Identification of metal surface features with THz dark-field imaging techniques

2003 ◽  
Author(s):  
N. Hasegawa ◽  
M. Thomson ◽  
T. Löffler ◽  
H. Roskos
Keyword(s):  
Metal Surface ◽  
Imaging Techniques ◽  
Dark Field ◽  
Surface Features ◽  
Dark Field Imaging ◽  
Field Imaging

Precipitation and dislocation decoration via extrinsic gettering of Co, Au and Pt by misfit dislocations in Si/Si-2%Ge epitaxy

1989 ◽  
Vol 47 ◽  
pp. 578-579
Author(s):  
D. M. Lee
Keyword(s):  
Imaging Techniques ◽  
Preceding Paper ◽  
Dark Field ◽  
Misfit Dislocations ◽  
Temperature Dependent ◽  
Bright Field ◽  
Dark Field Imaging ◽  
Weak Beam ◽  
Sample Structure ◽  
Field Imaging

Previous work on the gettering activity of a well defined array of buried interfacial misfit dislocations (MDs) showed that the amount of nickel gettered by MD is dominated by the strong temperature-dependent solubility. Precipitation occurs on or in the immediate vicinity of MDs due to nucleation enhancement by strain effects. High temperature 〈1000°C〉 diffusion of gold resulted in the planar colony precipitates on two {111} planes associated with stacking fault formation. In this contribution, we discuss our continuing research pertaining to cobalt, gold (at low temperature), and platinum gettering by MDs which involves studying the nature of dislocation decoration and impurity precipitation in the Si/Si-2%Ge epitaxial system.All the samples used in this study have a buried Si-2%Ge epitaxial layer of ∼ 2 μm thickness.Co, Au and Pt were deliberately diffused into the wafer. The details of the sample structure and preparation are described in a preceding paper. Two-beam bright field and weak-beam dark field imaging techniques were performed on cross-section TEM specimens.

scholarly journals Symmetric Talbot-Lau neutron grating interferometry and incoherent scattering correction for quantitative dark-field imaging

2019 ◽  
Vol 9 (1) ◽  
Author(s):  
Youngju Kim ◽  
Jacopo Valsecchi ◽  
Jongyul Kim ◽  
Seung Wook Lee ◽  
Markus Strobl
Keyword(s):  
Imaging Techniques ◽  
Reference Sample ◽  
Dark Field ◽  
Incoherent Scattering ◽  
The Novel ◽  
Contrast Imaging ◽  
Dark Field Imaging ◽  
Novel Approach ◽  
Set Up ◽  
Field Imaging

AbstractWe introduce the application of a symmetric Talbot-Lau neutron grating interferometer which provides a significantly extended autocorrelation length range essential for quantitative dark-field contrast imaging. The highly efficient set-up overcomes the limitation of the conventional Talbot-Lau technique to a severely limited micrometer range as well as the limitation of the other advanced dark-field imaging techniques in the nanometer regime. The novel set-up enables efficient and continuous dark-field contrast imaging providing quantitative small-angle neutron scattering information for structures in a regime from some tens of nanometers to several tens of micrometers. The quantitative analysis enabled in and by such an extended range is demonstrated through application to reference sample systems of the diluted polystyrene particle in aqueous solutions. Here we additionally demonstrate and successfully discuss the correction for incoherent scattering. This correction results to be necessary to achieve meaningful quantitative structural results. Furthermore, we present the measurements, data modelling and analysis of the two distinct kinds of cohesive powders enabled by the novel approach, revealing the significant structural differences of their fractal nature.

Detection of a point defect in a silicon single crystal by high-resolution TEM

1995 ◽  
Vol 53 ◽  
pp. 466-467
Author(s):  
M. Awaji
Keyword(s):  
High Resolution ◽  
Single Crystal ◽  
Point Defect ◽  
Point Defects ◽  
Noise Level ◽  
Dark Field ◽  
Silicon Single Crystal ◽  
High Resolution Image ◽  
Dark Field Imaging ◽  
Field Imaging

It is necessary to improve the resolution, brightness and signal-to-noise ratio(s/n) for the detection and identification of point defects in crystals. In order to observe point defects, multi-beam dark-field imaging is one of the useful methods. Though this method can improve resolution and brightness compared with dark-field imaging by diffuse scattering, the problem of s/n still exists. In order to improve the exposure time due to the low intensity of the dark-field image and the low resolution, we discuss in this paper the bright-field high-resolution image and the corresponding subtracted image with reference to a changing noise level, and examine the possibility for in-situ observation, identification and detection of the movement of a point defect produced in the early stage of damage process by high energy electron bombardment.The high-resolution image contrast of a silicon single crystal in the [10] orientation containing a triple divacancy cluster is calculated using the Cowley-Moodie dynamical theory and for a changing gaussian noise level. This divacancy model was deduced from experimental results obtained by electron spin resonance. The calculation condition was for the lMeV Berkeley ARM operated at 800KeV.

