Strain in Epitaxial BaTiO3 Thin Films Prepared by MOCVD

1998 ◽  
Vol 541 ◽  
Author(s):  
S. Chattopadhyay ◽  
A. Teren ◽  
B.W. Wessels
Keyword(s):  
Thin Films ◽  
Film Thickness ◽  
Full Width Half Maximum ◽  
Diffraction Peak ◽  
Full Width ◽  
Half Maximum ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Broadening ◽  
Diffraction Peaks

AbstractThe microstrain in epitaxial BaTiO3 thin films has been investigated using x-ray diffraction. The full width half maximum of the (001) diffraction peaks ranged from 0.12 to 0.49 deg. From the analysis of the angular dependence of the diffraction peak broadening, it is concluded that the broadening is due predominantly to strain. The magnitude of the microstrain decreases sharply with increasing film thickness.

Microbeam X-ray diffraction from twisted lamellar crystals: theory and computer simulation

2009 ◽  
Vol 42 (4) ◽  
pp. 673-680 ◽  
Author(s):  
Valeriy A. Luchnikov ◽  
Dimitri A. Ivanov
Keyword(s):  
Basal Plane ◽  
Peak Position ◽  
Diffraction Peak ◽  
Reciprocal Space ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Broadening ◽  
Asymmetric Shape ◽  
Diffraction Peaks ◽  
Lamellar Crystals

The diffraction peak position, width and intensity distribution are calculated for the case of a helicoidally twisted crystalline lamella, both analytically and numerically. It is shown that the diffraction peak broadening depends on the orientation of the corresponding reciprocal-space vector with respect to the helicoid axis and the normal to the lamellar basal plane. The equatorial peaks, which are close to the normal direction to the lamellar basal plane, are characterized by the highest azimuthal width. By contrast, the reflections positioned close to the lamellar surface have the smallest azimuthal width. For non-equatorial peaks in the proximity of the twisting axis the intensity has an unusual asymmetric shape. The shape of the microbeam, as well as its position and direction with respect to the lamella, influences the shape of the diffraction peaks in reciprocal space and their appearance in two-dimensional diffractograms. The proposed approach can be useful, for example, for the interpretation of microbeam diffractograms of banded polymer spherulites.

Effect of Annealing on Electrical Degradation Characteristics of ZnO Varistors

2008 ◽  
Vol 388 ◽  
pp. 7-10 ◽  
Author(s):  
Masayuki Takada ◽  
Shinzo Yoshikado
Keyword(s):  
Grain Boundaries ◽  
Diffraction Peak ◽  
Full Width ◽  
Half Maximum ◽  
X Ray Diffraction ◽  
X Ray ◽  
Annealing Conditions ◽  
Electrical Degradation ◽  
Zno Varistors ◽  
Triple Points

The effects of the thermally annealing of Bi-Mn-Co-Sb2O3-added ZnO varistors on their electrical degradation were investigated. For the samples with 0.01mol% Sb2O3added and without Sb2O3, no marked difference in the non linearity index of the voltage-current (V-I) characteristics was observed upon electrical degradation for the annealed and nonannealed samples. Upon increasing the amount of Sb2O3 added, the values of  increased after electrical degradation for the annealed samples. Moreover, the value of  after electrical degradation was proportional to the full width at half maximum (FWHM) of the X-ray diffraction peak for Zn2.33Sb0.67O4-type spinel particles under various annealing conditions. The added Sb2O3 did not dissolve in the ZnO grains but became segregated at grain boundaries. Therefore, it is speculated that the increase in the FWHM for the spinel particles is due to the increase in the numbers of fine spinel particles at grain boundaries and triple points.

scholarly journals Stress Gradients and Anisotropy in Thin Films

1988 ◽  
Vol 130 ◽  
Author(s):  
Robert M. Fisher ◽  
J. Z. Duan ◽  
Alan G. Fox
Keyword(s):  
Thin Films ◽  
Film Surface ◽  
Diffraction Peak ◽  
X Ray Diffraction ◽  
Thickness Strain ◽  
Strain Gradients ◽  
X Ray ◽  
Stress Gradients ◽  
Diffraction Peaks ◽  
Chromium Films

AbstractIndications that steep through-thickness strain gradients occur in vapour-deposited chromium films stemming from previous observations of film curling during spontaneous delamination from substrates, have been substantiated by analysis and simulation of Bragg X-Ray diffraction peaks. The presence of large through-thickness compressive strains, that increase quadratically with distance from the substrate from about zero at the interface to around 0.8% at the film surface, was deduced by empirical computer matching of diffraction peak shapes.

