Large-scale segmentation and tracing for neurons in Drosophila brain by Fast Automatically Structural Tracing Algorithm (FASTA)

Acquisition of distinct neuronal identities during development is critical for the assembly of diverse functional neural circuits in the brain. In both vertebrates and invertebrates, intrinsic determinants are thought to act in neural progenitors to specify their identity and the identity of their neuronal progeny. However, the extent to which individual factors can contribute to this is poorly understood. We investigate the role of orthodenticle in the specification of an identified neuroblast (neuronal progenitor) lineage in the Drosophila brain. Loss of orthodenticle from this neuroblast affects molecular properties, neuroanatomical features, and functional inputs of progeny neurons, such that an entire central complex lineage transforms into a functional olfactory projection neuron lineage. This ability to change functional macrocircuitry of the brain through changes in gene expression in a single neuroblast reveals a surprising capacity for novel circuit formation in the brain and provides a paradigm for large-scale evolutionary modification of circuitry.

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Simple Simulated Propagation Modeling and Experimentation within and around Buildings at 2700 MHz

International Journal of Vehicular Technology ◽

10.1155/2016/9846374 ◽

2016 ◽

Vol 2016 ◽

pp. 1-10

Author(s):

Tanay Bhatt ◽

Jonathan Bredow

Keyword(s):

Large Scale ◽

Signal Strength ◽

Signal Energy ◽

Propagation Modeling ◽

Specular Scattering ◽

Strong Signal ◽

Office Space ◽

Scale Models ◽

Strength Behavior ◽

Tracing Algorithm

There is a growing interest in understanding wave behavior in urban and suburban environment for 5th generation broadband applications. With the advent of using broadband technologies in buildings, office space and vehicle have become a necessity on a large scale. Models, predictions, and calculations for in-building, within a vehicle or near a reflective object with microscale details, are becoming highly classified in a competitive telecom environment. This paper provides an improved understanding of signal strength behavior within suburban residences with predictions prequalified using a vehicular scanner. Supporting predictions are provided by a ray tracing algorithm developed for dissertation. Results indicate signal strength variation of more than 50 dB from “strong signal” locations such as room centers and far corners to “weak signal” locations where shadowing and tunneling effects are evident. Based on this unique classification a scheme is proposed which indicates that specular scattering provides the major signal energy at more than 70% of the locations within the residences. Finally, an observed rake stabilizing effect is attributed to the proximity of strong scatterers.

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An RSSI Classification and Tracing Algorithm to Improve Trilateration-Based Positioning

Sensors ◽

10.3390/s20154244 ◽

2020 ◽

Vol 20 (15) ◽

pp. 4244 ◽

Cited By ~ 2

Author(s):

Yong Shi ◽

Wenzhong Shi ◽

Xintao Liu ◽

Xianjian Xiao

Keyword(s):

Large Scale ◽

Low Cost ◽

Path Loss ◽

Signal Strength ◽

Received Signal Strength Indicator ◽

Mean Filter ◽

Small Test ◽

Sample Count ◽

Tracing Algorithm ◽

The Mean

Received signal strength indicator (RSSI)-based positioning is suitable for large-scale applications due to its advantages of low cost and high accuracy. However, it suffers from low stability because RSSI is easily blocked and easily interfered with by objects and environmental effects. Therefore, this paper proposed a tri-partition RSSI classification and its tracing algorithm as an RSSI filter. The proposed filter shows an available feature, where small test RSSI samples gain a low deviation of less than 1 dBm from a large RSSI sample collected about 10 min, and the sub-classification RSSIs conform to normal distribution when the minimum sample count is greater than 20. The proposed filter also offers several advantages compared to the mean filter, including lower variance range with an overall range of around 1 dBm, 25.9% decreased sample variance, and 65% probability of mitigating RSSI left-skewness. We experimentally confirmed the proposed filter worked in the path-loss exponent fitting and location computing, and a 4.45-fold improvement in positioning stability based on the sample standard variance, and positioning accuracy improved by 20.5% with an overall error of less than 1.46 m.

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Sweep-tracing algorithm: in silico slip crystallography and tension-compression asymmetry in BCC metals

Materials Theory ◽

10.1186/s41313-021-00031-7 ◽

2022 ◽

Vol 6 (1) ◽

Author(s):

Nicolas Bertin ◽

L.A. Zepeda-Ruiz ◽

V.V. Bulatov

Keyword(s):

