In Situ Visualization Of A Solid-Liquid Interface During Crystal Growth

1988 ◽  
Author(s):  
S B. Trivedi ◽  
T S. Ananthanarayanan ◽  
R G. Rosemeier ◽  
J J. Kennedy
Crystals ◽  
2020 ◽  
Vol 11 (1) ◽  
pp. 25
Author(s):  
Xia Tang ◽  
Botao Liu ◽  
Yue Yu ◽  
Sheng Liu ◽  
Bing Gao

The difficulties in growing large-size bulk β-Ga2O3 single crystals with the Czochralski method were numerically analyzed. The flow and temperature fields for crystals that were four and six inches in diameter were studied. When the crystal diameter is large and the crucible space becomes small, the flow field near the crystal edge becomes poorly controlled, which results in an unreasonable temperature field, which makes the interface velocity very sensitive to the phase boundary shape. The effect of seed rotation with increasing crystal diameter was also studied. With the increase in crystal diameter, the effect of seed rotation causes more uneven temperature distribution. The difficulty of growing large-size bulk β-Ga2O3 single crystals with the Czochralski method is caused by spiral growth. By using dynamic mesh technology to update the crystal growth interface, the calculation results show that the solid–liquid interface of the four-inch crystal is slightly convex and the center is slightly concave. With the increase of crystal growth time, the symmetry of cylindrical crystal will be broken, which will lead to spiral growth. The numerical results of the six-inch crystal show that the whole solid–liquid interface is concave and unstable, which is not conducive to crystal growth.


2020 ◽  
Vol 10 (16) ◽  
pp. 5362-5385
Author(s):  
Leila Negahdar ◽  
Christopher M. A. Parlett ◽  
Mark A. Isaacs ◽  
Andrew M. Beale ◽  
Karen Wilson ◽  
...  

Many industrially important chemical transformations occur at the interface between a solid catalyst and liquid reactants. In situ and operando spectroscopies offer unique insight into the reactivity of such catalytically active solid–liquid interfaces.


1991 ◽  
Vol 237 ◽  
Author(s):  
Richard D. Robinson ◽  
Ioannis N. Miaoulis

ABSTRACTThis paper presents a new experimental method to investigate solid-liquid interface morphologies during Zone-Melting-Recrystallization at lower than the typical processing temperatures. Gallium films were used as a substitute for silicon films. In situ preliminary investigation identified three phenomena typically occurring during ZMR of silicon films: a) Transition from planar to dendritic to cellular morphologies was observed for different processing conditions; b) cell period proved to be dependant on scanning velocity; c) instabilities at the solidification interface at low heating strip temperatures were caused by supercooling and optical property variations as the material changed phase.


1994 ◽  
Vol 29 (15) ◽  
pp. 3997-4000 ◽  
Author(s):  
Wang Fengquan ◽  
Chen Shiyu ◽  
He Deping ◽  
Wei Bingbo ◽  
Shu Guangji

2005 ◽  
Vol 16 (1-4) ◽  
pp. 107-110
Author(s):  
A. P. Shpak ◽  
O. P. Fedorov ◽  
E. L. Zhivolub ◽  
Y. J. Bersudskyy ◽  
O. V. Shuleshova

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