Cation sublattice stacking faults in Cu-rich chalcopyrite CuInSe2
1996 ◽
Vol 11
(6)
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pp. 1398-1402
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Keyword(s):
Using transmission electron microscopy, we have found stacking faults on the cation sublattice in the chalcopyrite structure of CuInSe2. These films are grown by molecular beam epitaxy under Cu-rich conditions. These stacking faults are found to extend large distances in the plane of the film, and are not found to be present in samples not grown in Cu-rich conditions. We suggest that this defect is triggered by a Cu-induced transformation of the surface structure of the growing film.
2016 ◽
Vol 30
(20)
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pp. 1650269
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1999 ◽
Vol 38
(Part 1, No. 8)
◽
pp. 4673-4675
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1995 ◽
Vol 150
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pp. 388-393
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