Degradation Phenomenon under Low Drain Voltage Stress in p-channel Metal-Oxide-Semiconductor Field-Effect-Transistors
1994 ◽
Vol 33
(Part 1, No. 1B)
◽
pp. 678-682
Keyword(s):
2014 ◽
Vol 31
(12)
◽
pp. 126101
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2018 ◽
Vol 57
(6S1)
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pp. 06HD03
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Keyword(s):
2020 ◽
Vol 8
◽
pp. 9-14
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2007 ◽
Vol 46
(4B)
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pp. 2054-2057
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2009 ◽
Vol 48
(4)
◽
pp. 04C100
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Keyword(s):
2009 ◽
Vol 48
(9)
◽
pp. 091404
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