Variation in Degree of Hornblende Grain Alignment within two Boudinage Structures

1971 ◽  
Vol 8 (1) ◽  
pp. 144-149 ◽  
Author(s):  
W. M. Schwerdtner ◽  
P. M. Sheehan ◽  
J. C. Rucklidge
Keyword(s):  
Inverse Relationship ◽  
Finite Strain ◽  
Great Circle ◽  
Preferred Orientation ◽  
Grain Alignment ◽  
X Ray ◽  
Fabric Diagrams ◽  
Principal Directions

The degree of preferred orientation of hornblende in two boudinage structures is analyzed by means of an X-ray texture goniometer. Relative values of reflected intensity for {110} are plotted on the stereographic net, and contoured at convenient intervals. As in conventional fabric diagrams for hornblende, {110} define a great-circle girdle whose breadth reveals the density of unimodal grouping of [001].The density of grouping of [001] varies throughout both boudinage structures. It decreases with increasing extension in structure A, and seems to have a similar trend in structure B, where the determined variation in degree of grain alignment is of doubtful statistical significance.The inverse relationship between the degree of preferred orientation and the magnitude of extension may be attributed to rotation of the principal directions of finite strain during syntectonic crystallization. Alternatively, reorientation of strained grains by annealing recrystallization may have produced the inverse trend.

Absorption Corrections in X‐Ray Studies of Preferred Orientation

1949 ◽  
Vol 20 (3) ◽  
pp. 173-174 ◽  
Author(s):  
R. Smoluchowski ◽  
R. W. Turner
Keyword(s):  
Preferred Orientation ◽  
X Ray

NbN Thin Film of Alternating Textures

2017 ◽  
Vol 898 ◽  
pp. 1431-1437
Author(s):  
Hong Yang Shao ◽  
Kan Zhang ◽  
Yi Dan Zhang ◽  
Mao Wen ◽  
Wei Tao Zheng
Keyword(s):  
Deposition Time ◽  
Peak Position ◽  
Preferred Orientation ◽  
Intrinsic Stress ◽  
Competitive Growth ◽  
X Ray Diffraction ◽  
X Ray ◽  
Orientation Distributions ◽  
Different Thickness ◽  
Deposited Films

The δ-NbN thin films with different thickness have been prepared by reactive magnetron sputtering at different deposition time and exhibited alternating textures between (111) and (200) orientations as a function of thickness. In addition, the grain size, peak position, morphology, residual stress and orientation distributions of the deposited films were explored by X-ray diffraction, low-angel X-ray reflectivity, scanning electron microscopy and surface profiler. The film deposited at 300 s showed a (111) preferred orientation, changing to (200) preferred orientation at 600 s, and exhibited alternating textures between (111) and (200) preferred orientations. With further increasing deposition time, in which (200) peak position and the full width at half maximum of (111) peak also displayed a trend of alternating variation with varying deposition time. The intrinsic stress for δ-NbN films calculated by Stoney equation alternately changed with alternating textures, in which (111) orientation always takes place at relatively high intrinsic stress state and vice versa. Meanwhile, the film with (111) preferred orientation showed higher density than (200) preferred orientation. The film deposited at 4800 s owned a mixed texture of (111) and (200), showing an anisotropy distribution of (111)-oriented and (200)-oriented grains, while film deposited at 7200 s owned a strong (200) texture, displaying an isotropy distribution of (200)-oriented grains. The competitive growth between (111)-oriented and (200)-oriented grains was responsibility for alternating texture.

Template Synthesis of Indium Nanowires Using Anodic Aluminum Oxide Membranes

2008 ◽  
Vol 8 (9) ◽  
pp. 4488-4493 ◽  
Author(s):  
Feng Chen ◽  
Adrian H. Kitai
Keyword(s):  
Aluminum Oxide ◽  
Template Synthesis ◽  
Anodic Aluminum Oxide ◽  
Preferred Orientation ◽  
Hydraulic Pressure ◽  
X Ray Diffraction ◽  
Aao Template ◽  
X Ray ◽  
Anodic Aluminum ◽  
Oxide Membranes

Indium nanowires with diameters approximately 300 nm have been synthesized by a hydraulic pressure technique using anodic aluminum oxide (AAO) templates. The indium melt is injected into the AAO template and solidified to form nanostructures. The nanowires are dense, continuous and uniformly run through the entire ∼60 μm thickness of the AAO template. X-ray diffraction (XRD) reveals that the nanowires are polycrystalline with a preferred orientation. SEM is performed to characterize the morphology of the nanowires.

Use of an air brush to spray dry samples for X-ray powder diffraction

Clay Minerals ◽  
1999 ◽  
Vol 34 (1) ◽  
pp. 127-135 ◽  
Author(s):  
S. Hillier
Keyword(s):  
Bulk Density ◽  
Powder Diffraction ◽  
Marked Improvement ◽  
Smooth Surface ◽  
Preferred Orientation ◽  
Spray Drier ◽  
Spray Dry ◽  
X Ray ◽  
Spray Gun ◽  
Spray Dried

AbstractThe construction and operation of a spray drier is described where the spray is produced using an air brush, essentially a miniature spray gun. The spray-dried products consist of spheres 50–60 µm in diameter and typical product recoveries are 80%, a marked improvement over simple two-nozzle systems. The spray-dried samples are easy to load into XRD powder holders and present a smooth surface and relatively constant bulk density to the X-ray beam. Problems of preferred orientation are effectively eliminated and the resulting X-ray powder patterns are completely reproducible by different operators.

