An X-Ray Study of Domain Structure and Stress in Pd2Si Films at Pd-Si Interfaces

1981 ◽  
Vol 10 ◽  
Author(s):  
Haydn Chen ◽  
G. E. White ◽  
S. R. Stock ◽  
P. S. Ho

The domain structures of palladium and Pd2Si as well as their crystallographic relationship to the silicon substrates were determined on Si(111) and Si(100) samples by mapping X-ray diffraction pole figures. X-ray diffraction topography and rocking curve measurements were carried out for the silicon substrates in order to detect the presence of elastic and/or plastic deformation in the substrates caused by silicide formation. The stresses in the silicide films were determined from the bending of the silicon substrates using X-ray diffraction techniques.

1997 ◽  
Vol 12 (5) ◽  
pp. 1297-1305 ◽  
Author(s):  
C. D. Theis ◽  
D. G. Schlom

Epitaxial PbTiO3 films have been grown on vicinal (001) SrTiO3 substrates by pulsed laser deposition. Vicinal SrTiO3 substrates with misorientations up to 9° from (001) were used, and the influence of the direction of misorientation on the resulting domain structure was studied. 4-circle x-ray diffraction analysis indicates that thin (40 nm) PbTiO3 films are completely c-axis oriented [rocking curve full-width-at-half-maximum (FWHM) of 0.25° for the 002 reflection] and that thicker films (∼ 200 nm) contain mixed a-axis and c-axis PbTiO3 domains due to twinning along {011} planes. The [100] axis of the a-axis domains is misoriented by 2.1° to 3.3° toward 〈100〉 substrate directions with respect to the substrate normal. In contrast to growth on well-oriented (001) SrTiO3 surfaces where the four equivalent tilts of the [100] axis of the a-axis domains are equally likely, on vicinal SrTiO3 the a-axis domains are preferentially oriented in an uphill direction with respect to the crystallographic miscut.


Author(s):  
W. Z. Chang ◽  
D. B. Wittry

Since Du Mond and Kirkpatrick first discussed the principle of a bent crystal spectrograph in 1930, curved single crystals have been widely utilized as spectrometric monochromators as well as diffractors for focusing x rays diverging from a point. Curved crystal diffraction theory predicts that the diffraction parameters - the rocking curve width w, and the peak reflection coefficient r of curved crystals will certainly deviate from those of their flat form. Due to a lack of curved crystal parameter data in current literature and the need for optimizing the choice of diffraction geometry and crystal materials for various applications, we have continued the investigation of our technique presented at the last conference. In the present abstract, we describe a more rigorous and quantitative procedure for measuring the parameters of curved crystals.The diffraction image of a singly bent crystal under study can be obtained by using the Johann geometry with an x-ray point source.


Author(s):  
A. R. Lang

AbstractX-ray topography provides a non-destructive method of mapping point-by-point variations in orientation and reflecting power within crystals. The discovery, made by several workers independently, that in nearly perfect crystals it was possible to detect individual dislocations by X-ray diffraction contrast started an epoch of rapid exploitation of X-ray topography as a new, general method for assessing crystal perfection. Another discovery, that of X-ray Pendellösung, led to important theoretical developments in X-ray diffraction theory and to a new and precise method for measuring structure factors on an absolute scale. Other highlights picked out for mention are studies of Frank-Read dislocation sources, the discovery of long dislocation helices and lines of coaxial dislocation loops in aluminium, of internal magnetic domain structures in Fe-3 wt.% Si, and of stacking faults in silicon and natural diamonds.


Coatings ◽  
2021 ◽  
Vol 11 (8) ◽  
pp. 937
Author(s):  
Yingying Hu ◽  
Md Rasadujjaman ◽  
Yanrong Wang ◽  
Jing Zhang ◽  
Jiang Yan ◽  
...  

By reactive DC magnetron sputtering from a pure Ta target onto silicon substrates, Ta(N) films were prepared with different N2 flow rates of 0, 12, 17, 25, 38, and 58 sccm. The effects of N2 flow rate on the electrical properties, crystal structure, elemental composition, and optical properties of Ta(N) were studied. These properties were characterized by the four-probe method, X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and spectroscopic ellipsometry (SE). Results show that the deposition rate decreases with an increase of N2 flows. Furthermore, as resistivity increases, the crystal size decreases, the crystal structure transitions from β-Ta to TaN(111), and finally becomes the N-rich phase Ta3N5(130, 040). Studying the optical properties, it is found that there are differences in the refractive index (n) and extinction coefficient (k) of Ta(N) with different thicknesses and different N2 flow rates, depending on the crystal size and crystal phase structure.


1997 ◽  
Vol 493 ◽  
Author(s):  
S. P. Alpay ◽  
A. S. Prakash ◽  
S. Aggarwal ◽  
R. Ramesh ◽  
A. L. Roytburd ◽  
...  

