Investigation on Morphology and Microstructure of the SALD SiC

1998 ◽  
Vol 542 ◽  
Author(s):  
Lianchao Sun ◽  
James E. Crocker ◽  
Leon L. Shaw ◽  
Harris L. Marcus
Keyword(s):  
Crystal Structure ◽  
Silicon Carbide ◽  
Surface Morphology ◽  
Cross Section ◽  
Target Temperature ◽  
X Ray Diffraction ◽  
X Ray ◽  
Amorphous Phases ◽  
The Cross

AbstractIn this work, the deposition of silicon carbide lines using a tetramethylsilane (TMS) precursor was investigated. Effects of target temperatures on the morphology and crystal structure of the deposits were examined. It was found that the morphology of the SALD SiC depends strongly on the target temperature. The contour of the cross section of the SiC deposits changes from a triangle to trapezoid to volcano shape and the surface morphology of the deposited lines changes from smooth to rough to porous as the target temperature increases. A critical target temperature was found to be about 700°C to initiate deposition of SiC under the current experimental configurations. X-ray diffraction analyses show that the SALD SiC formed at 1000°C contains both crystalline and amorphous phases. The results are briefly discussed.

On the Cross-Section Structure of the Mitochondrial Cristae-Membrane as Revealed by X-Ray Diffraction

1976 ◽  
Vol 31 (9-10) ◽  
pp. 612-621 ◽  
Author(s):  
W Müller-Klieser ◽  
W Kreutz
Keyword(s):  
Cross Section ◽  
Function Evaluation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Section Profile ◽  
The Cross ◽  
Diffraction Patterns ◽  
Cross Section Profile ◽  
Section Structure ◽  
Q Function

Abstract Mitochondria were isolated using sorbitol and high buffer concentration in the medium. X-ray diffraction patterns arising from the mitochondrial cristae-membrane were recorded in the fully dried state and in two different states in humidity. The Q-function evaluation of these X-ray dif­fraction diagrams resulted in electron density cross-section profiles, which consist of two main peaks of opposite sign and one, respectively two, smaller peaks. The total thickness of the membrane amounts to 120 Å in the dry and 140 Å to 160 Å in the wet state.An interpretation of the cross-section profile is tentatively proposed.

scholarly journals Microbeam X-ray Diffraction from the Cross-section of Metallic Materials with Inhomogeneous Structure

1991 ◽  
Vol 77 (11) ◽  
pp. 2052-2059 ◽  
Author(s):  
Tizuko MAEDA ◽  
Keiichi MARUTA ◽  
Osamu FURUKIMI ◽  
Nobuyuki MORITO
Keyword(s):  
Cross Section ◽  
Inhomogeneous Structure ◽  
Metallic Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
The Cross

X-ray diffraction study of the distribution of texture over the cross section of uranium bars worked in the ?- and ?-phases and subjected to quenching

1966 ◽  
Vol 21 (3) ◽  
pp. 841-845
Author(s):  
V. F. Zelenskii ◽  
V. V. Kunchenko ◽  
N. M. Roenko ◽  
L. D. Kolomiets ◽  
A. I. Stukalov
Keyword(s):  
Diffraction Study ◽  
Cross Section ◽  
X Ray Diffraction ◽  
X Ray ◽  
The Cross

scholarly journals Diffraction from twisted nanowires: helicity revealed by anisotropy

2018 ◽  
Vol 51 (6) ◽  
pp. 1586-1596
Author(s):  
Marc Gailhanou ◽  
Jean-Marc Roussel
Keyword(s):  
Cross Section ◽  
Elastic Anisotropy ◽  
Shape Anisotropy ◽  
Atomistic Simulations ◽  
Copper Nanowires ◽  
X Ray Diffraction ◽  
X Ray ◽  
Kinematic Theory ◽  
Warping Displacement ◽  
The Cross

The helical nature of twisted nanowires is studied by simulated X-ray diffraction. It is shown that this helicity is revealed by the anisotropy, which can be both an elastic anisotropy, through the warping displacement generated by torsion, or a shape anisotropy of the cross section. To support the analytical calculations, based on the kinematic theory of diffraction by helices, atomistic simulations of copper nanowires are performed.

Nanostructured Morphology of Spinel LiMn2O4 Oxide under Microwave Heating

2014 ◽  
Vol 936 ◽  
pp. 452-458
Author(s):  
Di Huo
Keyword(s):  
Crystal Structure ◽  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Surface Morphology ◽  
Microwave Heating ◽  
X Ray Diffraction ◽  
X Ray ◽  
Synthesis Conditions ◽  
Morphology And Structure ◽  
Scanning Electron

The surface morphology and structure of the cubic stoichiometric spinel LiMn2O4powder prepared by microwave heating were examined using X-ray diffraction, scanning electron microscopy and transmittance electron microcopy. It is shown that the surface morphology of LiMn2O4particle changed with increasing preparing temperature, while the crystal structure kept unchanged. Novel nanostructured morphologies including nanorods and nanowhiskers were formed under appropriate synthesis conditions. The growth mechanism of the nanostructured morphology of spinel LiMn2O4was discussed in accordance with period bonding chains (PBCs) theory.

scholarly journals Структурные превращения в борате железа при высокотемпературном отжиге

2019 ◽  
Vol 89 (8) ◽  
pp. 1229
Author(s):  
С.В. Ягупов ◽  
Н.И. Снегирёв ◽  
К.А. Селезнева ◽  
Е.Т. Милюкова ◽  
Ю.А. Могиленец ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Surface Morphology ◽  
Diffraction Analysis ◽  
X Ray Diffraction ◽  
Iron Borate ◽  
X Ray ◽  
Different Temperatures ◽  
Scanning Electron

