Real-Time Analysis Of In-Situ Spectroscopic Ellipsometric Data During Mbe Growth Of III-V Semiconductors

1991 ◽  
Vol 222 ◽  
Author(s):  
B. Johs ◽  
J. L. Edwards ◽  
K. T. Shiralagi ◽  
R. Droopad ◽  
K. Y. Choi ◽  
...  
Keyword(s):  
Real Time ◽  
Optical Constants ◽  
Growth Parameters ◽  
Ex Situ ◽  
Time Analysis ◽  
Mbe Growth ◽  
In Situ Data ◽  
Real Time Analysis

ABSTRACTA modular spectroscopic ellipsometer, capable of both in-situ and ex-situ operation, has been used to measure important growth parameters of GaAs/AIGaAs structures. The ex-situ measurements provided layer thicknesses and compositions of the grown structures. In-situ ellipsometric measurements allowed the determination of growth rates, layer thicknesses, and high temperature optical constants. By performing a regression analysis of the in-situ data in real-time, the thickness and composition of an AIGaAs layer were extracted during the MBE growth of the structure.

In situ real-time analysis of the MBE growth of CdTe on Ge: A comparison of ellipsometry data analysis techniques

2006 ◽  
Vol 296 (2) ◽  
pp. 129-134 ◽  
Author(s):  
G. Badano ◽  
P. Ballet ◽  
X. Baudry ◽  
J.P. Zanatta ◽  
A. Million
Keyword(s):  
Data Analysis ◽  
Real Time ◽  
Time Analysis ◽  
Mbe Growth ◽  
Analysis Techniques ◽  
Real Time Analysis ◽  
Ellipsometry Data

scholarly journals In-Situ and Real-Time Analysis of the Formation of Strains and Microstructure Defects during Solidification of Al-3.5 Wt Pct Ni Alloys

2008 ◽  
Vol 39 (4) ◽  
pp. 865-874 ◽  
Author(s):  
G. Reinhart ◽  
A. Buffet ◽  
H. Nguyen-Thi ◽  
B. Billia ◽  
H. Jung ◽  
...  
Keyword(s):  
Real Time ◽  
Time Analysis ◽  
Ni Alloys ◽  
Real Time Analysis

In situ and real-time analysis of TGZM phenomena by synchrotron X-ray radiography

2008 ◽  
Vol 310 (11) ◽  
pp. 2906-2914 ◽  
Author(s):  
H. Nguyen Thi ◽  
G. Reinhart ◽  
A. Buffet ◽  
T. Schenk ◽  
N. Mangelinck-Noël ◽  
...  
Keyword(s):  
Real Time ◽  
Time Analysis ◽  
X Ray ◽  
Real Time Analysis

scholarly journals DETERMINATION OF OPTIMAL EXERCISE INTENSITY BASED ON REAL-TIME ANALYSIS OF HEART RATE VARIABILITY DURING EXERCISE

2003 ◽  
Vol 52 (3) ◽  
pp. 295-303 ◽  
Author(s):  
YOSHITAKE OSHIMA ◽  
TOSHIKAZU SHIGA ◽  
TOSHIO MORITANI ◽  
IZURU MASUDA ◽  
TATSUYA HAYASHI ◽  
...  
Keyword(s):  
Heart Rate ◽  
Heart Rate Variability ◽  
Real Time ◽  
Exercise Intensity ◽  
Time Analysis ◽  
Real Time Analysis

Atmospheric Probe for Real Time Weather Monitoring

2017 ◽  
Vol 2017 (1) ◽  
pp. 000280-000285
Author(s):  
J. Craig Prather ◽  
Michael Bolt ◽  
Haley Harrell ◽  
Tyler Horton ◽  
John Manobianco ◽  
...  
Keyword(s):  
Additive Manufacturing ◽  
Relative Humidity ◽  
Real Time ◽  
Base Station ◽  
Gps Receiver ◽  
Time Analysis ◽  
Atmospheric Measurements ◽  
Real Time Analysis ◽  
Manufacturing Techniques

Abstract This work outlines the development and testing of novel in-situ atmospheric sensors. The system is designed for deployment of the sensors en masse to increase the geospatial density of atmospheric measurements. This sensor system is being designed to replace the costly, larger atmospheric sensors currently in use. Improvement in sensor technologies, substrates, and additive manufacturing techniques have allowed for such a device to be realizable. The devices contain a sensor suite that gathers temperature, relative humidity, and pressure from microsensors as well as position, velocity, and heading from a compact GPS receiver. This data is then sent to a base station for analysis by atmospheric scientists, with the potential for real time analysis.

Pulsed ion beam surface analysis as a means of in situ real‐time analysis of thin films during growth

1994 ◽  
Vol 12 (4) ◽  
pp. 1943-1951 ◽  
Author(s):  
A. R. Krauss ◽  
Y. Lin ◽  
O. Auciello ◽  
G. J. Lamich ◽  
D. M. Gruen ◽  
...  
Keyword(s):  
Thin Films ◽  
Real Time ◽  
Surface Analysis ◽  
Ion Beam ◽  
Time Analysis ◽  
Real Time Analysis ◽  
Beam Surface

In Situ Spectroscopic Ellipsometry for Real Time Semiconductor Growth Monitor

1990 ◽  
Vol 216 ◽  
Author(s):  
Blaine Johs ◽  
Duane Meyer ◽  
Gerald Cooney ◽  
Huade Yao ◽  
Paul G. Snyder ◽  
...  
Keyword(s):  
Real Time ◽  
Spectroscopic Ellipsometry ◽  
Ex Situ ◽  
Mbe Growth ◽  
Materials Analysis ◽  
Spectroscopic Ellipsometer

ABSTRACTA modular spectroscopic ellipsometer for in situ and ex situ materials analysis is described, and results for in situ MBE growth of GaAs/AlGaAs are reported.

In-situ real-time analysis on strain relaxation process in GaN growth on sapphire by RF-MBE

2002 ◽  
Vol 237-239 ◽  
pp. 998-1002 ◽  
Author(s):  
K. Xu ◽  
N. Yano ◽  
A.W. Jia ◽  
A. Yoshikawa ◽  
K. Takahashi
Keyword(s):  
Relaxation Process ◽  
Real Time ◽  
Strain Relaxation ◽  
Time Analysis ◽  
Real Time Analysis

scholarly journals Real-time Analysis of a Working Triethylaluminium-Modified Cr/Ti/SiO2Ethylene Polymerization Catalyst with In Situ Infrared Spectroscopy

ChemCatChem ◽  
2016 ◽  
Vol 8 (11) ◽  
pp. 1937-1944 ◽  
Author(s):  
Dimitrije Cicmil ◽  
Jurjen Meeuwissen ◽  
Aurélien Vantomme ◽  
Bert M. Weckhuysen
Keyword(s):  
Infrared Spectroscopy ◽  
Real Time ◽  
Time Analysis ◽  
Real Time Analysis ◽  
Polymerization Catalyst ◽  
In Situ Infrared Spectroscopy
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