The Yield Stress of the Fully-Lamellar Microstructure
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ABSTRACTThis paper is an inquiry into the relationship between the yield stress and the two length parameters in the fully-lamellar polycrystalline microstructure, the grain-size dCB and the lamellar thickness dLM. Deformation in the multilayer structure is assumed to proceed by dislocations propagating in the formation of a succession of mutually interacting pileups, blocked at the lamellar interfaces and piled-up ultimately against the grain boundary. An important case suggested is a yield stress independent of the grain size, sensitive only to the lamellar spacing.
2010 ◽
Vol 638-642
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pp. 1934-1939
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1997 ◽
Vol 61
(8)
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pp. 678-683
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2004 ◽
Vol 449-452
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pp. 25-30
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1997 ◽
Vol 239-240
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pp. 419-428
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2010 ◽
Vol 24
(15n16)
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pp. 2279-2284