion equipment of the heat output up to 25 kW. The article is based on the determined elemental analyses of six samples of fuel taken both from the wood mass and herbaceous biomass. These samples underwent the stoichiometric analysis of fuels. After the stoichiometric analysis the heat-emission characteristics were determined on two combustion equipments. The results of carried out elemental and stoichiometric analyses indicate higher values of nitrogen, sulphur and chlorine concentration in herbaceous biomass from agriculture compared to the analyzed wood mass. The selection of combustion equipment is particularly influenced by increased contents of sulphur and chlorine (corrosive behaviour). The net calorific value of the analyzed samples taken from the wood mass is higher than of samples taken from the herbaceous biomass. The net calorific value of fuels from herbaceous biomass is reduced due to a higher content of ashes in the fuel. The results of thermal-emission analyses show higher values of nitrogen oxides, sulphur and chlorine concentrations in the herbaceous biomass compared to the analyzed wood mass. The emission concentrations of carbon monoxide for wood fuels and herbaceous biomass also depend on the type of combustion equipment and setting of combustion air volume. The increased emissions of hydrogen chloride generated by various combustion equipments are primarily caused by the volume of combustion air and the amount of chlorine in the fuel itself. The higher the volume of combustion air brought into the combustion chamber is, the higher the emissions of hydrogen chloride are. Based on the analyses we can also draw a conclusion that the spaces of combustion equipment during combustion should be most burdened with the herbaceous biomass.

scholarly journals Thermal Emission analysis to predict damage in specimens of High Strength Concrete

2020 ◽  
Vol 15 (55) ◽  
pp. 258-270
Author(s):  
Filippo Cucinotta ◽  
Antonino D'Aveni ◽  
Eugenio Guglielmino ◽  
Antonino Risitano ◽  
Giacomo Risitano ◽  
...  
Keyword(s):  
High Strength Concrete ◽  
Critical Stress ◽  
Thermal Emission ◽  
Load Condition ◽  
High Strength ◽  
Maximum Load ◽  
Element Analysis ◽  
Emission Analysis ◽  
Strength Concrete ◽  
Fatigue Rupture

In this paper thermal analysis was applied to determine the “Critical Stress” of concrete, different from its ultimate strength, able to produce the first damage in the structures under compressive loads. The Critical Stress can be thought as the stress able to produce the beginning of fatigue rupture within the material. Several specimens of high strength concrete were tested in order to define the incipient crack phenomena, also in internal part of the specimen not accessible by direct inspections, with the aid of infrared thermography. A finite element analysis completes the study and compares, for the same static loading conditions, the stress state with the experimental thermographic images. The final results show as the coupling of normal compressive test and the acquisition of the thermal images can be a useful aid to estimate a security stress value, indeed the Critical Stress, before the Ultimate Serviceability Limit (SLU) of the structure, defined as the maximum load condition before its failure.

Through Package Defect Localization by Lock-In Thermography

2011 ◽  
Vol 2011 (DPC) ◽  
pp. 002160-002198
Author(s):  
Rudolf Schlangen ◽  
Herve Deslandes ◽  
Toru Toda ◽  
Toshinobu Nagatomo ◽  
Shigeki Sako ◽  
...  
Keyword(s):  
High Resolution ◽  
Thermal Emission ◽  
Emission Analysis ◽  
X Ray ◽  
Root Cause ◽  
Defect Localization ◽  
Thermal Defect ◽  
Focus Analysis ◽  
Lock In ◽  
Non Destructive

Root cause analysis for package defects is currently performed by de-processing the package until such defects can be physically seen. However, many such defects within the package are removed, or are confused with defects created during de-processing itself. 3D X-ray has been used to analyze such physical defects within a packaged device in a non-destructive manner. However, the increasing density and associated shrinkage of components such as multi-layered substrates require significantly higher resolutions, which translates to longer times. High resolution X-ray is impractical when searching for a defect over a wide area due to the time to acquire detailed 3D images (~24 hrs). Thermal emission analysis has been widely used for localizing defects on ICs. Recent advancement in thermal emission camera technology coupled with lock-in thermography has allowed orders of magnitude better sensitivity ( < 1μW) and improvement in localization resolution (x,y to < 3 um). However, the application of lock-in thermography has been primarily limited to defect localization at the die level [1]. A a highly sensitive MWIR camera combined with a real time lock-in technique demonstrates the capability to localize defects within packaged devices, even through its mold compound. The technique accurately predicts the depth (z) of a thermal defect within the device (< + 5%) This paper will demonstrate multiple examples of the successful combination of advanced lock-in thermography analysis and high resolution 3D X-ray for totally non-destructive defect location within a packaged device. This initial accurate thermal localization in x, y and z enables the high resolution 3D X-ray system to focus analysis to a few microns so that the defect can be seen quickly (< 1 hr), enabling detection and analysis of previously undetected defects with highest throughput.

