In-situObservation of the Three-Dimensional Nano-Structure Growth on Focused-Ion-Beam Chemical Vapor Deposition by Scanning Electron Microscope

Applied Physics Express ◽

10.1143/apex.1.055001 ◽

2008 ◽

Vol 1 ◽

pp. 055001 ◽

Cited By ~ 12

Author(s):

Reo Kometani ◽

Sunao Ishihara ◽

Takashi Kaito ◽

Shinji Matsui

Keyword(s):

Chemical Vapor Deposition ◽

Electron Microscope ◽

Scanning Electron Microscope ◽

Vapor Deposition ◽

Focused Ion Beam ◽

Ion Beam ◽

Three Dimensional ◽

Chemical Vapor ◽

Nano Structure ◽

Scanning Electron

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Three-dimensional GaN nano-structure fabrication by focused ion beam chemical vapor deposition

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2005.08.130 ◽

2006 ◽

Vol 242 (1-2) ◽

pp. 250-252 ◽

Cited By ~ 1

Author(s):

T. Nagata ◽

P. Ahmet ◽

Y. Yamauchi ◽

Y. Sakuma ◽

T. Sekiguchi ◽

...

Keyword(s):

Chemical Vapor Deposition ◽

Vapor Deposition ◽

Focused Ion Beam ◽

Ion Beam ◽

Three Dimensional ◽

Chemical Vapor ◽

Nano Structure

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Three-Dimensional Nanostructure Fabrication by Controlling Downward Growth on Focused-Ion-Beam Chemical Vapor Deposition

Japanese Journal of Applied Physics ◽

10.1143/jjap.51.065001 ◽

2012 ◽

Vol 51 ◽

pp. 065001 ◽

Cited By ~ 3

Author(s):

Dengji Guo ◽

Reo Kometani ◽

Shin'ichi Warisawa ◽

Sunao Ishihara

Keyword(s):

Chemical Vapor Deposition ◽

Vapor Deposition ◽

Focused Ion Beam ◽

Ion Beam ◽

Three Dimensional ◽

Chemical Vapor ◽

Nanostructure Fabrication

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Three-dimensional ultrastructural and histomorphological analysis of the periodontal ligament with occlusal hypofunction via focused ion beam/scanning electron microscope tomography

Scientific Reports ◽

10.1038/s41598-019-45963-w ◽

2019 ◽

Vol 9 (1) ◽

Cited By ~ 4

Author(s):

Shingo Hirashima ◽

Keisuke Ohta ◽

Tomonoshin Kanazawa ◽

Akinobu Togo ◽

Tatsuyuki Kakuma ◽

...

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Periodontal Ligament ◽

Focused Ion Beam ◽

Ion Beam ◽

Three Dimensional ◽

Beam Scanning ◽

Scanning Electron

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Three-dimensional and multimaterial microfabrication using focused-ion-beam chemical-vapor deposition and its application to processing nerve electrodes

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1821581 ◽

2004 ◽

Vol 22 (6) ◽

pp. 3158 ◽

Cited By ~ 8

Author(s):

T. Hoshino ◽

M. Kawamori ◽

T. Suzuki ◽

S. Matsui ◽

K. Mabuchi

Keyword(s):

Chemical Vapor Deposition ◽

Vapor Deposition ◽

Focused Ion Beam ◽

Ion Beam ◽

Three Dimensional ◽

Chemical Vapor ◽

Nerve Electrodes

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Nanoimprint using three-dimensional microlens mold made by focused-ion-beam chemical vapor deposition

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1633281 ◽

2004 ◽

Vol 22 (1) ◽

pp. 22 ◽

Cited By ~ 31

Author(s):

K. Watanabe ◽

T. Morita ◽

R. Kometani ◽

T. Hoshino ◽

K. Kondo ◽

...