Studies of Crystalunity for Sputter Deposited Bi-Based Oxide Films

1992 ◽  
Vol 275 ◽  
Author(s):  
Koichi Mizuno ◽  
Yo Ichikawa ◽  
Kentaro Setsune
Keyword(s):  
Thin Films ◽  
Oxide Films ◽  
Full Width ◽  
Half Maximum ◽  
X Ray Diffraction ◽  
Rocking Curve ◽  
X Ray ◽  
Ion Channeling ◽  
Sputter Deposited

ABSTRACTCrystalline quality of Bi-based oxide films has been evaluated by means of X-ray diffraction (XRD) and ion-channeling on the Rutherford backscattering (RBS). The films were sputter deposited 2201-phase Bi2Sr2Cu1O8-δ (BSCO) and 2212-phase Bi2Sr2Ca1Cu2O8-δ (BSCCO). They were prepared on MgO(100) and SrTiO3(100) substrates at the low temperature of 650°C during the deposition. The best quality, however thin films had poor crystallinity compared to single crystals, was obtained with the 2201-phase BSCO film that was deposited on a SrTiO3(100) substrate. The full width at half maximum (FWHM) value of the rocking curve on XRD for the film was estimated as 1560 (arc sec).

scholarly journals Pembuatan Material Feroelektrik Barium Titanat (BaTiO3) Menggunakan Metode Solid State Reaction (Halaman 59 s.d. 61)

2015 ◽  
Vol 18 (53) ◽  
Author(s):  
Meisya Istiqomah ◽  
Anif Jamaluddin ◽  
Yofentina Iriani
Keyword(s):  
Solid State ◽  
Data Base ◽  
Solid State Reaction ◽  
Full Width Half Maximum ◽  
International Commission ◽  
Full Width ◽  
Half Maximum ◽  
X Ray Diffraction ◽  
X Ray

Pembuatan material feroelektrik Barium titanat (BaTiO3) berhasil dilakukan menggunakan metode solid state reaction (reaksi padatan). Barium carbonat (BaCO3) dan Titanium oksida (TiO2) dihomogenisasikan kemudian dipadatkan hingga berbentuk bulk. Sampel disintering pada temperatur 9000C dengan variasi waktu 5 dan 6 jam. Karakterisasi dilakukan dengan peralatan X-Ray Diffraction (XRD) Bruker D8 Advance bersumber radiasi Cu dengan panjang gelombang 1,54187 Å. Sampel dianalisa dengan International Commission Data Diffraction (ICDD) data base dan dilakukan penghalusan menggunakan metode Rietvield. Hasil analisa BaTiO3 pada waktu sintering 5 jam diperoleh nilai a dan b = 4,005895 serta nilai c = 4,030629. Nilai tetragonalitas 1,0061744, kristalinitas 94,50%, Full Width Half Maximum (FWHM) 0,2994 dan ukuran kristal 6,7243 nm. Waktu sintering 6 jam diperoleh nilai a dan b=4,000434 serta c= 4,021041, tetragonalitas 1,0051512, kristalinitas 79,91%, FWHM 0,26021 dan ukuran kristal 6,1207 nm.

The “Hook Effect” of X-Ray Diffraction Peak Broadening of Multilayer Thin Films

1987 ◽  
Vol 2 (3) ◽  
pp. 180-182 ◽  
Author(s):  
Liu Dengfa ◽  
Wang Yuming
Keyword(s):  
Thin Films ◽  
Copper Films ◽  
Multilayer Thin Films ◽  
Size Distributions ◽  
X Ray Diffraction ◽  
X Ray ◽  
Hook Effect ◽  
Peak Broadening ◽  
Grain Size Distributions ◽  
Diffraction Peaks

AbstractThe “hook effect” observed in the Warren-Averbach analysis of X-ray diffraction peaks from multiple layer thin films of copper has been investigated theoretically and experimentally. The strengths of the “hook effect” for films of different layer thicknesses were analyzed. The results showed definite correlation between the strengths of the “hook effect” and the grain size distributions in 1, 4, and 19-layer copper films.

