A simple monochromator

Author(s):  
H. C. G. Vincent

An easily constructed apparatus, giving illumination by light of any chosen colour, and of adequate purity in a narrow spectral region, has been made and found satisfactory in the determination of the optical properties of crystals.Light of high intensity is focused on an adjustable slit, rendered approximately parallel by means of a lens, and passed through two hollow prisms containing alpha-monochloronaphthalene. In the widely divergent spectral beams the microscope moves along a calibrated arc and any desired wave-band of reasonable purity may be selected. The apparatus is illustrated in the accompanying diagram (fig. 1) and photograph (fig. 2).A small carbon arc (A) using direct or alternating current gives adequate intensity, allowing for a narrow setting of the slit, with corresponding purity of the monochromatic beam.

2008 ◽  
Vol 17 (04) ◽  
pp. 511-520 ◽  
Author(s):  
A. MENDOZA-GARCÍA ◽  
J. L. PAZ ◽  
M. GORAYEB ◽  
A. J. HERNÁNDEZ ◽  
E. CASTRO ◽  
...  

The interaction between a two-level molecular system and a high intensity electric field under the influence of a solvent was analyzed through the OSBE. To solve these equations, the average of the coherence was performed, using a generalized Lorentzian approximation for the Voigt's function as a probability distribution. Applying the convolution theorem, we were able to find an analytical expression for the coherence, from which we calculate optical properties, such as the absorption coefficient, refractive index and emitted signal intensity. In this contribution, we show numerical results for these properties, calculated for a standard model of organic colorants, Green Malaquite.


Photonics ◽  
2021 ◽  
Vol 8 (2) ◽  
pp. 41
Author(s):  
Najat Andam ◽  
Siham Refki ◽  
Hidekazu Ishitobi ◽  
Yasushi Inouye ◽  
Zouheir Sekkat

The determination of optical constants (i.e., real and imaginary parts of the complex refractive index (nc) and thickness (d)) of ultrathin films is often required in photonics. It may be done by using, for example, surface plasmon resonance (SPR) spectroscopy combined with either profilometry or atomic force microscopy (AFM). SPR yields the optical thickness (i.e., the product of nc and d) of the film, while profilometry and AFM yield its thickness, thereby allowing for the separate determination of nc and d. In this paper, we use SPR and profilometry to determine the complex refractive index of very thin (i.e., 58 nm) films of dye-doped polymers at different dye/polymer concentrations (a feature which constitutes the originality of this work), and we compare the SPR results with those obtained by using spectroscopic ellipsometry measurements performed on the same samples. To determine the optical properties of our film samples by ellipsometry, we used, for the theoretical fits to experimental data, Bruggeman’s effective medium model for the dye/polymer, assumed as a composite material, and the Lorentz model for dye absorption. We found an excellent agreement between the results obtained by SPR and ellipsometry, confirming that SPR is appropriate for measuring the optical properties of very thin coatings at a single light frequency, given that it is simpler in operation and data analysis than spectroscopic ellipsometry.


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