Deep Level Related Yellow Luminescence in P-Type GaN Grown by MBE on (0001) Sapphire

1999 ◽  
Vol 595 ◽  
Author(s):  
Giancarlo Salviati ◽  
Nicola Armani ◽  
Carlo Zanotti-Fregonara ◽  
Enos Gombia ◽  
Martin Albrecht ◽  
...  

AbstractYellow luminescence (YL) has been studied in GaN:Mg doped with Mg concentrations ranging from 1019 to 1021 cm−3 by spectral CL (T=5K) and TEM and explained by suggesting that a different mechanism could be responsible for the YL in p-type GaN with respect to that acting in n-type GaN.Transitions at 2.2, 2.8, 3.27, 3.21, and 3.44 eV were found. In addition to the wurtzite phase, TEM showed a different amount of the cubic phase in the samples. Nano tubes with a density of 3×109 cm−2 were also observed by approaching the layer/substrate interface. Besides this, coherent inclusions were found with a diameter in the nm range and a volume fraction of about 1%.The 2.8 eV transition was correlated to a deep level at 600 meV below the conduction band (CB) due to MgGa-VN complexes. The 3.27 eV emission was ascribed to a shallow acceptor at about 170-190 meV above the valence band (VB) due to MgGa.The 2.2 eV yellow band, not present in low doped samples, increased by increasing the Mg concentration. It was ascribed to a transition between a deep donor level at 0.8-1.1 eV below the CB edge due to NGa and the shallow acceptor due to MgGa. This assumption was checked by studying the role of C in Mg compensation. CL spectra from a sample with high C content showed transitions between a C-related 200 meV shallow donor and a deep donor level at about 0.9- 1.1 eV below the CB due to a NGa-VN complex. In our hypothesis this should induce a decrease of the integrated intensity in both the 2.2 and 2.8 eV bands, as actually shown by CL investigations.

2000 ◽  
Vol 5 (S1) ◽  
pp. 754-760
Author(s):  
Giancarlo Salviati ◽  
Nicola Armani ◽  
Carlo Zanotti-Fregonara ◽  
Enos Gombia ◽  
Martin Albrecht ◽  
...  

Yellow luminescence (YL) has been studied in GaN:Mg doped with Mg concentrations ranging from 1019 to 1021 cm-3 by spectral CL (T=K) and TEM and explained by suggesting that a different mechanism could be responsible for the YL in p-type GaN with respect to that acting in n-type GaN.Transitions at 2.2, 2.8, 3.27, 3.21, and 3.44 eV were found. In addition to the wurtzite phase, TEM showed a different amount of the cubic phase in the samples. Nano tubes with a density of 3×109 cm−2 were also observed by approaching the layer/substrate interface. Besides this, coherent inclusions were found with a diameter in the nm range and a volume fraction of about 1%.The 2.8 eV transition was correlated to a deep level at 600 meV below the conduction band (CB) due to MgGa-VN complexes. The 3.27 eV emission was ascribed to a shallow acceptor at about 170-190 meV above the valence band (VB) due to MgGa.The 2.2 eV yellow band, not present in low doped samples, increased by increasing the Mg concentration. It was ascribed to a transition between a deep donor level at 0.8-1.1 eV below the CB edge due to NGa and the shallow acceptor due to MgGa. This assumption was checked by studying the role of C in Mg compensation. CL spectra from a sample with high C content showed transitions between a C-related 200 meV shallow donor and a deep donor level at about 0.9-1.1 eV below the CB due to a NGa-VN complex. In our hypothesis this should induce a decrease of the integrated intensity in both the 2.2 and 2.8 eV bands, as actually shown by CL investigations.


2004 ◽  
Vol 95 (12) ◽  
pp. 7998-8001 ◽  
Author(s):  
S. Z. Wang ◽  
S. F. Yoon ◽  
Y. X. Xia ◽  
S. W. Xie

1993 ◽  
Vol 302 ◽  
Author(s):  
B.K. Meyer ◽  
D.M. Hofmann ◽  
W. Stadler ◽  
M. Salk ◽  
C. Eiche ◽  
...  

ABSTRACTWe report on electrical and optical properties of vertical Bridgman grown Cl-doped CdTe including the ternary compositions Cd0.9Zn0.1Te and CdTe0 9Se0.1 with respect to application as a radiation detector. Based on Hall effect measurements, photoinduced current spectroscopy (PICTS) and photoluminescence we infer that high resistive material with good performance is controlled by deep level defects. The resistivity is calculated as a function of the shallow acceptor concentration (Cl-A-centers) with the conclusion that a deep donor state at mid gap must be present.


2014 ◽  
Vol 48 (8) ◽  
pp. 996-998
Author(s):  
M. I. Daunov ◽  
U. Z. Zalibekov ◽  
I. K. Kamilov ◽  
A. Yu. Mollaev

1985 ◽  
Vol 46 ◽  
Author(s):  
D.J. Stirland ◽  
M.R. Brozel

Abstract2" diameter wafers cut from indium doped, liquid encapsulated Czochralski (LEC) grown GaAs ingots have been examined by two different methods. Dislocations were revealed by etching, and isolated regions of enhanced [EL2], the concentration of the deep donor level EL2, weredetected by infrared transmission microscopy. In regions of low dislocation density (∼5 × 102 cm−2) single isolated dislocations were identified and at the identical sites infra-red micrographs showed increased absorption. The results demonstrate that enhancement of [EL2]occurs at single dislocations, and that the enhancement can be detected by suitable etching techniques.


1992 ◽  
Vol 261 ◽  
Author(s):  
Georges Bremond ◽  
G. Guillot ◽  
P. Roura ◽  
W. Ulrici

ABSTRACTA complete understanding of the electrical and optical properties of the Vanadium related donor level (VGa3+/VGa4+) in GaP is deduced from a number of different characterization techniques (deep level transient and deep level optical spectroscopies, optical absorption) performed on p-type V doped GaP. The VGa3+/VGa4+ donor level is located at Ev+0.25eV. This assignment is based on the correlation of optical absorption spectra and the photoneutralization cross-section σp°(hv) curve obtained by deep level optical spectroscopy confirming that this technique is very unique for deep level identification in semiconductor materials.


1998 ◽  
Vol 72 (3) ◽  
pp. 302-304 ◽  
Author(s):  
R. Ajjel ◽  
M. A. Zaidi ◽  
S. Alaya ◽  
G. Brémond ◽  
G. Guillot ◽  
...  

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