scholarly journals Realistic Fault Modeling and Extraction of Multiple Bridging and Break Faults

VLSI Design ◽  
1998 ◽  
Vol 7 (2) ◽  
pp. 163-176 ◽  
Author(s):  
Gerald Spiegel ◽  
Albrecht P. Stroele

Fault sets that accurately describe physical failures are required for efficient pattern generation and fault coverage evaluation. The fault model presented in this paper uniquely describes all structural changes in the transistor net list that can be caused by spot defects, including bridging faults that connect more than two nets, break faults that break a net into more than two parts, and compound faults. The developed analysis method extracts the comprehensive set of realistic faults from the layout of CMOS ICs and for each fault computes the probability of occurrence. The results obtained by the tool REFLEX show that bridging faults connecting more than two nets account for a significant portion of all faults and cannot be neglected.

VLSI Design ◽  
1996 ◽  
Vol 4 (3) ◽  
pp. 231-242 ◽  
Author(s):  
Sankaran M. Menon ◽  
Yashwant K. Malaiya ◽  
Anura P. Jayasumana

Bipolar Emitter Coupled Logic (ECL) devices can now be fabricated at higher densities and consumes much lower power. Behaviour of simple and complex ECL gates are examined in the presence of physical faults. The effectiveness of the classical stuck-at model in representing physical failures in ECL gates is examined. It is shown that the conventional stuck-at fault model cannot represent a majority of circuit level faults. A new augmented stuck-at fault model is presented which provides a significantly higher coverage of physical failures. The model may be applicable to other logic families that use logic gates with both true and complementary outputs. A design for testability approach is suggested for on-line detection of certain error conditions occurring in gates with true and complementary outputs which is a normal implementation for ECL devices.


Author(s):  
Peter Marwedel

AbstractUnfortunately, we cannot rely on designed and possibly already manufactured systems to operate as expected. These systems may have become defective during their use, or their function may have been compromised during the fabrication or their design. The purpose of testing is to verify whether or not an existing embedded/cyber-physical system can be operated as expected. In this chapter, we will present fundamental terms and techniques for testing. There will be a brief introduction to the aims of test pattern generation and their application. We will be introducing terms such as fault model, fault coverage, fault simulation, and fault injection. Also, we will be presenting techniques which improve testability, including the generation of pseudo-random patterns, and signature analysis. It would be beneficial to consider testability issues already during design. In case of fault-tolerant systems, resilience must be verified.


2020 ◽  
Vol 18 (5) ◽  
pp. 909-939
Author(s):  
M.V. Dement'ev

Subject. This article examines the theoretical and practical aspects of the implementation of industrial policy and the structural transformation of the manufacturing industry in St. Petersburg. Objectives. The article aims to justify the priority of the industry-based approach to industrial policy in St. Petersburg and determine its effectiveness by highlighting the factors of structural transformation of the city's manufacturing industry using the Shift-Share Analysis method. Methods. For the study, I used logical, statistical, and factor analyses. Results. Based on shift-share analysis, the study highlights positive results of industrial policy in the development of certain industries in St. Petersburg, as well as those industries that require further development of urban industrial policy. Conclusions. Despite the fact that the industry of St. Petersburg as a whole has become more stable, problems in the development of mechanical engineering and production of computers, electronic and optical products have not yet been solved.


Author(s):  
Mahilchi Milir Vaseekar Kumar ◽  
Spyros Tragoudas ◽  
Sreejit Chakravarty ◽  
Rathish Jayabharathi

2015 ◽  
Vol 733 ◽  
pp. 178-181
Author(s):  
Peng Yan Wang ◽  
Yao Hua Li ◽  
Ze Yu Li

Geological structure model is the foundation of the sedimentary faces modeling, property modeling and digital simulation, which includes the horizon model and fault model. Fault model which is accorded with underground conditions plays an important role in the structure modeling, so it would be an important work to build the fault model perfectly with the seismic and logging data. This paper take the fault modeling of C84-6 well area in Chaoyanggou field as an example, building the fault model by four methods of ‘Projection of polygon’ ‘Correction of depth domain seismic body’ ‘Checking by overlooking’ ‘Correction of breakpoints’ by the software of Petrel. The fault model which is built by integrating logging and seismic data can be the skeleton to build the final geological structure model, and those methods mentioned in this paper has been applied to the modeling work in some adjacent areas at present.


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