Local charge-carrier trapping centers in C60 single crystals

2006 ◽  
Vol 48 (9) ◽  
pp. 1827-1830 ◽  
Author(s):  
Yu. I. Golovin ◽  
D. V. Lopatin ◽  
R. K. Nikolaev ◽  
A. A. Samodurov ◽  
R. A. Stolyarov
Keyword(s):  
Charge Carrier ◽  
Single Crystals ◽  
Carrier Trapping ◽  
Local Charge ◽  
Trapping Centers ◽  
Charge Carrier Trapping

Study of charge carrier trapping by EPR and TSL methods in ZnxMg1-xWO4 single crystals

2019 ◽  
Vol 96 ◽  
pp. 109362 ◽  
Author(s):  
N. Krutyak ◽  
D. Spassky ◽  
V. Nagirnyi ◽  
M. Buryi ◽  
I. Tupitsyna ◽  
...  
Keyword(s):  
Charge Carrier ◽  
Single Crystals ◽  
Carrier Trapping ◽  
Charge Carrier Trapping

Nonvolatile memory devices based on carbon nano-dot doped poly(vinyl alcohol) composites with low operation voltage and high ON/OFF ratio

RSC Advances ◽  
2015 ◽  
Vol 5 (34) ◽  
pp. 26886-26890 ◽  
Author(s):  
Lingqiang Meng ◽  
Minhuan Lan ◽  
Liang Guo ◽  
Lisha Xie ◽  
Hui Wang Hui Wang ◽  
...  
Keyword(s):  
Charge Carrier ◽  
Hydrothermal Method ◽  
Vinyl Alcohol ◽  
Nonvolatile Memory ◽  
Poly Vinyl Alcohol ◽  
Memory Devices ◽  
Carrier Trapping ◽  
Nonvolatile Memory Devices ◽  
Trapping Centers ◽  
Charge Carrier Trapping

Carbon nano-dots were synthesized by a hydrothermal method and integrated into the poly(vinyl alcohol) matrix as charge carrier trapping centers for nonvolatile memory devices.

Electron and hole trapping in Eu- or Eu,Hf-doped LuPO4 and YPO4 tracked by EPR and TSL spectroscopy

2019 ◽  
Vol 7 (37) ◽  
pp. 11473-11482 ◽  
Author(s):  
Valentin Laguta ◽  
Maksym Buryi ◽  
Martin Nikl ◽  
Justyna Zeler ◽  
Eugeniusz Zych ◽  
...  
Keyword(s):  
Charge Carrier ◽  
Single Crystals ◽  
Epr Spectroscopy ◽  
X Rays ◽  
Carrier Trapping ◽  
Hole Trapping ◽  
Charge Carrier Trapping

EPR spectroscopy in X- and Q-bands was employed to trace charge carrier trapping upon exposure to X-rays of LuPO4:Eu, LuPO4:Eu,Hf and YPO4:Eu,Hf flux-grown single crystals, as well as LuPO4:Eu sintered ceramics.

Intrinsic point defects and charge carrier trapping in monolayer BiOX (X = I, Br, and Cl)

2021 ◽  
Author(s):  
Haixi Pan ◽  
Liping Feng ◽  
Xiaodong Zhang ◽  
Yang Chen ◽  
Gangquan Li ◽  
...  
Keyword(s):  
Charge Carrier ◽  
Point Defects ◽  
Carrier Trapping ◽  
Intrinsic Point Defects ◽  
Charge Carrier Trapping

Manganese as a fast charge carrier trapping center in InP

2006 ◽  
Vol 382 (1-2) ◽  
pp. 220-228 ◽  
Author(s):  
K.P. Korona ◽  
A. Wysmolek ◽  
M. Kamińska ◽  
A. Twardowski ◽  
M. Piersa ◽  
...  
Keyword(s):  
Charge Carrier ◽  
Trapping Center ◽  
Fast Charge ◽  
Carrier Trapping ◽  
Charge Carrier Trapping
Sign in / Sign up

Export Citation Format

Share Document