Probing the charge injection and dissipation in graphene oxide–epoxy composite

2021 ◽  
pp. 002199832110526
Author(s):  
Beibei Jia ◽  
Yuqing Chen ◽  
Chengxiang Chen ◽  
Yongfei Li ◽  
Wanli Ma ◽  
...  
Keyword(s):  
Graphene Oxide ◽  
Charge Injection ◽  
Local Area ◽  
Neat Epoxy ◽  
Inorganic Filler ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Local Charge ◽  
Potential Mapping ◽  
Electrical And Dielectric Properties

The inorganic filler can modify the electrical and dielectric properties of polymeric composites. However, it is challenging to understand the local charge injection and dissipation in composites through traditional characterization at nanoscale. In this work, we provide a potential mapping of the charge injection and dissipation in the local area of graphene oxide/epoxy resin (GO/EP) composite under various biases by Kelvin probe force microscopy (KPFM) with high spatial resolution. Thus, an improved KPFM experimental setup is used to inject charges at the fixed point to demonstrate surface charge dissipation around the interface between GO and EP. It is found that the charge is more easily injected into the GO/EP nanocomposites and dissipates more quickly in nanocomposite than in neat epoxy resins. Meanwhile, the electrons diffuse more rapidly than holes in pure EP and nanocomposites. The faster charge injection and dissipation of GO/EP composite are ascribed to the filler of GO which has much higher conductivity than that of neat epoxy. This work offers significant insights into the understanding of charge injection and dissipation in dielectric composites.

Thickness Uniformity and Electron Doping in Epitaxial Graphene on SiC

2013 ◽  
Vol 740-742 ◽  
pp. 153-156 ◽  
Author(s):  
Jens Eriksson ◽  
Donatella Puglisi ◽  
Remigijus Vasiliauskas ◽  
Anita Lloyd Spetz ◽  
Rositza Yakimova
Keyword(s):  
Surface Morphology ◽  
Carrier Concentration ◽  
Substrate Surface ◽  
Epitaxial Graphene ◽  
Kelvin Probe ◽  
Surface Restructuring ◽  
Kelvin Probe Microscopy ◽  
Force Microscopy ◽  
Potential Mapping ◽  
Sublimation Growth

Large variations have been observed in the uniformity and carrier concentration of epitaxial graphene grown on SiC by sublimation for samples grown under identical conditions and on nominally on-axis hexagonal SiC (0001) substrates. We have previously shown that these issues are both related to the morphology of the graphene-SiC surface after sublimation growth. Here we present a study on how the substrate polytype, substrate surface morphology and surface restructuring during sublimation growth affect the uniformity and carrier concentration in epitaxial graphene on SiC. These issues were investigated employing surface morphology mapping by atomic force microscopy coupled with local surface potential mapping using Scanning Kelvin probe microscopy.

scholarly journals Internal potential mapping of charged solid-state-lithium ion batteries using in situ Kelvin probe force microscopy

Nanoscale ◽  
2017 ◽  
Vol 9 (2) ◽  
pp. 893-898 ◽  
Author(s):  
Hideki Masuda ◽  
Nobuyuki Ishida ◽  
Yoichiro Ogata ◽  
Daigo Ito ◽  
Daisuke Fujita
Keyword(s):  
Solid State ◽  
Lithium Ion Batteries ◽  
Lithium Ion ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Potential Mapping ◽  
Internal Potential

Charge injection in large area multilayer graphene by ambient Kelvin probe force microscopy

2017 ◽  
Vol 8 ◽  
pp. 18-25 ◽  
Author(s):  
Igor Bdikin ◽  
Dhanajay K. Sharma ◽  
Gonzalo Otero-Irurueta ◽  
María J. Hortigüela ◽  
Pawan K. Tyagi ◽  
...  
Keyword(s):  
Charge Injection ◽  
Kelvin Probe Force Microscopy ◽  
Multilayer Graphene ◽  
Kelvin Probe ◽  
Large Area ◽  
Force Microscopy

Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy

2016 ◽  
Vol 389 ◽  
pp. 783-789 ◽  
Author(s):  
S.V. Kondratenko ◽  
V.S. Lysenko ◽  
Yu. N. Kozyrev ◽  
M. Kratzer ◽  
D.P. Storozhuk ◽  
...  
Keyword(s):  
Charge Trapping ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Local Charge

Local charge writing in epitaxial SmNiO3 thin films

2014 ◽  
Vol 2 (19) ◽  
pp. 3805-3811 ◽  
Author(s):  
Feng Yan ◽  
Frank Schoofs ◽  
Jian Shi ◽  
Sieu D. Ha ◽  
R. Jaramillo ◽  
...  
Keyword(s):  
Thin Films ◽  
Work Function ◽  
Insulator Transition ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Metal Insulator Transition ◽  
Metal Insulator ◽  
Force Microscopy ◽  
Local Charge

We have investigated the evolution of work function in epitaxial correlated perovskite SmNiO3 (SNO) thin films spanning the metal–insulator transition (MIT) by Kelvin probe force microscopy (KPFM).

scholarly journals Reconstruction of a 2D layer of KBr on Ir(111) and electromechanical alteration by graphene

2021 ◽  
Vol 12 ◽  
pp. 432-439
Author(s):  
Zhao Liu ◽  
Antoine Hinaut ◽  
Stefan Peeters ◽  
Sebastian Scherb ◽  
Ernst Meyer ◽  
...  
Keyword(s):  
Density Functional ◽  
Kelvin Probe ◽  
Functional Theory ◽  
Double Line ◽  
Force Microscopy ◽  
Atomic Force ◽  
Local Charge ◽  
Charge Displacement ◽  
Work Functions ◽  
The Difference

A novel reconstruction of a two-dimensional layer of KBr on an Ir(111) surface is observed by high-resolution noncontact atomic force microscopy and verified by density functional theory (DFT). The observed KBr structure is oriented along the main directions of the Ir(111) surface, but forms a characteristic double-line pattern. Comprehensive calculations by DFT, taking into account the observed periodicities, resulted in a new low-energy reconstruction. However, it is fully relaxed into a common cubic structure when a monolayer of graphene is located between substrate and KBr. By using Kelvin probe force microscopy, the work functions of the reconstructed and the cubic configuration of KBr were measured and indicate, in accordance with the DFT calculations, a difference of nearly 900 meV. The difference is due to the strong interaction and local charge displacement of the K+/Br− ions and the Ir(111) surface, which are reduced by the decoupling effect of graphene, thus yielding different electrical and mechanical properties of the top KBr layer.

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