The new innovative optic complete method of identification of oil and its fraction

2021 ◽  
pp. 2150241
Author(s):  
Kh. N. Ahmadova
Keyword(s):  
Dielectric Function ◽  
Spectroscopic Ellipsometry ◽  
Room Temperature ◽  
Optical Constants ◽  
Material Constant ◽  
Hydrocarbon Composition ◽  
Oil Fields ◽  
Optical Functions ◽  
Measurement Results ◽  
World Standard

Development and demonstration of a new method for highly accurate forecasting of the hydrocarbon composition of oil based on determining the spectrum of its universal material constant–dielectric function, as by direct measurement using the method of spectroscopic ellipsometry, are today accepted as the world standard for determining the optical functions of any substance in a liquid or solid state, and by its quantum-mechanical calculation from first principles to complete coincidence with the measurement results. A methodology will be proposed for the complete description of any oil and the identification of it belonging to a particular oilfield. The methodology is not only universal and highly accurate, but also economical. In this work, we obtained several groups of fractions of crude oilsamples from different oil fields in Azerbaijan, which were accessed by spectroscopic ellipsometry over the 1.5–6.5 eV spectral range at room-temperature. Optical constants and dielectric function were obtained for massive samples of each substance and fractions. The proposed method is a complete dielectric fingerprint of oils for widespread use, including for environmental monitoring of oil-contaminated areas of the sea and land.

Determination and Critical Assessment of the Optical Properties of Common Substrate Materials Used in III-V Nitride Heterostructures with Vacuum Ultraviolet Spectroscopic Ellipsometry

2001 ◽  
Vol 693 ◽  
Author(s):  
N.V. Edwards ◽  
O.P.A. Lindquist ◽  
L.D. Madsen ◽  
S. Zollner ◽  
K. Järrehdahl ◽  
...  
Keyword(s):  
Optical Properties ◽  
Dielectric Function ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Vacuum Ultraviolet ◽  
Critical Assessment ◽  
Optical Transitions ◽  
Common Substrate ◽  
Materials Used

AbstractAs a first step toward enabling the in-line metrology of III-V nitride heterostructure and materials, we present the optical constants of the two common substrate materials over an unprecendented spectral range. Vacuum Ultraviolet spectroscopic ellipsometry (VUVSE) was used to obtain the optical constants for Al2O3 and the ordinary and extra-ordinary component of the dielectric function for both 4H- and 6H-SiC. The results are discussed in the context of anisotropy, polytypism, bandstructure, optical transitions, and preparation/characterization of abrupt surfaces, where appropriate.

Determination of optical constants of Si/ZnO polycrystalline nanocomposites by spectroscopic ellipsometry

2001 ◽  
Vol 16 (12) ◽  
pp. 3554-3559 ◽  
Author(s):  
J. García-Serrano ◽  
N. Koshizaki ◽  
T. Sasaki ◽  
G. Martínez-Montes ◽  
U. Pal
Keyword(s):  
Film Thickness ◽  
Quartz Glass ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Composite Films ◽  
Two Phase ◽  
Glass Substrates ◽  
Optical Functions ◽  
Substrate Film

The optical constants of Si/ZnO composite films grown on quartz glass substrates were determined in the spectral range 1.5–5.0 eV by spectroscopic ellipsometry using a rotating-analyzer ellipsometer. The structure of the samples was modeled by a two-phase (substrate–film) model, and the optical functions of the film were parameterized through different effective medium approximations. The results allowed us to estimate the microstructural film parameters, such as film thickness, the volume fractions of each of the constituents, and optical constants.

Superlattice Optical Properties Measured by Variable Angle Spectroscopic Ellipsometry

1987 ◽  
Vol 102 ◽  
Author(s):  
P. G. Snyder ◽  
K. G. Merkel ◽  
B. N. De ◽  
J. A. Woollam ◽  
D. W. Langer ◽  
...  
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Room Temperature ◽  
Optical Constants ◽  
Nondestructive Method ◽  
Effective Index ◽  
Index Of Refraction ◽  
Angle Of Incidence ◽  
Variable Angle ◽  
Superlattice Layer ◽  
Effective Index Of Refraction

ABSTRACTVariable Angle of incidence Spectroscopic Ellipsometry (VASE) is a sensitive, nondestructive method of determining optical constants, layer thicknesses, alloy compositions and other parameters. We model the VASE data for a sample containing a 20 period Al0 5Ga0 5As-GaAs superlattice, to obtain the effective index of refraction (n) and e tinction coefficient (k) of the superlattice layer. The room temperature VASE spectra contain strong, sharp features at the e-hh(1), e-lh(1) and e-hh(2) excitonic tran-sition energies. In addition, VASE was used to characterize more compli-cated layered structures, which also contained superlattices.

