Studies of Crystalunity for Sputter Deposited Bi-Based Oxide Films
Keyword(s):
X Ray
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ABSTRACTCrystalline quality of Bi-based oxide films has been evaluated by means of X-ray diffraction (XRD) and ion-channeling on the Rutherford backscattering (RBS). The films were sputter deposited 2201-phase Bi2Sr2Cu1O8-δ (BSCO) and 2212-phase Bi2Sr2Ca1Cu2O8-δ (BSCCO). They were prepared on MgO(100) and SrTiO3(100) substrates at the low temperature of 650°C during the deposition. The best quality, however thin films had poor crystallinity compared to single crystals, was obtained with the 2201-phase BSCO film that was deposited on a SrTiO3(100) substrate. The full width at half maximum (FWHM) value of the rocking curve on XRD for the film was estimated as 1560 (arc sec).
1997 ◽
Vol 12
(5)
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pp. 1297-1305
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1996 ◽
Vol 54
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pp. 1020-1021
2010 ◽
Vol 123-125
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pp. 375-378
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1991 ◽
Vol 184
(1-3)
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pp. 119-126
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