Diffracted Beam Monochromators for Powder Diffractometry

1970 ◽  
Vol 14 ◽  
pp. 38-56
Author(s):  
E. M. Proctor ◽  
T. C. Furnas ◽  
W. F. Loranger
Keyword(s):  
Preferred Orientation ◽  
Signal To Noise ◽  
X Ray ◽  
Direct Beam ◽  
Vertical Divergence ◽  
Oriented Samples ◽  
Efficiency And Effectiveness ◽  
Slit System ◽  
Bent Crystals ◽  
Selection Of

AbstractThe efficiency and effectiveness of diffracted beam x-ray monochromators used in powder diffractometry have been described in so many ways that much confusion exists regarding their true performance. Although significant improvements in signal to noise ratios are readily achievable, and they offer a solution to the sample fluorescence problem, it is not without sacrifice to total intensity or achievable resolution or both. This paper discusses and describes a series of comparisons between filtered direct beam, LiF and graphite monochromators.These comparisons include the considerations necessary for the appropriate selection of diffracted beam slit system, the effect of vertical divergence as a function of two theta for singly bent crystals, the effects of a non-uniformity of contribution over the length of the crystal, and the geometry necessary for the singly bent and doubly bent crystals. The total intensity and the resolution of LiF and graphite are discussed, in particular, it is noted that the performance of monochromators with randomly oriented samples is quite different than their performance with samples showing preferred orientation or grain effects.A new diffracted beam monochromator based on the Rowland focusing geometry is described.

X-ray Powder Diffraction QPA by Rietveid Pattern- Fitting - Scope and Limitations

1989 ◽  
Vol 33 ◽  
pp. 269-275 ◽  
Author(s):  
B.H. O'Cannar ◽  
Li Deyu ◽  
B. Jordan ◽  
M. D. Raven ◽  
P. G. Fazey
Keyword(s):  
Powder Diffraction ◽  
Preferred Orientation ◽  
Analytical Science ◽  
Materials Analysis ◽  
X Ray ◽  
University Of Technology ◽  
Science Group

AbstractThe X-ray Analytical Science Group at Curtin university of Technology has been developing and evaluating Rietveld pattern-fitting for materials analysis since 1985. The results are reviewed with particular reference to preferred orientation, crystallinity and phase abundance.

A Discussion on natural strain and geological structure - Strain and anisotropy in rocks

1976 ◽  
Vol 283 (1312) ◽  
pp. 27-42 ◽  
Keyword(s):  
Magnetic Susceptibility ◽  
Shear Wave ◽  
Finite Strain ◽  
Preferred Orientation ◽  
Seismic Velocities ◽  
Magnetic Susceptibility Anisotropy ◽  
Wave Velocities ◽  
Natural Strain ◽  
Shear Wave Velocities ◽  
Wide Range

The evaluation of finite strain in naturally deformed rocks is restricted by the limited occurrence of good natural strain indicators which are also homogeneous with respect to the matrix. This problem is overcome by establishing the relation between measured finite strain and those physical behaviour characteristics of rocks that are dependent upon the anisotropy resulting from deformation. Accordingly, the strain measured from natural indicators is calibrated against ( degree of preferred orientation, (b) magnetic susceptibility anisotropy, and (r) seismic anisotropy. This _ will permit three approaches to be used independently for the evaluation of strain, provided that a minimal number of actual strains are available. The relation between measured strain and the degree of preferred orientation of layer silicates as revealed by X-ray transmission goniometry is established for a group of fine grained tectonites of dominantly planar fabric which have an average deformation ellipsoid of form 1.6:1 :,0.26. The strains measured from the degree of preferred orientation are in remarkable agreement with those measured from natural strain indicators. The measured deformation ellipsoids for a wide range of strains are also compared to the correlative ellipsoids of magnetic susceptibility anisotropy. The axes of both sets of ellipsoids are coincidental and the shape relationship between deformation and magnetic susceptibility ellipsoids is established by linear regression. Finally, the anisotropy of seismic velocities is determined by measuring the pseudocompressional velocity and two orthogonally polarized pseudo shear wave velocities for each of a minimum of nine non-coplanar directions. The velocity surfaces thus obtained define an elastic or seismic velocity anisotropy ellipsoid, the axes of which are also precisely coincidental with those of the finite deformation ellipsoid. The influence of rock fabric upon seismic velocities is such that for a rock which has undergone a principal finite extension of 135 % and a finite shortening of 65 %, the difference of compressional and shear wave velocities between these two directions is in the ratio 1.26:1 for P waves and 1.33:1 for S waves.

Compositional and Texture Analysis of Tantalum Thin Films by Energy Dispersive X-Ray Analysis

1973 ◽  
Vol 27 (2) ◽  
pp. 99-102 ◽  
Author(s):  
H. S. deBen ◽  
Barret Broyde
Keyword(s):  
Thin Films ◽  
Texture Analysis ◽  
Diffraction Method ◽  
Preferred Orientation ◽  
Energy Dispersive ◽  
X Ray ◽  
Quantitative Measurements

Quantitative measurements of concentrations are given for the phases present in undoped tantalum thin films by the use of energy-dispersive x-ray detectors. This diffraction method can also yield the extent of preferred orientation.

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