ABSTRACTA PbTiO3(001) film grown on MgO(001) by pulsed laser deposition is examined as an example to demonstrate the applications of the domain stability map for epitaxial perovskite films which shows regions of stable domains and fractions of domains in a polydomain structure. X-ray diffraction studies indicate that the film has a …c/a/c/a… domain structure in a temperature range of °C to 400°C with the fraction of c-domains decreasing with increasing temperature. These experimental results are in excellent agreement with theoretical predictions based on the stability map.


2016 ◽  
Vol 685 ◽  
pp. 525-529
Author(s):  
Zhanna G. Kovalevskaya ◽  
Margarita A. Khimich ◽  
Andrey V. Belyakov ◽  
Ivan A. Shulepov

The changes of the phase composition, structure and physicomechanical properties of Ti‑40 mas % Nb after severe plastic deformation are investigated in this paper. By the methods of microstructural, X-ray diffraction analysis and scanning electron microscopy it is determined that phase and structural transformations occur simultaneously in the alloy after severe plastic deformation. The martensitic structure formed after tempering disappears. The inverse α'' → β transformation occurs. The structure consisting of oriented refined grains is formed. The alloy is hardened due to the cold working. The Young modulus is equal to 79 GPa and it is less than that of initial alloy and close to the value obtained after tempering. It is possible that Young modulus is reduced by additional annealing.


1987 ◽  
Vol 94 ◽  
Author(s):  
Kenji Maruyama ◽  
Mitsuo Yoshikawa ◽  
Hiroshi Takigawa

ABSTRACTAntiphase domain (APD) structures have been discovered in CdTe layers grown on (0001) sapphire substrates by MOCVD. To explain APD formation, an obstruction model based on a surface-reaction mechanism has been proposed. The proportion of one-phase domains to the total area varies with the [DETe]/[DMCd] ratio (VI/II ratio). A single-domain CdTe layer can be obtained at a VI/II ratio of 5. The APD structure shows a strong correlation with the crystallinity measured by X-ray. For a single-domain CdTe epilayer, theFWHM of the X-ray rocking curve shows 114 arc seconds and the EPD is 6×10 cm−2


2005 ◽  
Vol 495-497 ◽  
pp. 719-724
Author(s):  
R.E. Bolmaro ◽  
B. Molinas ◽  
E. Sentimenti ◽  
A.L. Fourty

Some ancient metallic art craft, utensils, silverware and weapons are externally undistinguishable from modern ones. Not only the general aspect and shape but also some uses have not changed through the ages. Moreover, when just some small pieces can be recovered from archaeological sites, the samples can not easily be ascribed to any known use and consequently identified. It is clear that mechanical processing has changed along history but frequently only a "microscopic" inspection can distinguish among different techniques. Some bronze samples have been collected from the Quarto d’Altino (Veneto) archaeological area in Italy (paleovenetian culture) and some model samples have been prepared by a modern artisan. The sample textures have been measured by X-ray Diffraction techniques. (111), (200) and (220) pole figures were used to calculate Orientation Distribution Functions and further recalculate pole figures and inverse pole figures. The results were compared with modern forging technology results. Textures are able to discern between hammering ancient techniques for sheet production and modern industrial rolling procedures. However, as it is demonstrated in the present work, forgery becomes difficult to detect if the goldsmith, properly warned, proceeds to erase the texture history with some hammering post-processing. The results of this contribution can offer to the archaeologists the opportunity to take into consideration the texture techniques in order to discuss the origin (culture) of the pieces and the characteristic mechanical process developed by the ancient artisan. Texture can also help the experts when discussing the originality of a certain piece keeping however in mind the cautions indicated in this publication.


2006 ◽  
Vol 114 ◽  
pp. 337-344 ◽  
Author(s):  
Bogusława Adamczyk-Cieślak ◽  
Jaroslaw Mizera ◽  
Krzysztof Jan Kurzydlowski

The texture of Al – 0.7 wt. % Li alloy processed by two different methods of severe plastic deformation (SPD) has been investigated by X-ray diffraction, and analyzed in terms of the orientation distribution function (ODF). It was found that severe plastic deformation by both Equal Channel Angular extrusion (ECAE) and Hydrostatic Extrusion (HE) resulted in an ultrafine grained structure in an Al – 0.7 wt. % Li alloy. The microstructure, grain shape and size, of materials produced by SPD strongly depend on the technological parameters and methods applied. The texture of the investigated alloy differed because of the different modes of deformation. In the initial state the alloy exhibited a very strong texture consisting of {111} fibre component. A similar fibrous texture characteristic was also found after HE whereas after the ECAE the initial texture was completely changed.


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