scholarly journals A new method for computing the reliability of consecutive k-out-of-n:F systems

Open Physics ◽  
2016 ◽  
Vol 14 (1) ◽  
pp. 166-170 ◽  
Author(s):  
Gökhan Gökdere ◽  
Mehmet Gürcan ◽  
Muhammet Burak Kılıç
Keyword(s):  
Integrated Circuits ◽  
Reliability Evaluation ◽  
New Method ◽  
System Failure ◽  
Ring Networks ◽  
Physical Systems ◽  
Oil Pipeline ◽  
R Project ◽  
Vacuum Systems ◽  
Relay Stations

AbstractIn many physical systems, reliability evaluation, such as ones encountered in telecommunications, the design of integrated circuits, microwave relay stations, oil pipeline systems, vacuum systems in accelerators, computer ring networks, and spacecraft relay stations, have had applied consecutivek-out-of-nsystem models. These systems are characterized as logical connections among the components of the systems placed in lines or circles. In literature, a great deal of attention has been paid to the study of the reliability evaluation of consecutivek-out-of-nsystems. In this paper, we propose a new method to compute the reliability of consecutivek-out-of-n:F systems, withnlinearly and circularly arranged components. The proposed method provides a simple way for determining the system failure probability. Also, we write R-Project codes based on our proposed method to compute the reliability of the linear and circular systems which have a great number of components.

scholarly journals Reliability Model of Fuzzy Consecutive k-out-of-n: F System

2019 ◽  
Vol 2 (1) ◽  
pp. 1-4
Author(s):  
eman elghamry ◽  
medhat ahmed eldamcesse ◽  
mohamed shokry nayel
Keyword(s):  
Integrated Circuits ◽  
Failure Time ◽  
Reliability Function ◽  
Rayleigh Distribution ◽  
System Structure ◽  
Ring Networks ◽  
Fuzzy Reliability ◽  
Telecommunication System ◽  
Fuzzy Parameter ◽  
Relay Stations

Redundancy can be used to increase system reliability. The most popular type of redundancy, k-out-of-n system structure, finds wide applications in both industrial and military systems. Aspecial type of this system is the consecutive k-out-of-n:F system C(k,n:F) which have been proposed for reliability evaluation and integrated circuits design, microwave relay stations in telecommunication system, oil pipelines systems, vacuum systems in accelerators, computer ring networks, and spacecraft relay stations. In this paper, we will discuss a new algorithm for evaluating the fuzzy reliability of any fuzzy linear consecutive k-out-of-n:Fsystem (Lin/C(k,n:F)) with independent, unrepairable, and non-identical components.Later,we will introduce a model of unrepairable system consists of parallel subsystems if each subsystem is Lin/C(k,n:F). Due to uncertainty and insufficient data, failure time of each component follows fuzzy Rayleigh distribution with one fuzzy parameter. This fuzzy parameter is represented by triangular membership function and estimated from statistical data taken from random samples of each component. Furthermore, a numerical example for a fuzzy unrepairable parallel system with three subsystems is given while eachsystem is represented by Lin/C(k,n:F).Also, the failure time of each component follows fuzzy Rayleigh distribution to get analytically and represents the fuzzy reliability function of this fuzzy system graphically.

Consecutive k-out-of-n lines with a change point

2016 ◽  
Vol 230 (6) ◽  
pp. 545-550 ◽  
Author(s):  
Serkan Eryilmaz
Keyword(s):  
Closed Form ◽  
Reliability Analysis ◽  
Change Point ◽  
Reliability Evaluation ◽  
Telecommunication Networks ◽  
Pipeline System ◽  
Time To Failure ◽  
Oil Pipeline ◽  
Vacuum Systems ◽  
Mean Time

Reliability analysis of consecutive k-out-of- n systems and their generalizations has attracted a great deal of attention in the literature. Such systems have been used to model telecommunication networks, oil pipeline systems, vacuum systems in accelerators, spacecraft relay stations, etc. In this paper, nonrecursive closed form equations are presented for the reliability functions and mean time to failure values of consecutive k-out-of- n systems consisting of two types of nonidentical components. The results are illustrated for reliability evaluation of oil pipeline system.

In SEM a New Method of Internal Micrographic Visualization of Semiconductor Materials and IC by Crossing the Surface

2001 ◽  
Vol 7 (S2) ◽  
pp. 484-485
Author(s):  
Ling Xiao ◽  
Zhuguan Liang ◽  
Yawen Li ◽  
Jian Wang ◽  
Kailin Zhou ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Integrated Circuit ◽  
Silicon Oxide ◽  
Detection Method ◽  
New Method ◽  
Semiconductor Materials ◽  
Contactless Method ◽  
Quality And Reliability ◽  
Nitride Layers ◽  
Scanning Electron

In the paper, we firstly publish a new method of internal micrographic visualization of semiconductor and IC. The quality and reliability of the semiconductor materials (SM) and the integrated circuits (IC) have always been concerned Having a high resolution, high reliable and nondestructive detection method is the key element for their improvements.Silicon oxide layers are used to provide the electrical insulation in the multi-structured ICs. The IC device surfaces are often protected by silicon oxide and silicon nitride layers. Therefore, these insulation layers also cover any inhomogeneity and defect located within the IC devices. It is necessary to have an examining method to detect those defects that are under the insulation layers without damaging the samples. However, the conventional scanning electron microscope (SEM) cannot be utilized to image and examine the surfaces that are positioned below the insulation layers.Novel nondestructive and contactless method has been developed in our laboratory to obtain the internal micrograph that crosses the surface of the semiconductor material and the integrated circuit.

Test and Diagnosis of Automotive Embedded Processors via High-Speed Standard Interfaces

2017 ◽  
Vol 26 (08) ◽  
pp. 1740006
Author(s):  
Christian Gleichner ◽  
Heinrich T. Vierhaus
Keyword(s):  
Integrated Circuits ◽  
Embedded System ◽  
System Reliability ◽  
High Speed ◽  
State Of The Art ◽  
Fault Analysis ◽  
Production Test ◽  
System Failure ◽  
Functional Tests ◽  
The Embedded System

In state-of-the-art automotive controllers, functional tests are used to check their integrity in the field. Features dedicated to production test of integrated circuits such as scan chains are not applied in the embedded system. However, such test structures enable a more effective and diagnostic test, which improves the fault analysis in case of a system failure and even increases system reliability. To achieve this, an access to the integrated test logic is required. This paper describes a concept of a test access to embedded systems via high-speed standard interfaces. The extended test logic as well as an appropriate test routine is presented.

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