AN EFFECTIVE-SUBSTRATE METHOD TO INVESTIGATE AN IRON NATIVE OXIDE LAYER ON AN IRON SUBSTRATE BY SPECTROSCOPIC ELLIPSOMETRY

2013 ◽  
Vol 27 (07) ◽  
pp. 1350044 ◽  
Author(s):  
SHANG GAO ◽  
JIE LIAN ◽  
ZHAOZONG SUN ◽  
XIAO WANG ◽  
PING LI ◽  
...  
Keyword(s):  
Film Thickness ◽  
Oxide Layer ◽  
Spectroscopic Ellipsometry ◽  
Room Temperature ◽  
Optical Constants ◽  
Measured Data ◽  
Native Oxide ◽  
Native Oxide Layer ◽  
Iron Films ◽  
Time Points

An effective-substrate method was presented to obtain the optical constants of an iron native oxide layer with unknown optical constants and film thickness on an iron substrate with unknown optical constants by using spectroscopic ellipsometry (SE). "Thick" iron films were deposited on silicon wafer by magnetron sputtering and were exposed to air at room temperature. They were measured by spectroscopic ellipsometry during this procedure at different time points from ten minutes to seven months. Pseudo optical constants were calculated from the initially measured data and were introduced into the modeling work of subsequent measurements as an effective substrate in order to obtain the optical constants and film thickness of the native oxide layer. After obtaining the optical constants of the subsequent native oxide layer, they were employed in the modeling work of the initially measured data and the optical constants of the iron substrate and the film thickness of the initial native oxide layer was obtained.

Optical constants of DC magnetron sputtered titanium dioxide thin films measured by spectroscopic ellipsometry

2003 ◽  
Vol 38 (9) ◽  
pp. 773-778 ◽  
Author(s):  
B. Karunagaran ◽  
R. T. Rajendra Kumar ◽  
C. Viswanathan ◽  
D. Mangalaraj ◽  
Sa. K. Narayandass ◽  
...  
Keyword(s):  
Thin Films ◽  
Titanium Dioxide ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Titanium Dioxide Thin Films

scholarly journals Determination of the Thickness and Optical Constants of ZrO2 by Spectroscopic Ellipsometry and Spectrophotometric Method

2011 ◽  
Vol 8 ◽  
pp. 223-227 ◽  
Author(s):  
R. Yusoh ◽  
M. Horprathum ◽  
P. Eiamchai ◽  
S. Chanyawadee ◽  
K. Aiempanakit
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Spectrophotometric Method ◽  
Optical Constants

Detection of an ordered-structure fraction in amorphous silicon

2016 ◽  
Vol 49 (2) ◽  
pp. 528-532 ◽  
Author(s):  
Xiao-Dong Wang ◽  
Bo Chen ◽  
Hai-Feng Wang ◽  
Xin Zheng ◽  
Shi-Jie Liu ◽  
...  
Keyword(s):  
Magnetron Sputtering ◽  
Radio Frequency ◽  
Amorphous Silicon ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Ordered Structure ◽  
Radio Frequency Magnetron Sputtering ◽  
Medium Range Order ◽  
Medium Range ◽  
Si Films

Amorphous silicon (a-Si) films were prepared by radio frequency magnetron sputtering. Spectroscopic ellipsometry (SE) was utilized to detect an ordered-structure fraction in a-Si. The SE analysis of a-Si films with different thicknesses (7.0–140.0 nm) demonstrates that no more than 2.81% of medium-range order exists in the samples, and interestingly, there is a thickness dependence of optical constants for a-Si in the range of 1.5–5.0 eV.

Eagle XG® glass: Optical constants from 196 to 1688 nm (0.735–6.33 eV) by spectroscopic ellipsometry

2017 ◽  
Vol 24 (2) ◽  
pp. 026001 ◽  
Author(s):  
Cody V. Cushman ◽  
Brian I. Johnson ◽  
Andrew Martin ◽  
Barry M. Lunt ◽  
Nicholas J. Smith ◽  
...  
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Optical Constants
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