The Impact of Gate-to-Source Tunneling Current on the Characterization of Metal-Oxide-Semiconductor Field-Effect Transistor's Hot-Carrier Reliability
2003 ◽
Vol 42
(Part 1, No. 4B)
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pp. 2149-2151
Keyword(s):
2015 ◽
Vol 32
(12)
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pp. 127101
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2004 ◽
Vol 22
(1)
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pp. 327
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Keyword(s):
Keyword(s):
1997 ◽
Vol 36
(Part 1, No. 10)
◽
pp. 6175-6180
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