Atomic force microscopy cantilever simulation by finite element methods for quantitative atomic force acoustic microscopy measurements

Measurements of vibrational spectra of atomic force microscopy (AFM) microprobes in contact with a sample allow a good correlation between resonance frequencies shifts and the effective elastic modulus of the tip-sample system. In this work we use finite element methods for modeling the AFM microprobe vibration considering actual features of the cantilever geometry. This allowed us to predict the behavior of the cantilevers in contact with any sample for a wide range of effective tip-sample stiffness. Experimental spectra for glass and chromium were well reproduced for the numerical model, and stiffness values were obtained. We present a method to correlate the experimental resonance spectrum to the effective stiffness using realistic geometry of the cantilever to numerically model the vibration of the cantilever in contact with a sample surface. Thus, supported in a reliable finite element method (FEM) model, atomic force acoustic microscopy can be a quantitative technique for elastic-modulus measurements. Considering the possibility of tip-apex wear during atomic force acoustic microscopy measurements, it is necessary to perform a calibration procedure to obtain the tip-sample contact areas before and after each measurement.

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Elastic modulus of biopolymer matrix in nacre measured using coupled atomic force microscopy bending and inverse finite element techniques

Materials Science and Engineering C ◽

10.1016/j.msec.2011.08.023 ◽

2011 ◽

Vol 31 (8) ◽

pp. 1852-1856 ◽

Cited By ~ 40

Author(s):

Zhi-Hui Xu ◽

Yingchao Yang ◽

Zaiwang Huang ◽

Xiaodong Li

Keyword(s):

Atomic Force Microscopy ◽

Finite Element ◽

Elastic Modulus ◽

Force Microscopy ◽

Atomic Force

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Application of Electrochemical Atomic Force Microscopy (EC-AFM) in the Corrosion Study of Metallic Materials

Materials ◽

10.3390/ma13030668 ◽

2020 ◽

Vol 13 (3) ◽

pp. 668 ◽

Cited By ~ 3

Author(s):

Hanbing Chen ◽

Zhenbo Qin ◽

Meifeng He ◽

Yichun Liu ◽

Zhong Wu

Keyword(s):

Atomic Force Microscopy ◽

Early Stage ◽

Sample Surface ◽

Electrolytic Cell ◽

Research Progress ◽

Force Microscopy ◽

Research Areas ◽

Atomic Force ◽

Wide Range ◽

Corrosion Science

Electrochemical atomic force microscopy (EC-AFM), a branch of a scanning probe microscopy (SPM), can image substrate topography with high resolution. Since its inception, it was extended to a wide range of research areas through continuous improvement. The presence of an electrolytic cell and a potentiostat makes it possible to observe the topographical changes of the sample surface in real time. EC-AFM is used in in situ corrosion research because the samples are not required to be electrically conductive. It is widely used in passive film properties, surface dissolution, early-stage corrosion initiation, inhibitor efficiency, and many other branches of corrosion science. This review provides the research progress of EC-AFM and summarizes the extensive applications and investigations using EC-AFM in corrosion science.

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Stochastic excitation for high-resolution Atomic Force Acoustic Microscopy imaging: a system theory approach.

10.3762/bxiv.2019.159.v1 ◽

2019 ◽

Author(s):

Edgar Cruz-Valeriano ◽

J J Gervacio Arciniega ◽

M A Hernández Landaverde ◽

Christian I Enriquez-Flores ◽

Yuri Chipatecua ◽

...

Keyword(s):

Atomic Force Microscopy ◽

High Resolution ◽

White Noise ◽

Acoustic Microscopy ◽

Indentation Modulus ◽

Microscopy Imaging ◽

Force Microscopy ◽

White Noise Excitation ◽

Atomic Force ◽

Resonance Frequencies

In this work, a high-resolution Atomic Force Acoustic Microscopy imaging technique is shown in order to obtain the local indentation modulus at nanoscale using a model which gives a quantitative relationship between a set of contact resonance frequencies and indentation modulus through a white-noise excitation. This technique is based on white-noise excitation for system identification due to non-linearities in the tip-sample interaction. During a conventional scanning, a Fast Fourier Transform is applied to the deflection signal which comes from the photo-diodes of the Atomic Force Microscopy (AFM) for each pixel, while the tip-sample interaction is excited by a white-noise signal. This approach allows the measurement of several vibrational modes in a single step with high frequency resolution, less computational data and at a faster speed than other similar techniques. This technique is referred to as Stochastic Atomic Force Acoustic Microscopy (S-AFAM), where the frequency shifts with respect to free resonance frequencies for an AFM cantilever can be used to determine the mechanical properties of a material. S-AFAM is implemented and compared to a conventional technique (Resonance Tracking-Atomic Force Microscopy, RT-AFAM), where a graphite film over a glass substrate sample is analyzed. S-AFAM can be implemented in any AFM system due to its reduced instrumentation compared to conventional techniques.

