Determination of the conductivity and thickness of conductive layers on conductive base materials
2019 ◽
Vol 11
(7)
◽
pp. 168781401985423
Keyword(s):
An eddy current technique for the simultaneous determination of the layer thickness and conductivity of a uniform conductive layer on a known conductive base material is presented. Layer thickness and conductivity are determined by fitting apparent conductivity measurements taken on the surface of the part at a discrete set of frequencies to a calibration volume. The calibration volume is constructed from apparent conductivity measurements taken on a set of known layer materials, of various known thicknesses, as a function of frequency. Experimental results that support the technique are presented.
2018 ◽
Vol 90
(24)
◽
pp. 14150-14155
◽
Keyword(s):
Evaluation of Surface Shape and Refractive Index of a Transparent Plate Based on Light Path Analysis
2010 ◽
Vol 36
◽
pp. 458-465
1978 ◽
Vol 48
◽
pp. 287-293
◽
Keyword(s):
1998 ◽
Vol 308
◽
pp. 43-53
◽