Crystal Plasticity ◽

In Silico ◽

Large Scale ◽

Mechanical Response ◽

Md Simulations ◽

Dislocation Motion ◽

Computational Method ◽

Dislocation Slip ◽

Bcc Metals ◽

Tracing Algorithm

AbstractDirect Molecular Dynamics (MD) simulations are being increasingly employed to model dislocation-mediated crystal plasticity with atomic resolution. Thanks to the dislocation extraction algorithm (DXA), dislocation lines can be now accurately detected and positioned in space and their Burgers vector unambiguously identified in silico, while the simulation is being performed. However, DXA extracts static snapshots of dislocation configurations that by themselves present no information on dislocation motion. Referred to as a sweep-tracing algorithm (STA), here we introduce a practical computational method to observe dislocation motion and to accurately quantify its important characteristics such as preferential slip planes (slip crystallography). STA reconnects pairs of successive snapshots extracted by DXA and computes elementary slip facets thus precisely tracing the motion of dislocation segments from one snapshot to the next. As a testbed for our new method, we apply STA to the analysis of dislocation motion in large-scale MD simulations of single crystal plasticity in BCC metals. We observe that, when the crystal is subjected to uniaxial deformation along its [001] axis, dislocation slip predominantly occurs on the {112} maximum resolved shear stress plane under tension, while in compression slip is non-crystallographic (pencil) resulting in asymmetric mechanical response. The marked contrast in the observed slip crystallography is attributed to the twinning/anti-twinning asymmetry of shears in the {112} planes relatively favoring dislocation motion in the twinning sense while hindering dislocations from moving in the anti-twinning directions.

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Some comments about observations and image processing of comet 29P/Schwassmann-Wachmann 1

International Astronomical Union Colloquium ◽

10.1017/s0252921100031493 ◽

1999 ◽

Vol 173 ◽

pp. 243-248

Author(s):

D. Kubáček ◽

A. Galád ◽

A. Pravda

Keyword(s):

Image Processing ◽

Large Scale ◽

Harvard College ◽

Oak Ridge ◽

Large Scale Structures ◽

Short Period Comet ◽

Short Period ◽

Scale Structures ◽

Harvard College Observatory ◽

Period Comet

AbstractUnusual short-period comet 29P/Schwassmann-Wachmann 1 inspired many observers to explain its unpredictable outbursts. In this paper large scale structures and features from the inner part of the coma in time periods around outbursts are studied. CCD images were taken at Whipple Observatory, Mt. Hopkins, in 1989 and at Astronomical Observatory, Modra, from 1995 to 1998. Photographic plates of the comet were taken at Harvard College Observatory, Oak Ridge, from 1974 to 1982. The latter were digitized at first to apply the same techniques of image processing for optimizing the visibility of features in the coma during outbursts. Outbursts and coma structures show various shapes.

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Evolution of Large-Scale Coronal Structures

International Astronomical Union Colloquium ◽

10.1017/s0252921100024945 ◽

1994 ◽

Vol 144 ◽

pp. 29-33

Author(s):

P. Ambrož

Keyword(s):

Magnetic Field ◽

Field Line ◽

Large Scale ◽

Coronal Magnetic Field ◽

Source Surface ◽

Solar Cycles ◽

Characteristic Relationship ◽

The Magnetic Field ◽

Coronal Structures

AbstractThe large-scale coronal structures observed during the sporadically visible solar eclipses were compared with the numerically extrapolated field-line structures of coronal magnetic field. A characteristic relationship between the observed structures of coronal plasma and the magnetic field line configurations was determined. The long-term evolution of large scale coronal structures inferred from photospheric magnetic observations in the course of 11- and 22-year solar cycles is described.Some known parameters, such as the source surface radius, or coronal rotation rate are discussed and actually interpreted. A relation between the large-scale photospheric magnetic field evolution and the coronal structure rearrangement is demonstrated.

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Large-scale Motion of Solar Filaments

International Astronomical Union Colloquium ◽

10.1017/s0252921100064502 ◽

2000 ◽

Vol 179 ◽

pp. 205-208

Author(s):

Pavel Ambrož ◽

Alfred Schroll

Keyword(s):

Magnetic Flux ◽

Proper Motion ◽

Time Scale ◽

Large Scale ◽

Accuracy Of Measurements ◽

Solar Filaments ◽

General Movement ◽

Scale Motion ◽

Velocity Scatter

AbstractPrecise measurements of heliographic position of solar filaments were used for determination of the proper motion of solar filaments on the time-scale of days. The filaments have a tendency to make a shaking or waving of the external structure and to make a general movement of whole filament body, coinciding with the transport of the magnetic flux in the photosphere. The velocity scatter of individual measured points is about one order higher than the accuracy of measurements.

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Some applications of electron beam microanalysis techniques in VLSI process evaluation

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010007463x ◽

1983 ◽

Vol 41 ◽

pp. 160-161

Author(s):

Simon Thomas

Keyword(s):

Integrated Circuits ◽

Process Evaluation ◽

Large Scale ◽

Technology Development ◽

Analytical Techniques ◽

Successful Implementation ◽

Analysis Of Failures ◽

Characterization Of Materials ◽

Circuits Vlsi

Trends in the technology development of very large scale integrated circuits (VLSI) have been in the direction of higher density of components with smaller dimensions. The scaling down of device dimensions has been not only laterally but also in depth. Such efforts in miniaturization bring with them new developments in materials and processing. Successful implementation of these efforts is, to a large extent, dependent on the proper understanding of the material properties, process technologies and reliability issues, through adequate analytical studies. The analytical instrumentation technology has, fortunately, kept pace with the basic requirements of devices with lateral dimensions in the micron/ submicron range and depths of the order of nonometers. Often, newer analytical techniques have emerged or the more conventional techniques have been adapted to meet the more stringent requirements. As such, a variety of analytical techniques are available today to aid an analyst in the efforts of VLSI process evaluation. Generally such analytical efforts are divided into the characterization of materials, evaluation of processing steps and the analysis of failures.

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