Electrical Stability and Reliability of Ultralow Dielectric Constant Porous Carbon-Doped Oxide film for Copper Interconnect

2005 ◽  
Vol 152 (10) ◽  
pp. G766 ◽  
Author(s):  
Kuo-Lung Fang ◽  
Bing-Yue Tsui
Keyword(s):  
Dielectric Constant ◽  
Oxide Film ◽  
Porous Carbon ◽  
Electrical Stability ◽  
Carbon Doped ◽  
Copper Interconnect ◽  
Doped Oxide

scholarly journals Effect of Silver Oxide Film Thickness on Some Optical Parameter

2014 ◽  
Vol 11 (2) ◽  
pp. 690-694
Author(s):  
Baghdad Science Journal
Keyword(s):  
Dielectric Constant ◽  
Refractive Index ◽  
Oxide Film ◽  
Film Thickness ◽  
Silver Oxide ◽  
Optical Parameter ◽  
Oxide Film Thickness ◽  
Chemical Spray ◽  
Transmission And Absorption ◽  
Different Thickness

Films of silver oxide of different thickness have been prepared by the chemical spray paralysis. Transmission and absorption spectra have recorded in order to study the effect of increasing thickness on some optical parameter such as reflectance, refractive index , and dielectric constant in its two parts . This study reveals that all these paramters affect by increasing the thickness .

scholarly journals Structure and composition study of carbon-doped titanium oxide film combined with first principles

2014 ◽  
Vol 3 (1) ◽  
pp. 49-55 ◽  
Author(s):  
Wei Mai ◽  
Feng Wen ◽  
Dong Xie ◽  
Yongxiang Leng ◽  
Zhonglin Mu
Keyword(s):  
Oxide Film ◽  
Titanium Oxide ◽  
First Principles ◽  
Titanium Oxide Film ◽  
Carbon Doped ◽  
Composition Study
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