Augmented reality for next generation infrastructure inspections

2020 ◽  
pp. 147592172095384
Author(s):  
David DL Mascareñas ◽  
JoAnn P Ballor ◽  
Oscar L McClain ◽  
Miranda A Mellor ◽  
Chih-Yu Shen ◽  
...  
Keyword(s):  
High Resolution ◽  
Augmented Reality ◽  
Critical Infrastructure ◽  
Three Dimensional ◽  
Next Generation ◽  
Multiple Sources ◽  
Dimensional Measurements ◽  
Infrastructure Inspection ◽  
Inspection Data ◽  
Structural Inspection

This article introduces the use of emerging augmented reality technology to enable the next generation of structural infrastructure inspection and awareness. This work is driven by the prevalence of visual structural inspection. It is known that current visual inspection techniques have multiple sources of variance that should be reduced in order to achieve less ambiguous visual inspections. Emerging augmented reality tools feature a variety of sensors, computation, and communication resources that can enable relevant structural inspection data to be collected at very high resolution in an unambiguous manner. This work shows how emerging augmented reality tools can be used to greatly enhance our ability to capture comprehensive, high-resolution, three-dimensional measurements of critical infrastructure. This work also provides detailed information on the software architecture for augmented reality structural inspection applications that helps meet the goals of the framework. The fact that the framework is designed to accommodate the considerations associated with high-consequence infrastructure implies that it is also comprehensive enough to be applied to less hazardous but still high-value infrastructure such as bridges, dams, and tunnels. Augmented reality has great potential to enable the next generation of smart infrastructure, and this work focuses on addressing how augmented reality can be leveraged to enable the next generation of structural awareness for high-consequence, long-lifespan structures.

High‐resolution, three‐dimensional measurements of low‐frequency sound propagation in shallow water

1998 ◽  
Vol 103 (5) ◽  
pp. 3028-3028 ◽  
Author(s):  
George V. Frisk ◽  
Kyle M. Becker ◽  
Laurence N. Connor ◽  
James A. Doutt ◽  
Cynthia J. Sellers
Keyword(s):  
High Resolution ◽  
Shallow Water ◽  
Sound Propagation ◽  
Three Dimensional ◽  
Low Frequency ◽  
Frequency Sound ◽  
Dimensional Measurements

High-Resolution, Three-Dimensional Measurements of Low-Frequency Sound Propagation in Shallow Water

1998 ◽  
Author(s):  
George V. Frisk ◽  
Kyle M. Becker ◽  
Laurence N. Connor ◽  
James A. Doutt ◽  
Cynthia J. Sellers
Keyword(s):  
High Resolution ◽  
Shallow Water ◽  
Sound Propagation ◽  
Three Dimensional ◽  
Low Frequency ◽  
Frequency Sound ◽  
Dimensional Measurements

Uncertainty Management of Flatness According to PUMA

2011 ◽  
Vol 393-395 ◽  
pp. 489-492
Author(s):  
Cun Xia Li ◽  
Rui Hai Ji
Keyword(s):  
Three Dimensional ◽  
Great Influence ◽  
Uncertainty Management ◽  
Product Performance ◽  
Next Generation ◽  
Target Uncertainty ◽  
Fitting Method ◽  
Three Dimensional Measurement ◽  
Dimensional Measurements ◽  
Product Specifications

Next generation of Geometrical Product Specifications (GPS) is the foundation of the technology standards and metrology specifications of mechanical and electric products. GPS estimation of uncertainty can make the results of verification of products reliable and can be compared globally. Flatness is an important geometrical feature of a product and has great influence to the product performance and assembly quality. The uncertainty in flatness three-dimensional measurements must be estimated according to GPS standards to assure the related functions of a product. According to t ISO/TS 14253-2, a calculation method of the uncertainty in flatness three-dimensional measurement by certain fitting method is proposed. The method was evaluated and improved according to Procedure for Uncertainty Management, which is given by next generation of GPS. The measurement process which can meet the target uncertainty was obtained at last.

