Suppression of Parasitic Bipolar Action and Improvement of Hot-Carrier Reliability in Fully-Depleted Metal-Oxide-Semiconductor Field Effect Transistors on SIMOX (Separation by IMplanted Oxygen) Introducing Recombination Centers near Source Junction
1997 ◽
Vol 36
(Part 1, No. 10)
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pp. 6175-6180
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Keyword(s):
2009 ◽
Vol 48
(4)
◽
pp. 04C009
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Keyword(s):
2012 ◽
Vol 51
(2)
◽
pp. 02BC09
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1992 ◽
Vol 31
(Part 1, No. 9A)
◽
pp. 2678-2681
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2012 ◽
Vol 51
(2R)
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pp. 024106
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