Improved Conductance Method for Determining Interface Trap Density of Metal-Oxide-Semiconductor Device with High Series Resistance
2005 ◽
Vol 44
(No. 48)
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pp. L1460-L1462
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2011 ◽
Vol 88
(6)
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pp. 872-876
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2015 ◽
Keyword(s):
Keyword(s):
1993 ◽
Vol 32
(Part 1, No. 10)
◽
pp. 4393-4397
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2014 ◽
Vol 806
◽
pp. 139-142
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