In situ ellipsometric study of optical properties of ultrathin films

Optical sensors fabricated in zeolite nanoparticle composite films rely on changes in their optical properties (refractive index, n, and thickness, d) to produce a measurable response in the presence of a target analyte. Here, ellipsometry is used to characterize the changes in optical properties of Linde Type L (LTL) zeolite thin films in the presence of Cu2+ ions in solution, with a view to improving the design of optical sensors that involve the change of n and/or d due to the adsorption of Cu2+ ions. The suitability of two different ellipsometry techniques (single wavelength and spectroscopic) for the evaluation of changes in n and d of both undoped and zeolite-doped films during exposure to water and Cu2+-containing solutions was investigated. The influence of pre-immersion thermal treatment conditions on sensor response was also studied. Due to the high temporal resolution, single wavelength ellipsometry facilitated the identification of a Cu2+ concentration response immediately after Cu2+ introduction, indicating that the single wavelength technique is suitable for dynamic studies of sensor–analyte interactions over short time scales. In comparison, spectroscopic ellipsometry produced a robust analysis of absolute changes in film n and d, as well as yielding insight into the net influence of competing and simultaneous changes in n and d inside the zeolite-doped films arising due to water adsorption and the ion exchange of potassium (K+) cations by copper (Cu2+).

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Epitaxial growth manner and structure of superconducting oxide films

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100173145 ◽

1990 ◽

Vol 48 (4) ◽

pp. 2-3

Author(s):

Yoshichika Bando ◽

Takahito Terashima ◽

Kenji Iijima ◽

Kazunuki Yamamoto ◽

Kazuto Hirata ◽

...

Keyword(s):

Ultrathin Films ◽

Film Surface ◽

High Energy ◽

Epitaxial Films ◽

Layer By Layer ◽

Initial Growth ◽

In Situ Growth ◽

High Quality ◽

Activated Reactive Evaporation

The high quality thin films of high-Tc superconducting oxide are necessary for elucidating the superconducting mechanism and for device application. The recent trend in the preparation of high-Tc films has been toward “in-situ” growth of the superconducting phase at relatively low temperatures. The purpose of “in-situ” growth is to attain surface smoothness suitable for fabricating film devices but also to obtain high quality film. We present the investigation on the initial growth manner of YBCO by in-situ reflective high energy electron diffraction (RHEED) technique and on the structural and superconducting properties of the resulting ultrathin films below 100Å. The epitaxial films have been grown on (100) plane of MgO and SrTiO, heated below 650°C by activated reactive evaporation. The in-situ RHEED observation and the intensity measurement was carried out during deposition of YBCO on the substrate at 650°C. The deposition rate was 0.8Å/s. Fig. 1 shows the RHEED patterns at every stage of deposition of YBCO on MgO(100). All the patterns exhibit the sharp streaks, indicating that the film surface is atomically smooth and the growth manner is layer-by-layer.

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Hyperspectral Remote Sensing of the Coastal Ocean: Adaptive Sampling and Forecasting of In situ Optical Properties

10.21236/ada624963 ◽

2001 ◽

Author(s):

Oscar Schofield ◽

Scott Glenn ◽

Dale Haidvogel ◽

Frederick Grassle

Keyword(s):

Remote Sensing ◽

Optical Properties ◽

Adaptive Sampling ◽

Coastal Ocean ◽

Hyperspectral Remote Sensing

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Developing the Ability to Map In situ Optical Properties in Coastal Waters using Slocum Coastal Gliders

10.21236/ada629246 ◽

2003 ◽

Author(s):

Oscar Schofield ◽

Scott Glenn ◽

Clayton Jones

Keyword(s):

Optical Properties ◽

Coastal Waters

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Evaluating model parameterizations of submicron aerosol scattering and absorption with in situ data from ARCTAS 2008

Atmospheric Chemistry and Physics ◽

10.5194/acp-16-9435-2016 ◽

2016 ◽

Vol 16 (14) ◽

pp. 9435-9455 ◽

Cited By ~ 8

Author(s):

Matthew J. Alvarado ◽

Chantelle R. Lonsdale ◽

Helen L. Macintyre ◽

Huisheng Bian ◽

Mian Chin ◽

...