Full width at half maximum of low-angle basal phyllosilicate X-ray diffraction reflections: fitted peaks vs. diffraction traces

Clay Minerals ◽  
2018 ◽  
Vol 53 (3) ◽  
pp. 325-338 ◽  
Author(s):  
Hanan J. Kisch
Keyword(s):  
Full Width ◽  
Half Maximum ◽  
X Ray Diffraction ◽  
Cauchy Function ◽  
X Ray ◽  
Peak Fitting ◽  
Diffraction Peaks ◽  
Cauchy Functions ◽  
Half Height Width ◽  
Better Than

ABSTRACTBernard Kübler measured illite ‘crystallinity’, the half-height width or full width at half maximum (FWHM) of the X-ray diffraction line of illite/mica at 10 Å, directly on the diffraction traces; this procedure has since been followed by the vast majority of workers. However, some workers have recently measured the FWHM of the fitted Pearson VII function rather than on the diffraction traces. The FWHM of this function for low-angle phyllosilicate diffraction peaks (FWHM*PVII) is almost consistently ‘broader’ than those measured directly on the diffraction trace profiles (FWHMtrace) by up to 0.08°Δ2θ for the broader peaks. The Pearson VII function shows gentle curvature (‘smoothing’) at its tops and fast fading of the tails relative to virtually all 10 Å diffraction traces. The broad FWHM*PVII results from the consequent lowering/’under-fitting’ of the peak tops and the upper tails and compensatory broadening/’over-fitting’ of the intermediate peak flanks. FWHM*PVII ‘contraction’ with respect to FWHMtrace and enhancement of the peak maximum is found on traces of muscovite strips. The fitting reliabilities of the Cauchy function are almost invariably better than those of the Pearson VII function. Their FWHM*Cauchy values are narrower for both the illite/mica 10 Å and the chlorite 7 Å reflections; although they still differ somewhat from the FWHMtrace, they are much closer, usually within 0.02°Δ2θ. This markedly lesser broadening of FWHM* of the Cauchy of the Pearson VII function is the result of its stronger top curvature and notably faster tail fading (less ‘smoothening’). For higher-angle mica peaks, the FWHM* values of the Pearson VII and Cauchy functions converge, usually differing only by 0.01–0.03°Δ2θ for the 5 Å peak, and even less for the 3.3 Å peak. It is therefore strongly recommended that FWHM values of the illite/mica 10 Å reflections be measured on the diffraction traces rather than on fitted functions. Where peak fitting is unavoidable (e.g. in order to separate the contributions of adjoining, partly resolved or unresolved reflections on broadened 10 Å reflections), Cauchy rather than Pearson VII functions should be used.

X-ray diffraction from inhomogeneous thin films of nanometre thickness: modelling and experiment

2003 ◽  
Vol 36 (1) ◽  
pp. 154-157 ◽  
Author(s):  
F. Bocquet ◽  
P. Gergaud ◽  
O. Thomas
Keyword(s):  
Experimental Data ◽  
Thin Films ◽  
Film Thickness ◽  
Thin Layer ◽  
Peak Position ◽  
Diffraction Peak ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Comparison With Experimental Data

The diffraction of X-rays by a thin layer (of the order of a few nanometres) with a gradient in interplanar spacings is considered. It is shown that optical coherence over the film thickness leads to diffraction peak positions that no longer obey Bragg's law. Although a fitting of the diffracted intensity is indeed still possible, this has direct consequences on the applicability of more straightforward analysis methods, such as the sin2ψ method, which rely on diffraction peak positions. The intensity and peak position calculations are supported by a comparison with experimental data from a (001) Fe/GaAs thin (3 nm) epitaxic film.

Transparent Conductive Cu-In-O Thin Films Deposited by Reactive DC Magnetron Sputtering with Different Targets

2011 ◽  
Vol 239-242 ◽  
pp. 2752-2755
Author(s):  
Fan Ye ◽  
Xing Min Cai ◽  
Fu Ping Dai ◽  
Dong Ping Zhang ◽  
Ping Fan ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Optical Band Gap ◽  
Diffraction Peak ◽  
X Ray Diffraction ◽  
Dc Magnetron Sputtering ◽  
Flow Rates ◽  
X Ray ◽  
Equal Distance ◽  
Transmittance Curve

Transparent conductive Cu-In-O thin films were deposited by reactive DC magnetron sputtering. Two types of targets were used. The first was In target covered with a fan-shaped Cu plate of the same radius and the second was Cu target on which six In grains of 1.5mm was placed with equal distance between each other. The samples were characterized with scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDX), X-ray diffraction (XRD), UV/VIS spectrophotometer, four-probe measurement etc. SEM shows that the surfaces of all the samples are very smooth. EDX shows that the samples contain Cu, In as well as O, and different targets result in different atomic ratios of Cu to In. A diffraction peak related to rhombohedra-centered In2O3(012) is observed in the XRD spectra of all the samples. For both the two targets, the transmittance decreases with the increase of O2flow rates. The direct optical band gap of all the samples is also estimated according to the transmittance curve. For both the two targets, different O2flow rates result in different sheet resistances and conductivities. The target of Cu on In shows more controllability in the composition and properties of Cu-In-O films.

Sign in / Sign up

Export Citation Format

Share Document