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The influence of carbon-encapsulated iron nanoparticles on elastic modulus of living human mesenchymal stem cells examined by atomic force microscopy

Micron ◽

10.1016/j.micron.2018.02.006 ◽

2018 ◽

Vol 108 ◽

pp. 41-48 ◽

Cited By ~ 15

Author(s):

Ida Dulinska-Molak ◽

Adrian Chlanda ◽

Jasmine Li ◽

Xinlong Wang ◽

Michal Bystrzejewski ◽

...

Keyword(s):

Stem Cells ◽

Atomic Force Microscopy ◽

Mesenchymal Stem Cells ◽

Elastic Modulus ◽

Iron Nanoparticles ◽

Human Mesenchymal Stem Cells ◽

Force Microscopy ◽

Atomic Force

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Elastic Modulus of Single Cellulose Microfibrils from Tunicate Measured by Atomic Force Microscopy

Biomacromolecules ◽

10.1021/bm900520n ◽

2009 ◽

Vol 10 (9) ◽

pp. 2571-2576 ◽

Cited By ~ 450

Author(s):

Shinichiro Iwamoto ◽

Weihua Kai ◽

Akira Isogai ◽

Tadahisa Iwata

Keyword(s):

Atomic Force Microscopy ◽

Elastic Modulus ◽

Cellulose Microfibrils ◽

Force Microscopy ◽

Atomic Force

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Characterization and Measurement of Elastic Modulus Based on Ultrasonic Atomic Force Microscopy for Nano-porous Silicon Oxide Film

Journal of Mechanical Engineering ◽

10.3901/jme.2018.12.109 ◽

2018 ◽

Vol 54 (12) ◽

pp. 109 ◽

Cited By ~ 1

Author(s):

Gaimei ZHANG

Keyword(s):

Atomic Force Microscopy ◽

Elastic Modulus ◽

Porous Silicon ◽

Oxide Film ◽

Silicon Oxide ◽

Silicon Oxide Film ◽

Force Microscopy ◽

Atomic Force

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Quantitative mechanical analysis of indentations on layered, soft elastic materials

Soft Matter ◽

10.1039/c8sm02121j ◽

2019 ◽

Vol 15 (8) ◽

pp. 1776-1784 ◽

Cited By ~ 7

Author(s):

Bryant L. Doss ◽

Kiarash Rahmani Eliato ◽

Keng-hui Lin ◽

Robert Ros

Keyword(s):

Atomic Force Microscopy ◽

Elastic Modulus ◽

Cell Mechanics ◽

Biological Samples ◽

Mechanical Analysis ◽

Elastic Materials ◽

Mechanical Heterogeneity ◽

Popular Method ◽

Force Microscopy ◽

Atomic Force

Atomic force microscopy (AFM) is becoming an increasingly popular method for studying cell mechanics, however the existing analysis tools for determining the elastic modulus from indentation experiments are unable to quantitatively account for mechanical heterogeneity commonly found in biological samples.

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Phase Contrast Imaging in Atomic Force Microscopy

Microscopy and Microanalysis ◽

10.1017/s143192760001326x ◽

1997 ◽

Vol 3 (S2) ◽

pp. 1275-1276

Author(s):

Sergei Magonov

Keyword(s):

Atomic Force Microscopy ◽

Phase Contrast ◽

Phase Changes ◽

Phase Imaging ◽

Phase Detection ◽

Contrast Imaging ◽

Force Microscopy ◽

Atomic Force ◽

Resonance Frequencies ◽

Soft Samples

Phase detection in TappingMode™ enhances capabilities of Atomic Force Microscopy (AFM) for soft samples (polymers and biological materials). Changes of amplitude and phase changes of a fast oscillating probe are caused by tip-sample force interactions. Height images reflect the amplitude changes, and in most cases they present a sample topography. Phase images show local differences between phases of free-oscillating probe and of probe interacting with a sample surface. These differences are related to the change of the resonance frequency of the probe either by attractive or repulsive tip-sample forces. Therefore phase detection helps to choose attractive or repulsive force regime for surface imaging and to minimize tip-sample force. For heterogeneous materials the phase imaging allows to distinguish individual components and to visualize their distribution due to differences in phase contrast. This is typically achieved in moderate tapping, when set-point amplitude, Asp, is about half of the amplitude of free-oscillating cantilever, Ao. In contrast, light tapping with Asp close to Ao is best suited for recording a true topography of the topmost surface layer of soft samples. Examples of phase imaging of polymers obtained with a scanning probe microscope Nanoscope® IIIa (Digital Instruments). Si probes (225 μk long, resonance frequencies 150-200 kHz) were used.

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