Digital processing of images with defects due to double beam attenuation in indirect X-ray fluorescence mapping

2021 ◽  
Vol 9 (2C) ◽  
Author(s):  
Luisa Dutra Silva ◽  
Lucas Da Costa Souza ◽  
Davi Ferreira Oliveira ◽  
Marcelino José Anjos ◽  
Elicardo Alves de Souza Gonçalves
Keyword(s):  
Digital Processing ◽  
X Ray ◽  
Beam Attenuation ◽  
Double Beam

Matrix Effects in X-ray Fluorescence Holography: Samples of Arbitrary Thickness

2016 ◽  
Vol 230 (4) ◽  
Author(s):  
Dawid Tadeusz Dul ◽  
Paweł Korecki
Keyword(s):  
Computer Simulations ◽  
Local Structure ◽  
Matrix Effects ◽  
Quantitative Interpretation ◽  
Thin Sample ◽  
X Ray ◽  
Beam Attenuation ◽  
Arbitrary Thickness ◽  
Sample Approximation ◽  
Holographic Reconstruction

AbstractThe influence of matrix effects i.e. beam attenuation (BA) and indirect excitation (IE) on local structure imaging with multiple-energy x-ray fluorescence holography is studied using computer simulations. An analytic formalism is developed which allows for the description of BA and IE when the thickness of the sample is arbitrary. It is shown that beyond the thin-sample approximation, in specific cases, the measured holograms cannot be treated as entirely element sensitive. Consequently, it is demonstrated that due to the reduction of element sensitivity, spurious maxima can arise in the holographic reconstruction which can be misinterpreted as atomic images. The proposed formalism allows one to analyse BA and IE and to correct for them. It opens way for quantitative interpretation of x-ray fluorescence holograms.

Characterization of Ultrathin Multilayers for Applications in X-Ray Optics

1990 ◽  
Vol 48 (1) ◽  
pp. 20-21
Author(s):  
David J. Smith ◽  
Z.G. Li ◽  
S.-C.Y. Tsen ◽  
P. Boher ◽  
Ph. Houdy
Keyword(s):  
Electron Microscopy ◽  
Structural Information ◽  
Profile Analysis ◽  
Practical Importance ◽  
Rf Sputtering ◽  
Digital Processing ◽  
High Resolution Electron Microscopy ◽  
Interface Roughness ◽  
Ion Milling ◽  
X Ray

Ultrathin multilayers have unique physical properties which are of great practical importance. Our interest here is in layer systems suitable for X-ray optical devices, in particular for X-ray mirrors. Optimization of device performance depends upon such factors as the layer uniformity (thickness and composition), interface roughness, and structural irregularities. Techniques such as Rutherford backscattering, X-ray diffraction and Auger profile analysis provide valuable structural information but averaged over comparatively large specimen regions. High-resolution electron microscopy has been used in the present study to gain complementary insight into the local microstructure of various layer systems, based on combinations of Rh,W,C,B4C, grown by diode rf-sputtering. Samples suitable for electron microscopy were prepared in cross-section using standard grinding, dimpling and argon ion-milling techniques. Most observations were made with a JEM-4000EX HREM operated at 400kV, with selected area electron diffraction (SAED) to determine the average bilayer thickness by reference to the diffraction pattern of the Si (110) substrate. Optical diffractograms (ODMs) and digital processing were used for accurate measurement of the lattice spacings visible in the multilayers.

scholarly journals Synthesis and Characterization of Uniform Spherical Nanoporous TiO2Aerogel Templated by Cellulose Alcohol-Gel with Enhanced Photocatalytic Activity

2016 ◽  
Vol 2016 ◽  
pp. 1-8 ◽  
Author(s):  
Zhiming Liu ◽  
Peng Wu ◽  
Shaoli Yang ◽  
Haiying Wang ◽  
Chunde Jin
Keyword(s):  
Electron Microscopy ◽  
Photocatalytic Activity ◽  
Methyl Orange ◽  
Specific Surface ◽  
Surface Area ◽  
Specific Surface Area ◽  
Thermal Method ◽  
X Ray ◽  
Double Beam ◽  
Methyl Orange Dye

The spherical nanoporous TiO2aerogels were prepared by a simple ethanol-thermal method, using spherical cellulose alcohol-gel as the template. The morphology, crystalline structure, pore size, specific surface area, and the photocatalytic activity of obtained TiO2aerogel were separately characterized by scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), N2adsorption-desorption isotherms, and double beam UV-VIS spectrophotometer. The characteristics of TiO2aerogels presented uniform sphere shape, good internal structural morphology, high specific surface area (ranging from 111.88 to 149.95 m2/g), and good crystalline anatase phase. Moreover, methyl orange dye was used as the target pollutant to characterize the photocatalytic activities and the adsorption performance. The photocatalytic experiment shows that the obtained spherical TiO2aerogels had a higher degradation ratio of 92.9% on methyl orange dye compared with aspherical TiO2aerogels prepared from other concentrations of tetrabutyl orthotitanate (TBOT).

Broad beam attenuation measurements in lead in kilovoltage X-ray beams

2008 ◽  
Vol 18 (3) ◽  
pp. 197-202 ◽  
Author(s):  
Syed F. Akber ◽  
Indra J. Das ◽  
Than S. Kehwar
Keyword(s):  
X Ray ◽  
Broad Beam ◽  
Beam Attenuation

Broad Beam Attenuation of 70–250 Kv.p. X-Ray Beams in Aluminum

Radiology ◽  
1955 ◽  
Vol 64 (1) ◽  
pp. 114-114
Author(s):  
E. Dale Trout ◽  
John P. Kelley ◽  
Arthur C. Lucas ◽  
Edward J. Furno
Keyword(s):  
X Ray ◽  
Broad Beam ◽  
Beam Attenuation

New Methods for Digital Processing of Microfocus X-Ray Images

2019 ◽  
Vol 52 (6) ◽  
pp. 435-438 ◽  
Author(s):  
N. E. Staroverov ◽  
A. Yu. Gryaznov ◽  
N. N. Potrakhov ◽  
E. D. Kholopova ◽  
K. K. Guk
Keyword(s):  
Digital Processing ◽  
X Ray ◽  
New Methods

Optical Properties of Nano-CuInSi Thin Films Prepared by Multilayer Synthesized Method

2011 ◽  
Vol 403-408 ◽  
pp. 1094-1098
Author(s):  
Jian Sheng Xie ◽  
Ping Luan ◽  
Jin Hua Li
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Film Surface ◽  
X Ray Diffraction ◽  
Sem Images ◽  
X Ray ◽  
N2 Atmosphere ◽  
Double Beam ◽  
Absorption Studies ◽  
Different Temperatures

Thin Nano-CuInSi films have been prepared by multilayer synthesized method using magnetron sputtering technology, and followed by annealing in N2 atmosphere at different temperatures. The structures of CuInSi films were detected by X-ray diffraction(XRD); X-ray diffraction studies of the annealed films indicate the presence of CuInSi, the peak of main crystal phase is at 2θ=42.450°; the morphology of the film surface was studied by SEM. The SEM images show that the crystalline of the film prepared by multilayer synthesized method was granulated. The transmittance (T) spectra of the films were measured by Shimadzu UV-2450 double beam spectrophotometer. The calculated absorption coefficient is larger than 105 cm−1 when the wavelength is shorter than 750 nm. The band gap has been estimated from the optical absorption studies and found to be about 1.47 eV, but changes with purity of CuInSi. CuInSi thin film is a potential absorber layer material applied in solar cells and photoelectric automatic control.

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