Growth of hematite on (0001) and {1102} sapphire substrates

1990 ◽  
Vol 48 (4) ◽  
pp. 376-377
Author(s):  
Lisa A. Tietz ◽  
Scott R. Summerfelt ◽  
C. Barry Carter
Keyword(s):  
Imaging Techniques ◽  
Chemical Vapor ◽  
Interface Energy ◽  
Dark Field ◽  
Cation Sublattice ◽  
Sapphire Substrates ◽  
Dark Field Imaging ◽  
Weak Beam ◽  
Pressure Chemical ◽  
Interface Structures

Defects in thin films are often introduced at the substrate-film interface during the early stages of growth. The interface structures of semiconductor heterojunctions have been extensively studied because of the electrical activity of defects in these materials. Much less attention has been paid to the structure of oxide-oxide heterojunctions. In this study, the structures of the interfaces formed between hematite (α-Fe2O3) and two orientations of sapphire (α-Al2O3) are examined in relationship to the defects introduced into the hematite film. In such heterojunctions, the oxygen sublattice is expected to have a strong influence on the epitaxy; however, defects which involve only the cation sublattice may be introduced at the interface with little increase in interface energy.Oxide heterojunctions were produced by depositing small quantities of hematite directly onto electrontransparent sapphire substrates using low-pressure chemical vapor deposition. Prior to deposition, the ionthinned substrates were chemically cleaned and annealed at 1400°C to give “clean”, crystalline surfaces. Hematite was formed by the reaction of FeCl3 vapor with water vapor at 1150°C and 1-2 Torr. The growth of the hematite and the interface structures formed on (0001) and {102} substrates have been studied by bright-field, strong- and weak-beam dark-field imaging techniques.

scholarly journals Noninvasive, in vivo assessment of the cervical microcirculation using incident dark field imaging

2021 ◽  
Vol 135 ◽  
pp. 104145
Author(s):  
Yani P. Latul ◽  
Arnoud W. Kastelein ◽  
Patricia W.T. Beemster ◽  
Nienke E. van Trommel ◽  
Can Ince ◽  
...  
Keyword(s):  
Dark Field ◽  
Dark Field Imaging ◽  
Incident Dark Field Imaging ◽  
Field Imaging ◽  
In Vivo Assessment

scholarly journals Correlation of image quality parameters with tube voltage in X-ray dark-field chest radiography: a phantom study

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Andreas P. Sauter ◽  
Jana Andrejewski ◽  
Manuela Frank ◽  
Konstantin Willer ◽  
Julia Herzen ◽  
...  
Keyword(s):  
Image Quality ◽  
Imaging Modality ◽  
Signal Strength ◽  
Dark Field ◽  
Tube Voltage ◽  
X Ray ◽  
Dose Area Product ◽  
Dark Field Imaging ◽  
Field Imaging

AbstractGrating-based X-ray dark-field imaging is a novel imaging modality with enormous technical progress during the last years. It enables the detection of microstructure impairment as in the healthy lung a strong dark-field signal is present due to the high number of air-tissue interfaces. Using the experience from setups for animal imaging, first studies with a human cadaver could be performed recently. Subsequently, the first dark-field scanner for in-vivo chest imaging of humans was developed. In the current study, the optimal tube voltage for dark-field radiography of the thorax in this setup was examined using an anthropomorphic chest phantom. Tube voltages of 50–125 kVp were used while maintaining a constant dose-area-product. The resulting dark-field and attenuation radiographs were evaluated in a reader study as well as objectively in terms of contrast-to-noise ratio and signal strength. We found that the optimum tube voltage for dark-field imaging is 70 kVp as here the most favorable combination of image quality, signal strength, and sharpness is present. At this voltage, a high image quality was perceived in the reader study also for attenuation radiographs, which should be sufficient for routine imaging. The results of this study are fundamental for upcoming patient studies with living humans.

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