A New Approach for Determining Epilayer Strain Relaxation and Composition Through High Resolution X-Ray Diffraction

1995 ◽  
Vol 379 ◽  
Author(s):  
K. M. Matney ◽  
M.S. Goorsky
Keyword(s):  
High Resolution ◽  
Small Angle ◽  
Experimental Error ◽  
Strain Relaxation ◽  
New Method ◽  
X Ray Diffraction ◽  
New Approach ◽  
X Ray ◽  
First Order ◽  
Ray Geometry

ABSTRACTWe developed a new method of determining epilayer relaxation (along one direction) and composition using a symmetric and any single asymmetric high resolution x-ray diffraction scan. The previous use of small angle approximations can be very detrimental to calculated results and should be avoided. This new method does not employ small angle approximations or first order Taylor approximations, producing accurate results. The effect of x-ray geometry (glancing incident versus glancing exit) on the analysis of epilayer composition and strain is also reviewed. It is also shown that the glancing exit geometry is generally less susceptible to experimental error.

A high-throughput assembly of beam-shaping channel-cut monochromators for laboratory high-resolution X-ray diffraction and small-angle X-ray scattering experiments

2021 ◽  
Vol 54 (3) ◽  
Author(s):  
Peter Nadazdy ◽  
Jakub Hagara ◽  
Petr Mikulik ◽  
Zdenko Zaprazny ◽  
Dusan Korytar ◽  
...  
Keyword(s):  
High Resolution ◽  
Small Angle ◽  
Photon Flux ◽  
Photon Flux Density ◽  
X Ray Diffraction ◽  
High Beam ◽  
X Ray ◽  
X Ray Scattering ◽  
Beam Collimation ◽  
Ray Scattering

A four-bounce monochromator assembly composed of Ge(111) and Ge(220) monolithic channel-cut monochromators with V-shaped channels in a quasi-dispersive configuration is presented. The assembly provides an optimal design in terms of the highest transmittance and photon flux density per detector pixel while maintaining high beam collimation. A monochromator assembly optimized for the highest recorded intensity per detector pixel of a linear detector placed 2.5 m behind the assembly was realized and tested by high-resolution X-ray diffraction and small-angle X-ray scattering measurements using a microfocus X-ray source. Conventional symmetric and asymmetric Ge(220) Bartels monochromators were similarly tested and the results were compared. The new assembly provides a transmittance that is an order of magnitude higher and 2.5 times higher than those provided by the symmetric and asymmetric Bartels monochromators, respectively, while the output beam divergence is twice that of the asymmetric Bartels monochromator. These results demonstrate the advantage of the proposed monochromator assembly in cases where the resolution can be partially sacrificed in favour of higher transmittance while still maintaining high beam collimation. Weakly scattering samples such as nanostructures are an example. A general advantage of the new monochromator is a significant reduction in the exposure time required to collect usable experimental data. A comparison of the theoretical and experimental results also reveals the current limitations of the technology of polishing hard-to-reach surfaces in X-ray crystal optics.

scholarly journals Исследование кинетики твердофазного перехода в тетракозане С-=SUB=-24-=/SUB=-Н-=SUB=-50-=/SUB=- методом высокоразрешающей синхротронной рентгеновской порошковой дифракции

2019 ◽  
Vol 61 (6) ◽  
pp. 1190
Author(s):  
B.A. Марихин ◽  
П.В. Дороватовский ◽  
Я.B. Зубавичус ◽  
M.B. Байдакова ◽  
E.M. Иванькова ◽  
...  
Keyword(s):  
Phase Transition ◽  
Small Angle ◽  
Diffuse Phase Transition ◽  
Basic Research ◽  
X Ray Diffraction ◽  
Kurchatov Institute ◽  
X Ray ◽  
First Order ◽  
Basic Research Project ◽  
Diffuse Phase

With the help of small angle X-ray diffraction using synchrotron X-ray beamline"Belok" in NRC «Kurchatov Institute» was shown that the first order sold phase transition in the tetracosane C24H50 develops by a heterogeneous mechanism in a very narrow thermal interval (delta ≈0,1K ) in accordance with the theory of diffuse phase transition. The work was financially supported by the Presidium RAN Program №32 "Nanostructures: physics, chemistry, biology, basics of technology" and Russian Foundation of Basic Research (project 16-03-00493А) using beamline "Belok" in NRC

