X-Ray Stress Measurement of Alloy Steels X-Ray Study of Elastic Deformation for Alloy Steels with Composite Microstructures

1993 ◽  
Vol 37 ◽  
pp. 317-325
Author(s):  
Masaaki Tsuda ◽  
Tokimasa Goto ◽  
Toshihiko Sasaki ◽  
Yukio Hirose
Keyword(s):  
Residual Stress ◽  
Thermal Expansion ◽  
Elastic Deformation ◽  
Stress Measurement ◽  
Coefficient Of Thermal Expansion ◽  
Ray Method ◽  
Toughening Mechanisms ◽  
X Ray ◽  
Alloy Steels

Residual stress is inevitably introduced into composites because of the mismatch of the coefficient of thermal expansion, and it is different for each phase. The x-ray method can detect separately the stress in each phase, so will yield useful information for analyzing the toughening mechanisms of composites.

X-ray Residual Stress Analysis of Zn-Ni Alloy Electroplating Layers

1989 ◽  
Vol 33 ◽  
pp. 171-175
Author(s):  
Toshihiko Sasaki ◽  
Makoto Kuramoto ◽  
Yasuo Yoshioka
Keyword(s):  
Residual Stress ◽  
Corrosion Resistance ◽  
Stress Analysis ◽  
Stress Measurement ◽  
Thin Layers ◽  
High Corrosion Resistance ◽  
Ray Method ◽  
X Ray ◽  
Ni Alloy ◽  
Residual Stress Analysis

Zn-Ni-alloy electroplated steels are one of the surface-treated materials with a high corrosion resistance and are mostly used for automobiles. It is said that the corrosion resistance is more than four times as great as that of Zn-plated steels. Concerning x-ray stress measurement, Kyono et al reported the result of measurement on y (552) planes and showed that the sin2φ diagram was severely curved.X-ray stress analysis in surface-treated materials will become more important. Some problems, however, remain to be studied when we apply the x-ray method to thin layers. For example, the effective x-ray penetration depth may be different from that in ordinary materials. And complex gradients of stresses and compositions may exist.

Residual Stress Measurement and Evaluation on Ceramics with X-Ray and Indentation Method

2006 ◽  
Vol 321-323 ◽  
pp. 1348-1352
Author(s):  
Tarou Tokuda ◽  
Rong Gang Wang ◽  
Gonojo Katayama ◽  
Mitsuo Kido
Keyword(s):  
Residual Stress ◽  
Aspect Ratio ◽  
Stress Measurement ◽  
Indentation Load ◽  
Ray Method ◽  
Indentation Method ◽  
X Ray ◽  
Crack Propagation Resistance ◽  
The Difference ◽  
Measurement And Evaluation

In this report, the indentation method of measurement for residual stress in structural ceramics is discussed. The residual stresses in Al2O3, Si3N4 and ZrO2 ceramics were evaluated with the indentation method. The value obtained by the indentation method was examined as a function of the microstructure, using Al2O3 ceramics differing in microstructure (grain size and aspect ratio). The residual stress values in Al2O3 and Si3N4 obtained by the indentation method at 98 N agreed well with the values obtained by the X-ray method. The residual stress value in ZrO2 obtained by the indentation method was close to the value obtained by the X-ray method, when the indentation load was 294 N. For estimating the residual stress in ZrO2 with the indentation method, the influence of the phase transformation induced by the indentation is added to the original residual stress, when the indentation is small. The value obtained by indentation method differed with the aspect ratio of the grains in Al2O3. It was thought that the origin of the variation was the difference in crack propagation resistance in different materials

Application of Synchrotron Radiation to Residual Stress Analysis by IP/cosα Method

2008 ◽  
Vol 571-572 ◽  
pp. 249-254 ◽  
Author(s):  
Toshihiko Sasaki ◽  
Yohei Miyazawa ◽  
Shunichi Takahashi ◽  
Ryohei Matsuyama ◽  
Katsunari Sasaki ◽  
...  
Keyword(s):  
Residual Stress ◽  
Synchrotron Radiation ◽  
Stress Analysis ◽  
Stress Measurement ◽  
High Energy ◽  
Ray Method ◽  
X Ray ◽  
High Energy Accelerator ◽  
Diffraction Angle ◽  
Residual Stress Analysis

The X-ray stress measurement with synchrotron radiation (SR) and an image plate (IP) was conducted using the facility of the Photon Factory (PF) of the High Energy Accelerator Research Organization (KEK). The influence of 2θ on stress measurement with the cosα method was investigated. The experiments were conducted under the conditions of 2θ=170 deg, 156.4 deg and 127 deg respectively. It was found that the hypothesis on the relation between the accuracy and the diffraction angle in the X-ray method is not valid in case of the cosα method.

