Waveguide refractometry as a probe of thin film optical uniformity

1997 ◽  
Vol 12 (2) ◽  
pp. 546-551 ◽  
Author(s):  
B. G. Potter ◽  
D. Dimos ◽  
M. B. Sinclair
Keyword(s):  
Thin Film ◽  
Film Thickness ◽  
Layer Structure ◽  
Sol Gel ◽  
Film Surface ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Optical Characteristics ◽  
Thin Film Layer ◽  
The Impact

Optical inhomogeneities through the thickness of a sol-gel-derived, spin-coated Pb(Zr,Ti)O3 (PZT) thin film have been evaluated using prism-coupled waveguide refractometry. Unusual waveguide coupling angle behavior has been treated using a multilayer model to describe the optical characteristics of the film. Waveguide refractometry measurements, performed after incremental reductions in film thickness, were used to develop a consistent model for optical inhomogeneity through the film thickness. Specifically, a thin film layer model, consisting of alternating layers of high and low refractive index material, was found to accurately predict irregularities in transverse-electric (TE) mode coupling angles exhibited by the film. This layer structure has a spatial periodicity that is consistent with the positions of the upper film surface at intermediate firings during film synthesis. The correlation emphasizes the impact of the multistep thin-film deposition approach on the optical characteristics of the resulting thin film.

The Effects of Solvents to ZnO:Al Transparent Conductive Thin Films Synthesized by Sol-Gel Method

2011 ◽  
Vol 320 ◽  
pp. 124-129
Author(s):  
Yung Kuan Tseng ◽  
Shih Chun Chien ◽  
Ming Hung Chuang ◽  
Chi Sheng Hsu ◽  
Yen Cheng Chen
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Sol Gel ◽  
Film Surface ◽  
Precursor Solution ◽  
Thin Film Deposition ◽  
Xrd Analysis ◽  
Film Deposition ◽  
Gel Method ◽  
Sol Gel Method

The purpose of this study was to discuss the effects of different solvent systems for aluminum doped zinc oxide (AZO) thin film deposition by using the sol-gel method. In the conventional sol-gel method of producing AZO thin films, the solution selected as the precursor solvent was used ethylene glycol monomethylether (EGME), which in this study propylene glycol mono-methyl ether (PGME) was used. The precursor solution was observed by TGA/DSC to understand the variations while heating. The two prepared precursor solutions were then respectively spin coated onto substrates of boron silicate glass. XRD analysis indicated both showed significant c-axis preferred orientation. The surface morphology of the films was observed by FESEM, which showed that the thin film surface by PGME solvent was smoother and dense. A four-point probe was used to measure the electrical resistance of the thin films, which the measured results indicated that the thin film produced by PGME had lower resistivity than those produced by EGME. Resulting with a thin film electric resistance reaching as low as 3.474×10-3(W×cm). The visible light transparency was determined via UV-vis analysis. Results showed that the average transparency of thin films produced by the EGME solvent reached 95% and above, where the average transparency from PGME solvent still reached 90% and above. Experimental results demonstrated that PGME is a good option to synthesize AZO thin films.

Numerical simulation of the liquid phase in SnO2 thin film deposition by sol-gel-dip-coating

2010 ◽  
Vol 55 (3) ◽  
pp. 385-393 ◽  
Author(s):  
Dayene M. Carvalho ◽  
Jorge L. B. Maciel ◽  
Leandro P. Ravaro ◽  
Rogério E. Garcia ◽  
Valdemir G. Ferreira ◽  
...  
Keyword(s):  
Thin Film ◽  
Numerical Simulation ◽  
Liquid Phase ◽  
Sol Gel ◽  
Thin Film Deposition ◽  
Dip Coating ◽  
Film Deposition ◽  
Sno2 Thin Film

Pulsed Laser Deposition History and Laser-Target Interactions

MRS Bulletin ◽  
1992 ◽  
Vol 17 (2) ◽  
pp. 30-36 ◽  
Author(s):  
Jeff Cheung ◽  
Jim Horwitz
Keyword(s):  
Thin Film ◽  
Laser Beam ◽  
Pulsed Laser Deposition ◽  
Mechanical Energy ◽  
Pulsed Laser ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Laser Deposition ◽  
Small Branch ◽  
The Impact

