Soft and Ultra-Soft X-ray Spectrometry Using Long-Wavelength Dispersive Devices

1990 ◽  
Vol 34 ◽  
pp. 139-148
Author(s):  
M. Charbonnier ◽  
F. Gaillard ◽  
M. J. Romand ◽  
D. S. Urch
Keyword(s):  
Practical Interest ◽  
Emission Spectrometry ◽  
Light Elements ◽  
Accurate Analysis ◽  
X Ray ◽  
Long Wavelength ◽  
Great Practical Interest ◽  
Low Energy Electron ◽  
Borophosphosilicate Glass ◽  
Non Destructive

X-ray emission spectrometry is of great practical interest because the method is rapid, non destructive and quantitative. However, the analysis of light elements which emit highly absorbed long wavelength radiations is always difficult. Although recent development of multilayered microstructures as dispersive devices has brought higher count rates for light elements, the improvement of performance in the relevant energy range depends, largely, on the improvement of the excitation. For this purpose, an electronic source providing a non-focused low energy electron beam constitutes a means of obtaining a very efficient excitation. As a result, we have used such an excitation to compare the performances of some layered synthetic microstructures (LSM) and conventional crystals for the detection of soft and ultra-soft xrays, to show up a few spectral interferences and to solve them by choosing the best dispersive device. Among the cases studied, we have shown how to carry out an accurate analysis of boron in borophosphosilicate glass (BPSG) samples. Finally a survey of the lower detection limits obtained for different elements using different dispersive devices was done.

Evaluation of a Demountable X-Ray Tube Vacuum Spectrograph for the Determination of Low-Atomic-Number Elements

1963 ◽  
Vol 7 ◽  
pp. 512-522
Author(s):  
John W. Thatcher ◽  
William J. Campbell
Keyword(s):  
Atomic Number ◽  
Electron Excitation ◽  
Light Elements ◽  
Target Element ◽  
X Ray ◽  
Long Wavelength

AbstractThe fluorescent excitation of long-wavelength X-ray spectra is reviewed with respect to X-ray tube target element, inherent filtration, and optimum kilovoltage. A demountable X-ray tube vacuum spectrograph designed for the determination of the light elements is described. Operation of this instrument with both secondary and combined primary—secondary excitation is evaluated. Examples from the literature are cited to show the feasibility of direct electron excitation of longwavelength spectra.

Variability of total and mobile element contents in ash derived from biomass combustion

2013 ◽  
Vol 67 (11) ◽  
Author(s):  
Jiřina Száková ◽  
Pavla Ochecová ◽  
Tomáš Hanzlíček ◽  
Ivana Perná ◽  
Pavel Tlustoš
Keyword(s):  
Wide Spectrum ◽  
Extraction Procedure ◽  
Emission Spectrometry ◽  
Biomass Combustion ◽  
Acid Mixture ◽  
Icp Oes ◽  
Plasma Atomic Emission Spectrometry ◽  
Accurate Analysis ◽  
X Ray ◽  
Flame Atomic Absorption

AbstractSeven samples of the ash derived from biomass, representing both fly and bottom ash, were analysed for a wide spectrum of total and mobile contents of nutrient and potentially risk elements. Several techniques, X-ray fluorescence (XRF) spectrometry, instrumental neutron activation analysis (INAA), proton-induced gamma-ray emission (PIGE) and proton induced X-ray emission (PIXE), inductively coupled plasma-atomic emission spectrometry (ICP-OES), and flame atomic absorption spectrometry (F-AAS) were compared. The results showed fairly good agreement between the XRF and INAA results, where the correlation coefficients (r) varied between 0.96 and 0.98. Lower contents documenting insufficient dissolution of the ash samples in the applied acid mixture were observed for both ICP-OES and AAS. In this case, weaker correlation with the INAA results not exceeding r = 0.7 were obtained. Therefore, the sample decomposition step is a bottleneck of the accurate analysis of this type of materials. For the assessment of plant-available portions of the elements in the ash samples, the Mehlich III extraction procedure and the extraction with a 0.11 mol L−1 solution of CH3COOH were applied. The results showed relatively low mobility of the elements (especially micronutrients) in the ash samples regardless of their source and composition, suggesting limited immediate effect of direct ash application as a fertilizer.