Visualizing Standardized Model-based Design and Inspection Data in Augmented Reality

2021 ◽  
pp. 1-14
Author(s):  
Teodor Vernica ◽  
Robert Lipman ◽  
Thomas Kramer ◽  
Soonjo Kwon ◽  
William Bernstein
Keyword(s):  
Augmented Reality ◽  
Three Dimensional ◽  
Major Barrier ◽  
Specific Data ◽  
Domain Specific ◽  
Data Representations ◽  
Product Manufacturing ◽  
Inspection Data ◽  
Maintenance Process ◽  
Product Assembly

Abstract Augmented reality (AR) has already helped manufacturers realize value across a variety of domains, including assistance in maintenance, process monitoring, and product assembly. However, coordinating traditional engineering data representations into AR systems without loss of context and information remains a challenge. A major barrier is the lack of interoperability between manufacturing-specific data models and AR-capable data representations. In response, we present a pipeline for porting standards-based design and inspection data into an AR scene. As a result, product manufacturing information with three-dimensional (3D) model data and corresponding inspection results are successfully overlaid onto a physical part. We demonstrate our pipeline by interacting with annotated parts while continuously tracking their pose and orientation. We then validate the pipeline by testing against six fully toleranced design models, accompanied by idealized inspection results. Our work (1) pro-vides insight on how to address fundamental issues related to interoperability between domain-specific models and AR systems and (2) establishes an open software pipeline from which others can implement and further develop.

High Resolution Microscopy of Multi-Layered Biological Crystals

1982 ◽  
Vol 40 ◽  
pp. 80-83
Author(s):  
H.A. Cohen ◽  
T.W. Jeng ◽  
W. Chiu
Keyword(s):  
High Resolution ◽  
Low Dose ◽  
Three Dimensional ◽  
Data Interpretation ◽  
Two Dimensional ◽  
Biological Objects ◽  
Density Maps ◽  
Density Map ◽  
Complex Crystal ◽  
High Resolution Microscopy

This tutorial will discuss the methodology of low dose electron diffraction and imaging of crystalline biological objects, the problems of data interpretation for two-dimensional projected density maps of glucose embedded protein crystals, the factors to be considered in combining tilt data from three-dimensional crystals, and finally, the prospects of achieving a high resolution three-dimensional density map of a biological crystal. This methodology will be illustrated using two proteins under investigation in our laboratory, the T4 DNA helix destabilizing protein gp32*I and the crotoxin complex crystal.

Electron crystallographic determination of the 3-D structure of staurolite at atomic resolution

1991 ◽  
Vol 49 ◽  
pp. 540-541
Author(s):  
Kenneth H. Downing ◽  
Hu Meisheng ◽  
Hans-Rudolf Went ◽  
Michael A. O'Keefe
Keyword(s):  
High Resolution ◽  
Three Dimensional ◽  
High Resolution Electron Microscopy ◽  
Atomic Resolution ◽  
Dimensional Structure ◽  
Structure Information ◽  
Resolution Electron ◽  
Scattering Effects ◽  
High Resolution Images ◽  
Effects Of Radiation

With current advances in electron microscope design, high resolution electron microscopy has become routine, and point resolutions of better than 2Å have been obtained in images of many inorganic crystals. Although this resolution is sufficient to resolve interatomic spacings, interpretation generally requires comparison of experimental images with calculations. Since the images are two-dimensional representations of projections of the full three-dimensional structure, information is invariably lost in the overlapping images of atoms at various heights. The technique of electron crystallography, in which information from several views of a crystal is combined, has been developed to obtain three-dimensional information on proteins. The resolution in images of proteins is severely limited by effects of radiation damage. In principle, atomic-resolution, 3D reconstructions should be obtainable from specimens that are resistant to damage. The most serious problem would appear to be in obtaining high-resolution images from areas that are thin enough that dynamical scattering effects can be ignored.

Three-Dimensional Immunoelectron Microscopy of Yeast Cells by a New High-Resolution Replica Method

1985 ◽  
Vol 43 ◽  
pp. 562-563
Author(s):  
Hirano T. ◽  
M. Yamaguchi ◽  
M. Hayashi ◽  
Y. Sekiguchi ◽  
A. Tanaka
Keyword(s):  
High Resolution ◽  
Plasma Polymerization ◽  
Three Dimensional ◽  
Freeze Fracture ◽  
Replica Method ◽  
Yeast Cells ◽  
Dynamic Aspect ◽  
Replica Technique ◽  
Gaseous Hydrocarbon ◽  
Transmission Electron

A plasma polymerization film replica method is a new high resolution replica technique devised by Tanaka et al. in 1978. It has been developed for investigation of the three dimensional ultrastructure in biological or nonbiological specimens with the transmission electron microscope. This method is based on direct observation of the single-stage replica film, which was obtained by directly coating on the specimen surface. A plasma polymerization film was deposited by gaseous hydrocarbon monomer in a glow discharge.The present study further developed the freeze fracture method by means of a plasma polymerization film produces a three dimensional replica of chemically untreated cells and provides a clear evidence of fine structure of the yeast plasma membrane, especially the dynamic aspect of the structure of invagination (Figure 1).

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