Surface morphology and crystal structure of iron borate, FeBO3, annealed at different temperatures, have been studied by scanning electron microscopy and X-ray diffraction analysis. The temperature range of structurally stability of iron borate has been determined. It has been established that in the range of temperatures 800–900°C recrystallization in the iron orthoborate Fe3BO6 phase, and more than 900°C − in α-Fe2O3 phase, occurs.

scholarly journals Investigation of Silicon Carbide Polytypes by Raman Spectroscopy

2014 ◽  
Vol 51 (3) ◽  
pp. 51-57 ◽  
Author(s):  
G. Chikvaidze ◽  
N. Mironova-Ulmane ◽  
A. Plaude ◽  
O. Sergeev
Keyword(s):  
Crystal Structure ◽  
Silicon Carbide ◽  
Raman Spectroscopy ◽  
Vapour Deposition ◽  
Chemical Vapour ◽  
Stacking Faults ◽  
Sem Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Scanning Electron

Abstract Polytypes of colourless and coloured single crystals of silicon carbide (SiC) grown on SiC substrates by chemical vapour deposition are studied using Raman spectroscopy supplemented by scanning electron microscopy (SEM) and X-ray diffraction (XRD) analyses. The SEM analysis of the defect stacking faults, inclusions of defects and their distribution has shown that they correlate with the peak positions of the obtained Raman spectra and with the XRD data on the crystal structure

TSD Reduction by RAF (Repeated a-Face) Growth Method

2012 ◽  
Vol 717-720 ◽  
pp. 9-12 ◽  
Author(s):  
Yasushi Urakami ◽  
Itaru Gunjishima ◽  
Satoshi Yamaguchi ◽  
Hiroyuki Kondo ◽  
Fusao Hirose ◽  
...  
Keyword(s):  
Silicon Carbide ◽  
Screw Dislocation ◽  
Cross Section ◽  
Power Devices ◽  
High Quality ◽  
X Ray ◽  
Growth Method ◽  
The Cross

A reduction in threading screw dislocation (TSD) density in 4H-SiC (silicon carbide) crystal is required for SiC power devices. In this study, TSD’s transformation by the RAF (repeated a-face) growth method [1] is observed by transmission X-ray topography (g=0004) of the cross-section of the crystal. Increasing the number of repetitions of a-face growth and offsetting c-face growth to an angle of several degrees reduce TSDs. TSD density is reduced to 1.3 TSD/cm2. The RAF growth method is very effective towards growing high quality SiC crystals.

The Morphology and Evolution of Cu6Sn5 at the Interface of Sn-2.5Ag-0.7Cu-0.1RE/Cu Solder Joint during the Isothermal Aging

2011 ◽  
Vol 704-705 ◽  
pp. 685-689 ◽  
Author(s):  
Yao Li Wang ◽  
Ke Ke Zhang ◽  
Chen Yang Li ◽  
Li Juan Han
Keyword(s):  
Rare Earth ◽  
Energy Spectrum ◽  
Solder Joint ◽  
Cross Section ◽  
Isothermal Aging ◽  
Joint Interface ◽  
X Ray Diffraction ◽  
X Ray ◽  
The Cross ◽  
Electronic Microscope

The morphology and growing behavior of Cu6Sn5intermetallic compound (IMC) of low Ag content Sn-2.5Ag-0.7Cu-0.1RE/Cu solder joint interface are investigated by adopting the X-ray diffraction, JSM-5610LV scanning electronic microscope and energy spectrum analysis. The results show that the cross-section morphology Cu6Sn5of the solder joint interface is scallop-like and its section morphology is circle-like grain. With the aging time increasing, the cross-section Cu6Sn5morphology of the solder joint interface can be changed from the scallop-like to the shape-layer, and the growing kinetics is coincidence with the law of parabola and its growing behavior is controlled by diffusion. With adding a small amount of rare earth elements in the Sn-2.5Ag-0.7Cu solder alloy, the growing rate of the Cu6Sn5can be reduced.

Freeze-Fracture Replication of Frozen Outer Segments of Rat Retinal Rods

1969 ◽  
Vol 27 ◽  
pp. 392-393
Author(s):  
Thomas S. Leeson ◽  
C. Roland Leeson
Keyword(s):  
Electron Microscopy ◽  
Cross Section ◽  
Outer Segment ◽  
Freeze Fracture ◽  
X Ray Diffraction ◽  
X Ray ◽  
Outer Segments ◽  
Retinal Rods ◽  
Temperature Electron ◽  
Freeze Etching

Numerous previous studies of outer segments of retinal receptors have demonstrated a complex internal structure of a series of transversely orientated membranous lamellae, discs, or saccules. In cones, these lamellae probably are invaginations of the covering plasma membrane. In rods, however, they appear to be isolated and separate discs although some authors report interconnections and some continuities with the surface near the base of the outer segment, i.e. toward the inner segment. In some species, variations have been reported, such as longitudinally orientated lamellae and lamellar whorls. In cross section, the discs or saccules show one or more incisures. The saccules probably contain photolabile pigment, with resulting potentials after dipole formation during bleaching of pigment. Continuity between the lamina of rod saccules and extracellular space may be necessary for the detection of dipoles, although such continuity usually is not found by electron microscopy. Particles on the membranes have been found by low angle X-ray diffraction, by low temperature electron microscopy and by freeze-etching techniques.

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