scholarly journals Optical Properties of Nanocrystalline/Amorphous TiO2 Thin Film Deposited by rf Plasma Magnetron Sputtering

2020 ◽  
Vol 137 (6) ◽  
pp. 1068-1074
Author(s):  
A.A. Abd El-Moula ◽  
M. Raaif ◽  
F.M. El-Hossary
2011 ◽  
Vol 25 (20) ◽  
pp. 2741-2749 ◽  
Author(s):  
J. C. ZHOU ◽  
L. LI ◽  
L. Y. RONG ◽  
B. X. ZHAO ◽  
Y. M. CHEN ◽  
...  

High transparency and conductivity of transparent conducting oxide thin film are very important for improving the efficiency of solar cells. ZnO thin film is a better candidate for transparent conductive layer of solar cell. N-type ZnO thin films were prepared by radio-frequency magnetron sputtering on glass substrates. ZnO thin films underwent annealing treatment after deposition. The influence of the sputtering power on the surface morphology, the electrical and optical properties were studied by AFM, XRD, UV2450 and HMS-3000. The experimental results indicate that the crystal quality of ZnO thin film is improved and all films show higher c-axis orientation with increasing sputtering power from 50 to 125 W. The average transparency of ZnO thin films is higher than 90% in the range of 400–900 nm between the sputtering power of 50–100 W. After the rapid thermal annealing at 550°C for 300 s under N2 ambient, the minimum resistivity reach to 10-2Ω⋅ cm .


2005 ◽  
Vol 27 (9) ◽  
pp. 1501-1505 ◽  
Author(s):  
Anna Łukowiak ◽  
Rafal Dylewicz ◽  
Sergiusz Patela ◽  
Wieslaw Stręk ◽  
Krzysztof Maruszewski

2011 ◽  
Author(s):  
Jianjun Tian ◽  
Hongmei Deng ◽  
Lin Sun ◽  
Hui Kong ◽  
Pingxiong Yang ◽  
...  

2011 ◽  
Vol 11 (2) ◽  
pp. 1692-1695 ◽  
Author(s):  
Sang-Jun Kang ◽  
Ki-Joong Kim ◽  
Min-Chul Chung ◽  
Sang-Chul Jung ◽  
Su-Il Boo ◽  
...  

2015 ◽  
Vol 233-234 ◽  
pp. 653-656 ◽  
Author(s):  
Elena E. Shalygina ◽  
Elena A. Gan’shina ◽  
Anna M. Kharlamova ◽  
Aleksander N. Mukhin ◽  
Galina V. Kurlyandskaya ◽  
...  

The magnetic and magneto-optical properties of the Co/Si/Co thin-film samples obtained by magnetron sputtering were investigated employing magnetooptical techniques. The thickness of the Co layers was equal to 5 nm, and Si layer thickness varied in the interval of 0.2 to 3.2 nm. The magnetic saturation field of the samples under study was found to oscillate in the magnitude with the change of the Si layer thickness. This result was explained by structural features of the Co/Si/Co multilayers and the presence of the antiferromagnetic exchange coupling between magnetic layers via the silicon interlayer. The peculiarities of the magneto-optical spectra of the Co/Si/Co samples were measured and discussed.


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