PIXE MICROANALYSIS OF VERY LOW Z ELEMENTS BY SUB MeV PROTON BEAM
1993 ◽
Vol 03
(02)
◽
pp. 109-120
◽
Keyword(s):
X Rays
◽
Analysis of very low Z elements between Be and Si using sub MeV proton beam is explored based on theoretical calculations and supported by experimental data. With the availability of the new LE Ge detector, Be K α X-rays can be recorded with reasonable efficiency and high resolution. PWBA and the modified theory, ECPSSR, have been used for ionization cross-section calculation. Minimum detection limits (MDL’s) for thin target conditions are presented in the energy range of 150–2500 keV.