The laser, as a source of “pure” energy in the form of monochromatic and coherent photons, is enjoying ever increasing popularity in diverse and broad applications from drilling micron-sized holes on semiconductor devices to guidance systems used in drilling a mammoth tunnel under the English Channel. In many areas such as metallurgy, medical technology, and the electronics industry, it has become an irreplaceable tool.Like many other discoveries, the various applications of the laser were not initially defined but were consequences of natural evolution led by theoretical studies. Shortly after the demonstration of the first laser, the most intensely studied theoretical topics dealt with laser beam-solid interactions. Experiments were undertaken to verify different theoretical models for this process. Later, these experiments became the pillars of many applications. Figure 1 illustrates the history of laser development from its initial discovery to practical applications. In this tree of evolution, Pulsed Laser Deposition (PLD) is only a small branch. It remained relatively obscure for a long time. Only in the last few years has his branch started to blossom and bear fruits in thin film deposition.Conceptually and experimentally, PLD is extremely simple, probably the simplest among all thin film growth techniques. Figure 2 shows a schematic diagram of this technique. It uses pulsed laser radiation to vaporize materials and to deposit thin films in a vacuum chamber. However, the beam-solid interaction that leads to evaporation/ablation is a very complex physical phenomenon. The theoretical description of the mechanism is multidisciplinary and combines equilibrium and nonequilibrium processes. The impact of a laser beam on the surface of a solid material, electromagnetic energy is converted first into electronic excitation and then into thermal, chemical, and even mechanical energy to cause evaporation, ablation, excitation, and plasma formation.

Sol–gel thin film deposition and characterization of a new optically active compound: Er2Ti2O7

2001 ◽  
Vol 16 (4) ◽  
pp. 463-473 ◽  
Author(s):  
M. Langlet ◽  
C. Coutier ◽  
J. Fick ◽  
M. Audier ◽  
W. Meffre ◽  
...  
Keyword(s):  
Thin Film ◽  
Active Compound ◽  
Sol Gel ◽  
Thin Film Deposition ◽  
Optically Active ◽  
Film Deposition

scholarly journals Sol-gel based TiO2 thin film deposition on frustules towards facile and scalable manufacturing

2016 ◽  
Vol 773 ◽  
pp. 012112 ◽  
Author(s):  
A Li ◽  
J Wang ◽  
W Zhang ◽  
R McNaughton ◽  
S Anderson ◽  
...  
Keyword(s):  
Thin Film ◽  
Tio2 Thin Film ◽  
Sol Gel ◽  
Thin Film Deposition ◽  
Film Deposition

CaBi4Ti4O15 thin film deposition on electroplated Platinum substrates using a sol-gel method

2008 ◽  
Vol 1113 ◽  
Author(s):  
Takeyasu Saito ◽  
Yuichiro Hirota ◽  
Mariko Ooyanagi ◽  
Naoki Okamoto ◽  
Kazuo Kondo ◽  
...  
Keyword(s):  
Thin Film ◽  
Surface Roughness ◽  
Crystallization Temperature ◽  
Sol Gel ◽  
Void Formation ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Orientation Control ◽  
Gel Method ◽  
Sol Gel Method

ABSTRACTCaBi4Ti4O15 growth on different Platinum substrates was carried out through a sol-gel method. Higher crystallization temperature and 20% excess Bi decreased pyrochlore contents in the CaBi4Ti4O15 films. Repetition through coating, calcination and crystallization decreased void formation on the surface. C-axis oriented thin film could be grown on sputtered platinum substrates with low Pt (200) orientation. On electroplated Pt substrates, (119) oriented CaBi4Ti4O15 thin film was grown, suggesting surface roughness of Pt substrates is a crucial factor for orientation control of sol-gel derived CaBi4Ti4O15 thin film.

Sign in / Sign up

Export Citation Format

Share Document