scholarly journals The Influence of Thermal Conditions on V2O5Nanostructures Prepared by Sol-Gel Method

2015 ◽  
Vol 2015 ◽  
pp. 1-8 ◽  
Author(s):  
M. Prześniak-Welenc ◽  
M. Łapiński ◽  
T. Lewandowski ◽  
B. Kościelska ◽  
L. Wicikowski ◽  
...  
Keyword(s):  
Thin Films ◽  
Quartz Glass ◽  
Sol Gel ◽  
Annealing Treatment ◽  
Diffraction Method ◽  
Thermal Conditions ◽  
Silicon Substrates ◽  
Scanning Calorimetry ◽  
Gel Method ◽  
Sol Gel Method

This work presents the result of structure investigations of V2O5nanorods grown from thin films and powders prepared by sol-gel method. To examine the best temperature of nanorods crystallization, thin films deposited by spin-coating method on quartz glass or silicon substrates and bulk xerogel powders were annealed at various temperatures ranging from 100°C to 600°C. The structure of the samples was characterized by X-ray diffraction method (XRD), scanning electron microscope (SEM), differential scanning calorimetry (DSC), thermogravimetric analysis (TGA), and mass spectroscopy (MS). The rod-like structure of V2O5was obtained at 600°C on both quartz glass and silicon substrates and also from the bulk xerogel. The growth process and the effect of annealing treatment on the nanostructure are briefly discussed.

Growth and Characterizations of Relaxor-Based Pb(Mg1/3Nb2/3)O3-PbTiO3 Thin Films by Sol-Gel Method

2007 ◽  
Vol 280-283 ◽  
pp. 839-844
Author(s):  
Hui Qing Fan
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Sol Gel ◽  
Silicon Substrates ◽  
Final Annealing ◽  
Gel Method ◽  
Sol Gel Method ◽  
Phase Development ◽  
Transmission Electron ◽  
Pt Films

Relaxor-based 0.7Pb(Mg1/3Nb2/3)O3-0.3PbTiO3 (PMN-PT) thin films were grown epitaxially on silicon substrates by sol-gel method and PbO cover coat technique, and investigated by x-ray diffraction, auger electron spectroscopy, scanning electron microscopy, and transmission electron microscopy. The phase development and microstrure evolution of the PMN-PT film were significantly affected by the final annealing temperature and time. A perovskite PMN-PT film was obtained after annealing at 850oC for 1 min. Then, highly <100>-oriented and textured PMN-PT films could be achieved by using a LaNiO3 perovskite template.

MICROSTRUCTURE OF NaNbO3 THIN FILMS PREPARED BY SOL-GEL METHOD ON ALUMINA AND SILICON SUBSTRATES

2013 ◽  
Vol 3 (0) ◽  
Author(s):  
Helena Bruncková ◽  
Ľubomír Medvecký ◽  
Pavol Hvizdoš ◽  
Juraj Ďurišin
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Silicon Substrates ◽  
Gel Method ◽  
Sol Gel Method

Microstructure and Optical Properties of ZnO-Doped CeO2 Thin Films Using Sol-Gel Method

2012 ◽  
Vol 486 ◽  
pp. 340-344
Author(s):  
Chun Hung Lai ◽  
Ching Fang Tseng ◽  
Wen Yu Hsu
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Sol Gel ◽  
Annealing Treatment ◽  
Annealed Film ◽  
X Ray Diffraction ◽  
Gel Method ◽  
Sol Gel Method ◽  
Recording Spectrophotometer ◽  
Surface Morphologies

This paper describes microstructure and optical characteristics of ZnO-doped CeO2thin films were deposited by sol-gel method with various preheating and annealing temperatures. Particular attention will be paid to the effects of an annealing treatment in air ambient on the physical properties. The deposited films were characterized using X-ray diffraction. The surface morphologies of annealed film were examined by scanning electron microscopy. Optical properties of the ZnO-doped CeO2thin films were obtained by UV-visible recording spectrophotometer. The dependence of the optical properties and microstructure characteristics on thermal treatment was also investigated.

Highly transparent and lower resistivity of yttrium doped ZnO thin films grown on quartz glass by sol–gel method

2016 ◽  
Vol 500 ◽  
pp. 179-185 ◽  
Author(s):  
Narinder Kaur ◽  
Sanjeev K. Sharma ◽  
Deuk Young Kim ◽  
Narinder Singh
Keyword(s):  
Thin Films ◽  
Quartz Glass ◽  
Sol Gel ◽  
Zno Thin Films ◽  
Gel Method ◽  
Sol Gel Method ◽  
Doped Zno ◽  
Lower Resistivity

Fabrication and Characterization of MgAl2O4 Thin Films by Sol-Gel Method

2011 ◽  
Vol 216 ◽  
pp. 514-517 ◽  
Author(s):  
Cheng Hsing Hsu ◽  
Jenn Sen Lin ◽  
His Wen Yang
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Annealing Treatment ◽  
Annealed Film ◽  
Gel Method ◽  
Sol Gel Method ◽  
Force Microscopy ◽  
Microstructure Characteristics ◽  
Atomic Force ◽  
Surface Morphologies

This paper describes microstructure characteristics of MgAl2O4 thin films were deposited by sol-gel method with various annealing temperatures. Particular attention will be paid to the effects of an annealing treatment in air ambient on the physical properties. The annealed films were characterized using X-ray diffraction. The surface morphologies of annealed film were examined by scanning electron microscopy and atomic force microscopy. The dependence of the dielectric properties and microstructure characteristics on annealing temperature was also investigated.

Preparation of Patterned BiFeO3 Thin Films on the Functional Silicon Substrates Surface

2012 ◽  
Vol 512-515 ◽  
pp. 1731-1735
Author(s):  
Guo Qiang Tan ◽  
Meng Cheng ◽  
Yan Wang ◽  
Lei Cheng ◽  
Ao Xia
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Sol Gel ◽  
Short Wave ◽  
Silicon Substrates ◽  
Gel Method ◽  
X Ray ◽  
Sol Gel Method ◽  
Distorted Structure ◽  
Assembled Monolayers

Patterned octadecyltrichlorosilane (OTS) self-assembled monolayers (SAMs) was fabricated on silicon substrates, utilizing short wave UV irradiation meter (λ=184.9nm) as the photolithograph apparatus under the cover of the photomask. The patterned BiFeO3 were prepared on the functional OTS-SAMs by sol-gel method. The characterization of the samples patterns was carried out by various techniques, including X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), field emission scanning electron microscopy (FESEM), atomic force microscopy (AFM) and energy disperse spectroscopy (EDS). The results indicate that the pattern BiFeO3 thin films were successfully prepared on the functional OTS-SAMs by sol-gel method and the thin films were BiFeO3 thin films with hexagonal perovskite distorted structure which has clear boundaries and 200µm deposited lines width.

Fe2O3 - TiO2 THIN FILMS PREPARED BY SOL-GEL METHOD

2011 ◽  
Vol 10 (2) ◽  
pp. 187-192 ◽  
Author(s):  
Ramona-Crina Suciu ◽  
Marcela Corina Rosu ◽  
Teofil Danut Silipas ◽  
Emil Indrea ◽  
Violeta Popescu ◽  
...  
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Tio2 Thin Films ◽  
Gel Method ◽  
Sol Gel Method
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