Direct non-destructive total reflection X-ray fluorescence elemental determinations in zirconium alloy samples

2020 ◽  
Vol 27 (5) ◽  
pp. 1253-1261 ◽  
Author(s):  
Kaushik Sanyal ◽  
Buddhadev Kanrar ◽  
Sangita Dhara ◽  
Mirta Sibilia ◽  
Arijit Sengupta ◽  
...  
Keyword(s):  
Zirconium Alloy ◽  
Total Reflection ◽  
Nuclear Industry ◽  
Emission Spectrometry ◽  
Parameter Method ◽  
Good Precision ◽  
Excitation Energies ◽  
Analytical Methodology ◽  
X Ray ◽  
Non Destructive

The development of a direct non-destructive synchrotron-radiation-based total reflection X-ray fluorescence (TXRF) analytical methodology for elemental determinations in zirconium alloy samples is reported for the first time. Discs, of diameter 30 mm and about 1.6 mm thickness, of the zirconium alloys Zr-2.5%Nb and Zircalloy-4 were cut from plates of these alloys and mirror polished. These specimens were presented for TXRF measurements directly after polishing and cleaning. The TXRF measurements were made at the XRF beamline at Elettra synchrotron light source, Trieste, Italy, at two different excitation energies, 1.9 keV and 14 keV, for the determinations of low- and high-Z elements, respectively. The developed analytical methodology involves two complementary quantification schemes, i.e. using either the fundamental parameter method or relative sensitivity based method, allowing quantification of fifteen minor and trace elements with respect to Zr with very good precision and accuracy. In order to countercheck the TXRF analytical results, some samples were analyzed using the DC arc carrier distillation atomic emission spectrometry technique also, which shows an excellent agreement with the results of the TXRF-based methodology developed in this work. The present work resulted in a non-destructive TXRF elemental characterization methodology of metal and alloy samples avoiding the cumbersome dissolution and matrix separation which are normally required in other techniques and traditional methods of TXRF determination. In addition, the production of analytical waste could also be avoided to a large extent. Although the work was carried out for specific applications in the nuclear industry, it is equally suitable for other such samples in different industrial applications.

Recent Developments in Surface and Thin Film Analysis using Low - Energy Electron Induced X-Ray Spectrometry (LEEIXS)

1991 ◽  
Vol 35 (B) ◽  
pp. 767-781 ◽  
Author(s):  
M.J. Romand ◽  
F. Gaillard ◽  
M. Charbonnier
Keyword(s):  
Thin Film ◽  
Film Deposition ◽  
Low Energy ◽  
Energy Electron ◽  
Emission Spectrometry ◽  
Film Analysis ◽  
Discharge System ◽  
X Ray ◽  
Thin Film Analysis ◽  
Low Energy Electron

AbstractA review is given of the main gas-discharge sources and auxiliary equipments which were used in soft and ultra-soft X-ray emission spectrometry. Special attention is paid to the basic principles and instrumentation of low-energy electron-induced X-ray spectrometry (LEEIXS) whose excitation source is an electron beam generated in a glow-discharge system. Capabilities of LEEIXS in surface and thin film analysis and characterization are illustrated by examples dealing with control and optimization of surface treatment and thin film deposition processes. Sensitivity of the technique down to the submonolayer range and influence of backscattering phenomena are shown.

scholarly journals Assessment of Brassicaceae Seeds Quality by X-ray Analysis

Horticulturae ◽  
2021 ◽  
Vol 8 (1) ◽  
pp. 29
Author(s):  
Farhad Musaev ◽  
Nikolay Priyatkin ◽  
Nikolay Potrakhov ◽  
Sergey Beletskiy ◽  
Yuri Chesnokov
Keyword(s):  
Seed Quality ◽  
Practical Interest ◽  
Automatic Analysis ◽  
Lepidium Sativum ◽  
Vegetable Production ◽  
Scientific Center ◽  
X Ray ◽  
Latent Defects ◽  
Modern Level ◽  
Great Practical Interest

A serious problem of vegetable production is the quality of sown seeds. In this regard, assessment of seed quality before sowing and storage is of great practical interest. The modern level of scientific research requires the use of instrumental automated methods of seed quality evaluation, allowing to obtain more information and in a shorter time. The material for the study was a variety of samples from the collection of Brassica oleracea L., var. capitata, Raphanus sativus L., var. radicula, and Lepidium sativum L. seeds from the Federal Scientific Center of Vegetable Breeding and the Timofeev Selection Station. Digital X-ray images of seeds were obtained using a mobile X-ray diagnostic device PRDU-02. Automatic analysis of digital X-ray images was performed in the software “VideoTesT-Morphology 5.2.” The following latent defects of cabbage seeds of economic importance were revealed and identified: irregular darkening, significant “patterning” with deep separation of embryo parts, “angularity of seeds” leading to the loss of their viability. Automatic analysis of digital X-ray images of seeds confirmed the informativeness of brightness indices of digital X-ray images, as well as shape indices. Their connection with sowing qualities of the studied seeds was established.

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