Keyword(s):

Optical Properties ◽

Size Distribution ◽

Aerosol Size Distribution ◽

Visible Radiation ◽

Submicron Aerosol ◽

In Situ Data ◽

Aerosol Absorption ◽

Aerosol Scattering ◽

The Impact

Abstract. Accurate modeling of the scattering and absorption of ultraviolet and visible radiation by aerosols is essential for accurate simulations of atmospheric chemistry and climate. Closure studies using in situ measurements of aerosol scattering and absorption can be used to evaluate and improve models of aerosol optical properties without interference from model errors in aerosol emissions, transport, chemistry, or deposition rates. Here we evaluate the ability of four externally mixed, fixed size distribution parameterizations used in global models to simulate submicron aerosol scattering and absorption at three wavelengths using in situ data gathered during the 2008 Arctic Research of the Composition of the Troposphere from Aircraft and Satellites (ARCTAS) campaign. The four models are the NASA Global Modeling Initiative (GMI) Combo model, GEOS-Chem v9-02, the baseline configuration of a version of GEOS-Chem with online radiative transfer calculations (called GC-RT), and the Optical Properties of Aerosol and Clouds (OPAC v3.1) package. We also use the ARCTAS data to perform the first evaluation of the ability of the Aerosol Simulation Program (ASP v2.1) to simulate submicron aerosol scattering and absorption when in situ data on the aerosol size distribution are used, and examine the impact of different mixing rules for black carbon (BC) on the results. We find that the GMI model tends to overestimate submicron scattering and absorption at shorter wavelengths by 10–23 %, and that GMI has smaller absolute mean biases for submicron absorption than OPAC v3.1, GEOS-Chem v9-02, or GC-RT. However, the changes to the density and refractive index of BC in GC-RT improve the simulation of submicron aerosol absorption at all wavelengths relative to GEOS-Chem v9-02. Adding a variable size distribution, as in ASP v2.1, improves model performance for scattering but not for absorption, likely due to the assumption in ASP v2.1 that BC is present at a constant mass fraction throughout the aerosol size distribution. Using a core-shell mixing rule in ASP overestimates aerosol absorption, especially for the fresh biomass burning aerosol measured in ARCTAS-B, suggesting the need for modeling the time-varying mixing states of aerosols in future versions of ASP.

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In Situ Magnetic-Circular-X-Ray-Dichroism Measurements: An Epitaxial Fe Wedge on Cu(100)

MRS Bulletin ◽

10.1557/s0883769400051721 ◽

1999 ◽

Vol 24 (1) ◽

pp. 41-45 ◽

Cited By ~ 1

Author(s):

M.E. Dávila ◽

D. Arvanitis ◽

J. Hunter Dunn ◽

N. Mårtensson ◽

P. Srivastava ◽

...

Keyword(s):

Ultrathin Films ◽

Magnetic Circular Dichroism ◽

Polarized Light ◽

Measured Quantity ◽

Easy Magnetization ◽

Magnetization Direction ◽

Core Electron ◽

Circularly Polarized ◽

X Ray

Circularly polarized x-ray radiation is attracting increasing interest as a tool for the characterization of the electronic, magnetic, and chiral properties of low-dimensional structures. Using circular light (with electric field vector parallel to the orbital plane), a dependence of the measured quantity by changing either the orientation of the light polarization or the magnetization is indicative of the existence of magnetic circular dichroism. It can be observed in x-ray absorption spectroscopy (XAS), in which the photon energy is scanned through an absorption threshold exciting a core electron into an unoccupied valence state using circularly polarized light. Synchrotron radiation sources have made this technique possible. It can also be observed in photo-emission spectroscopy from core and valence levels. Here we focus on magnetic circular x-ray dichroism (MCXD) in XAS as an element-specific tool to investigate magnetic properties of ultrathin films in situ. The application of magneto-optical sum rules enables the determination of the orbital and spin magnetic moments per atom from XAS spectra, as well as the easy magnetization direction.MCXD-based magnetometry in XAS is extensively used by measuring the L absorption edges of 3d-transition metals, where large intensity changes (up to 60%) of the L-edge white lines are observed upon reversal of either the sample magnetization or the light helicity. The high magnetic contrast obtained, combined with the elemental specificity of the technique, allows for the study of very dilute samples such as ultrathin films. We first concentrate on the selection rules governing MCXD in XAS.

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