Keyword(s):

Chemical Vapor Deposition ◽

Vapor Deposition ◽

Focused Ion Beam ◽

Ion Beam ◽

Three Dimensional ◽

Chemical Vapor

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Development of novel three-dimensional reconstruction method for porous media for polymer electrolyte fuel cells using focused ion beam-scanning electron microscope tomography

Journal of Power Sources ◽

10.1016/j.jpowsour.2017.02.050 ◽

2017 ◽

Vol 347 ◽

pp. 108-113 ◽

Cited By ~ 15

Author(s):

Takeshi Terao ◽

Gen Inoue ◽

Motoaki Kawase ◽

Norio Kubo ◽

Makoto Yamaguchi ◽

...

Keyword(s):

Porous Media ◽

Electron Microscope ◽

Scanning Electron Microscope ◽

Focused Ion Beam ◽

Ion Beam ◽

Three Dimensional ◽

Polymer Electrolyte Fuel Cells ◽

Reconstruction Method ◽

Dimensional Reconstruction ◽

Scanning Electron

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Three-dimensional nanostructure fabrication by focused-ion-beam chemical vapor deposition

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1319689 ◽

2000 ◽

Vol 18 (6) ◽

pp. 3181 ◽

Cited By ~ 330

Author(s):

Shinji Matsui ◽

Takashi Kaito ◽

Jun-ichi Fujita ◽

Masanori Komuro ◽

Kazuhiro Kanda ◽

...

Keyword(s):

Chemical Vapor Deposition ◽

Vapor Deposition ◽

Focused Ion Beam ◽

Ion Beam ◽

Three Dimensional ◽

Chemical Vapor ◽

Nanostructure Fabrication

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Novel characteristics of normal supraspinatus insertion in rats: an ultrastructural analysis using three-dimensional reconstruction using focused ion beam/scanning electron microscope tomography

Muscles Ligaments and Tendons Journal ◽

10.32098/mltj.02.2014.17 ◽

2019 ◽

Vol 04 (02) ◽

pp. 182 ◽

Cited By ~ 12

Author(s):

T. Kanazawa ◽

M. Gotoh ◽

K. Ohta ◽

N. Shibai ◽

K. Nakamura

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Focused Ion Beam ◽

Ion Beam ◽

Three Dimensional ◽

Ultrastructural Analysis ◽

Three Dimensional Reconstruction ◽

Beam Scanning ◽

Dimensional Reconstruction ◽

Scanning Electron

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Three‐dimensional ultrastructural analysis and histomorphometry of collagen bundles in the periodontal ligament using focused ion beam/scanning electron microscope tomography

Journal of Periodontal Research ◽

10.1111/jre.12592 ◽

2018 ◽

Vol 55 (1) ◽

pp. 23-31 ◽

Cited By ~ 3

Author(s):

Shingo Hirashima ◽

Keisuke Ohta ◽

Tomonoshin Kanazawa ◽

Satoko Okayama ◽

Akinobu Togo ◽

...

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Periodontal Ligament ◽

Focused Ion Beam ◽

Ion Beam ◽

Three Dimensional ◽

Ultrastructural Analysis ◽

Beam Scanning ◽

Scanning Electron

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Investigation of 〈100〉-oriented etching pattern on diamond coated with Ni and Cu

International Journal of Modern Physics B ◽

10.1142/s0217979220501556 ◽

2020 ◽

Vol 34 (17) ◽

pp. 2050155

Author(s):

Naiyuan Cui ◽

Fei Wang ◽

Hanyuan Ding ◽

Lei Guo

Keyword(s):

Chemical Vapor Deposition ◽

Electron Microscope ◽

Scanning Electron Microscope ◽

Vapor Deposition ◽

Chemical Vapor ◽

Etching Pattern ◽

Etching Mechanism ◽

Atomic Force ◽

Scanning Electron ◽

Reactive Gas

Diamond etching of [Formula: see text] orientation is processed in chemical vapor deposition (CVD) chamber using H2 as reactive gas. Etching process happens on diamond substrates using a variety of etch mask materials including copper and nickel. Scanning electron microscope (SEM) and atomic force microscope (AFM) show different kinds of diamond etching pattern of two mask materials. It is observed that the etching pit of copper is tetrahedron, while the etching pit of nickel is step structure. This indicates diverse etching mechanism of diamond etched by different metal. Observing the surface etching topography of diamond and analyzing the etching mechanism of different metal can help study the growth of diamond by CVD and controllable etching of diamond.

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