OS1816 A New X-Ray Method of Residual Stress Measurement of Short-Fiber Reinforced Plastics

2013 ◽  
Vol 2013 (0) ◽  
pp. _OS1816-1_-_OS1816-3_
Author(s):  
Keisuke TANAKA ◽  
Shohei TOKORO ◽  
Yuuki KOIKE ◽  
Noboru EGAMI ◽  
Yoshiaki AKINIWA
Keyword(s):  
Residual Stress ◽  
Stress Measurement ◽  
Short Fiber ◽  
Residual Stress Measurement ◽  
Fiber Reinforced ◽  
Ray Method ◽  
X Ray ◽  
Reinforced Plastics ◽  
Fiber Reinforced Plastics

INFLUENCE OF ANNEALING ON THE DEPTH MICROSTRUCTURE OF THE SHOT PEENED DUPLEX STAINLESS STEEL AT ELEVATED TEMPERATURE

2018 ◽  
Vol 25 (02) ◽  
pp. 1850059
Author(s):  
QIANG FENG ◽  
JIA SHE ◽  
YONG XIANG ◽  
XIANYUN WU ◽  
CHENGXI WANG ◽  
...  
Keyword(s):  
Residual Stress ◽  
Stainless Steel ◽  
Thermal Expansion ◽  
Elevated Temperature ◽  
Residual Stresses ◽  
Duplex Stainless Steel ◽  
Coefficient Of Thermal Expansion ◽  
Lattice Parameters ◽  
X Ray Diffraction ◽  
X Ray

The depth profiles of residual stresses and lattice parameters in the surface layers of shot peened duplex stainless steel at elevated temperature were investigated utilizing X-ray diffraction analysis. At each deformation depth, residual stress distributions in both ferrite and austenite were studied by X-ray diffraction stress analysis which is performed on the basis of the sin[Formula: see text] method and the lattice parameters were explored by Rietveld method. The results reveal that difference changes of depth residual compressive stress profiles between ferrite and austenite under the same annealing condition are resulted from the diverse coefficient of thermal expansion, dislocation density, etc. for different phases in duplex stainless steel. The relaxations of depth residual stresses in austenite are more obvious than those in ferrite. The lattice parameters decrease in the surface layer with the extending of annealing time, however, they increase along the depth after annealing for 16[Formula: see text]min. The change of the depth lattice parameters can be ascribed to both thermal expansion and the relaxation of residual stress. The different changes of microstructure at elevated temperature between ferrite and austenite are discussed.

scholarly journals Statistical analysis of the reproducibility of residual stress measurements in cold extruded parts

2021 ◽  
Author(s):  
Fabian Jaeger ◽  
Alessandro Franceschi ◽  
Holger Hoche ◽  
Peter Groche ◽  
Matthias Oechsner
Keyword(s):  
Residual Stress ◽  
Statistical Analysis ◽  
Stress Measurement ◽  
Industrial Applications ◽  
Cold Extrusion ◽  
X Ray Diffraction ◽  
Forming Process ◽  
X Ray ◽  
Stress States ◽  
Key Aspects

AbstractCold extruded components are characterized by residual stresses, which originate from the experienced manufacturing process. For industrial applications, reproducibility and homogeneity of the final components are key aspects for an optimized quality control. Although striving to obtain identical deformation and surface conditions, fluctuation in the manufacturing parameters and contact shear conditions during the forming process may lead to variations of the spatial residual stress distribution in the final product. This could lead to a dependency of the residual stress measurement results on the relative axial and circumferential position on the sample. An attempt to examine this problem is made by the employment of design of experiments (DoE) methods. A statistical analysis of the residual stress results generated through X-Ray diffraction is performed. Additionally, the ability of cold extrusion processes to generate uniform stress states is analyzed on specimens of austenitic stainless steel 1.4404 and possible correlations with the pre-deformed condition are statistically examined. Moreover, the influence of the coating, consisting of oxalate and a MoS2 based lubricant, on the X-Ray diffraction measurements of the surface is investigated.

Studies of the Coefficient of Thermal Expansion of Low-k ILD Materials by X-Ray Reflectivity

2006 ◽  
Vol 914 ◽  
Author(s):  
George Andrew Antonelli ◽  
Tran M. Phung ◽  
Clay D. Mortensen ◽  
David Johnson ◽  
Michael D. Goodner ◽  
...  
Keyword(s):  
Thin Films ◽  
Thermal Expansion ◽  
Coefficient Of Thermal Expansion ◽  
Chemical Vapor ◽  
Dielectric Materials ◽  
Free Standing ◽  
Dielectric Thin Films ◽  
X Ray ◽  
Chemical Vapor Deposited ◽  
Low K

AbstractThe electrical and mechanical properties of low-k dielectric materials have received a great deal of attention in recent years; however, measurements of thermal properties such as the coefficient of thermal expansion remain minimal. This absence of data is due in part to the limited number of experimental techniques capable of measuring this parameter. Even when data does exist, it has generally not been collected on samples of a thickness relevant to current and future integrated processes. We present a procedure for using x-ray reflectivity to measure the coefficient of thermal expansion of sub-micron dielectric thin films. In particular, we elucidate the thin film mechanics required to extract this parameter for a supported film as opposed to a free-standing film. Results of measurements for a series of plasma-enhanced chemical vapor deposited and spin-on low-k dielectric thin films will be provided and compared.

Sign in / Sign up

Export Citation Format

Share Document