Hydroconversion of n-Hexadecane on Zeolite-Containing Sulfide-Based Catalysts: Influence of Nitrogen Impurity in the Feedstock on the Hydroisomerization Selectivity

Author(s):  
N. A. Vinogradov ◽  
M. I. Rubtsova ◽  
A. P. Glotov ◽  
N. V. Tochilin ◽  
V. A. Vinokurov ◽  
...  
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2012 ◽  
Vol 100 (4) ◽  
pp. 042106 ◽  
Author(s):  
Michio Ikezawa ◽  
Yoshiki Sakuma ◽  
Liao Zhang ◽  
Yosinori Sone ◽  
Tatsuya Mori ◽  
...  

2020 ◽  
Vol 27 (10) ◽  
pp. 103511
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YuanYuan Jiang ◽  
Yanhui Wang ◽  
Shiyuan Cong ◽  
Jiao Zhang ◽  
Dezhen Wang

2008 ◽  
Vol 85 (10) ◽  
pp. 2005-2008 ◽  
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M. Gregoire ◽  
S. Zoll ◽  
R. Beneyton ◽  
S. Del-Medico ◽  
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2007 ◽  
Vol 989 ◽  
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Hajime Shirai ◽  
Yusuke Sakurai ◽  
Mina Ye ◽  
Koji Haruta ◽  
Tomohiro Kobayashi ◽  
...  

AbstractThe rapid crystallization of amorphous silicon utilizing the rf inductive coupling thermal plasma jet of argon is demonstrated. Highly crystallized a-Si films were fabricated on th-SiO2 and textured a-Si:H:B/SnO2/glass by adjusting the translational velocity of the substrate stage. The H concentration in the films decreased from 1021 cm-3 to 1019 cm-3 with no marked increases in oxygen and nitrogen impurity concentrations and defect density. The crystallization proceeds from the bottom to front surface in terms of the volume expansion during the solidification and crystallization of liquid Si.


Sequences of high Bragg-angle (0 B = 74°) double-crystal X-ray topographs taken at the SRS (Daresbury, U.K.) have yielded precise measurements of lattice parameter differences between growth sectors of different crystallographic forms in a large undoped synthetic diamond whose type Ib infrared absorption spectrum (principal peak at 1130 cm -1 ) indicated atomically dispersed nitrogen, singly substituting for carbon, as the only detectable impurity. The plate-shaped specimen, polished parallel to (110), 5.0 x 3.2 mm 2 in area, 0.7 mm thick, possessed an unusually well developed (110) growth sector containing nitrogen impurity concentration of only ca. 10 -6 , which served as an internal standard of pure-diamond lattice parameter with which lattice parameters of nitrogen-containing growth sectors were compared. The specimen’s suitability for precision diffractometry was checked by comprehensive tests using optical microscope techniques, cathodoluminescence and single-crystal X-ray topography. The double-crystal combination was silicon reference crystal, asymmetric 175 reflection, with diamond specimen symmetrical 440 reflection. The principal measurement was the increase of the lattice parameter, a 0 , of the (111) growth sector (nitrogen content 88 + 7 parts per 10 6 atomic) relative to that of the (110) sector: Aa 0 / a 0 = 1.18 + 0.07 x 10 -5 . In terms of measured infrared absorption coefficient at 1130 cm -1 , this gives Aa 0/a 0 = (2.95 + 0.27) x 10 -6 [p(1130 cm -1 )/cm -1 ], which is believed to hold for growth sectors of all crystallographic forms. Combination with the nitrogen assay findings of Woods, van Wyk & Collins ( Phil. Mag. B 62. 589-595 (1990)) provides a direct relation to c N , the fractional atomic concentration of substitutional nitrogen, as A a 0 / a 0 = (0.14 + 0.02) c N , which indicates that the effective volume of a single substitutional nitrogen atom in diamond is 1.41 +0.06 times that of the carbon atom it replaces. This substantial dilatation conflicts with several models for the substitutional nitrogen structure.


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