The Macromolecular Structure of Collagen in Tendon Fibres of Dermatosparactic Animals

1986 ◽  
Vol 41 (4) ◽  
pp. 489-492 ◽  
Author(s):  
E. Mosler ◽  
W. Folkhard ◽  
W. Geercken ◽  
O. Helle ◽  
E. Knorzer ◽  
...  
Keyword(s):  
Small Angle ◽  
Macromolecular Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
First Order ◽  
Order Reflection ◽  
Tendon Collagen

Small-angle x-ray diffraction spectra of dermatosparactic tendon collagen show a decreased intensity of the first order reflection. We interprete this finding to be due to the N-terminal propeptide which fills the intermolecular gap region partially.

Scatterless hybrid metal–single-crystal slit for small-angle X-ray scattering and high-resolution X-ray diffraction

2008 ◽  
Vol 41 (6) ◽  
pp. 1134-1139 ◽  
Author(s):  
Youli Li ◽  
Roy Beck ◽  
Tuo Huang ◽  
Myung Chul Choi ◽  
Morito Divinagracia
Keyword(s):  
High Resolution ◽  
Single Crystal ◽  
Small Angle ◽  
Incident Beam ◽  
Single Crystal Substrate ◽  
X Ray Diffraction ◽  
Metal Base ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

A simple hybrid design has been developed to produce practically scatterless aperture slits for small-angle X-ray scattering and high-resolution X-ray diffraction. The hybrid slit consists of a rectangular single-crystal substrate (e.g.Si or Ge) bonded to a high-density metal base with a large taper angle (> 10°). The beam-defining single-crystal tip is oriented far from any Bragg peak position with respect to the incident beam and hence produces none of the slit scattering commonly associated with conventional metal slits. It has been demonstrated that the incorporation of the scatterless slits leads to a much simplified design in small-angle X-ray scattering instruments employing only one or two apertures, with dramatically increased intensity (a threefold increase observed in the test setup) and improved low-angle resolution.

scholarly journals High-resolution X-ray diffraction analysis of strain relaxation in epitaxial oxide thin films

2008 ◽  
Vol 64 (a1) ◽  
pp. C106-C106
Author(s):  
R. Guinebretiere ◽  
F. Conchon ◽  
A. Boulle ◽  
C. Girardot ◽  
S. Pignard ◽  
...  
Keyword(s):  
Thin Films ◽  
High Resolution ◽  
Diffraction Analysis ◽  
Strain Relaxation ◽  
X Ray Diffraction ◽  
Oxide Thin Films ◽  
X Ray ◽  
Epitaxial Oxide

Structural characterization of manganese-substituted nanocrystalline zinc oxide using small-angle neutron scattering and high-resolution transmission electron microscopy

2009 ◽  
Vol 42 (6) ◽  
pp. 1085-1091 ◽  
Author(s):  
B. Roy ◽  
B. Karmakar ◽  
J. Bahadur ◽  
S. Mazumder ◽  
D. Sen ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Zinc Oxide ◽  
High Resolution ◽  
Neutron Scattering ◽  
Small Angle ◽  
Small Angle Neutron Scattering ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron

A series of zinc oxide (ZnO) nanoparticles, substituted with manganese di-oxide, have been synthesized through a modified ceramic route using urea as a fuel. X-ray diffraction and high-resolution transmission electron microscopy studies indicate that the sizes of the ZnO particles are of nanometer dimension. Particles remain as single phase when the doping concentration is below 15 mol%. Small-angle neutron scattering indicates fractal-like agglomerates of these nanoparticles in powder form. The size distributions of the particles have been estimated from scattering experiments as well as microscopy studies. The average particle size estimated from small-angle scattering experiments was found to be somewhat more than that obtained from X-ray diffraction or electron microscopy measurement.

Observation of strain relaxation phenomena in buried and nonburied III–V surface gratings through high resolution x-ray diffraction

1997 ◽  
Vol 71 (22) ◽  
pp. 3227-3229 ◽  
Author(s):  
L. Leprince ◽  
G. T. Baumbach ◽  
A. Talneau ◽  
M. Gailhanou ◽  
J. Schneck
Keyword(s):  
High Resolution ◽  
Strain Relaxation ◽  
Relaxation Phenomena ◽  
X Ray Diffraction ◽  
X Ray
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