Measurement of lattice parameter at the nanometer scale using convergent-beam microdiffraction from a thermal emission source

1993 ◽  
Vol 51 ◽  
pp. 690-691
Author(s):  
W. T. Pike
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Thermal Emission ◽  
Lattice Parameter ◽  
Scanning Transmission Electron Microscope ◽  
Emission Source ◽  
Device Structure ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Convergent Beam

With the advent of crystal growth techniques which enable device structure control at the atomic level has arrived a need to determine the crystal structure at a commensurate scale. In particular, in epitaxial lattice mismatched multilayers, it is of prime importance to know the lattice parameter, and hence strain, in individual layers in order to explain the novel electronic behavior of such structures. In this work higher order Laue zone (holz) lines in the convergent beam microdiffraction patterns from a thermal emission transmission electron microscope (TEM) have been used to measure lattice parameters to an accuracy of a few parts in a thousand from nanometer areas of material.Although the use of CBM to measure strain using a dedicated field emission scanning transmission electron microscope has already been demonstrated, the recording of the diffraction pattern at the required resolution involves specialized instrumentation. In this work, a Topcon 002B TEM with a thermal emission source with condenser-objective (CO) electron optics is used.

In-Situ Observation and Acoustic Emission Analysis for Corrosion Pitting of MgCl2 Droplet in SUS304 Stainless Steel

2012 ◽  
Vol 53 (6) ◽  
pp. 1069-1074 ◽  
Author(s):  
Mitsuharu Shiwa ◽  
Hiroyuki Masuda ◽  
Hisashi Yamawaki ◽  
Kaita Ito ◽  
Manabu Enoki
Keyword(s):  
Stainless Steel ◽  
Acoustic Emission ◽  
Emission Analysis ◽  
Sus304 Stainless Steel ◽  
Corrosion Pitting ◽  
Acoustic Emission Analysis

Dc arc emission analysis of rare earth metals and their oxides with sorption preconcentration of impurities

2018 ◽  
Vol 84 (11) ◽  
pp. 9-14
Author(s):  
E. S. Koshel ◽  
V. B. Baranovskaya ◽  
M. S. Doronina
Keyword(s):  
Rare Earth ◽  
Rare Earth Metals ◽  
Analytical Signal ◽  
Graphite Powder ◽  
Atomic Emission ◽  
Standard Samples ◽  
Emission Analysis ◽  
Sorption Preconcentration ◽  
Sample Shape

The analytical capabilities of arc atomic emission determination of As, Bi, Sb, Cu, Te in rare earth metals (REM) and their oxides after preparatory group concentration using S,N-containing heterochain polymer sorbent are studied on a high-resolution spectrometer “Grand- Extra” (“WMC-Optoelectron-ics” company, Russia). Sorption kinetics and dependence of the degree of the impurity extraction on the solution acidity are analyzed to specify conditions of sorption concentration. To optimize the procedure of arc atomic emission determination of As, Bi, Sb, Cu, and Te various schemes of their sorption preconcentration and subsequent processing of the resulted concentrate with the addition of a collector at different stages of the sorption process have been considered. Graphite powder is used as a collector in analysis of rare earth oxides due to universality and relative simplicity of the emission spectrum. Conditions of analysis and parameters of the spectrometer that affect the analytical signal (mass and composition of the sample, shape and size of the electrodes, current intensity and generator operation mode, interelectrode spacing, wavelengths of the analytical lines) are chosen. The evaporation curves of the determinable impurities were studied and the exposure time of As, Bi, Sb, Cu, and Te in the resulted sorption concentrate was determined. Correctness of the obtained results was evaluated using standard samples of the composition and in comparisons between methods. The results of the study are used to develop a method of arc chemical-atomic emission analysis of yttrium, gadolinium, neodymium, europium, scandium and their oxides in a concentration range of n x (10-2 - 10-5) wt.%.

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