X-Ray Reflectivity and GISAXS Study of Derelaxation in Kr Implanted Si

2001 ◽  
Vol 678 ◽  
Author(s):  
P. Duč ◽  
B. Pivac ◽  
O. Milat ◽  
S. Bernstorff ◽  
I Zulim
Keyword(s):  
Critical Angle ◽  
Structural Changes ◽  
Single Crystal Silicon ◽  
Grazing Incidence ◽  
Crystal Silicon ◽  
Reflectivity Curve ◽  
X Ray ◽  
X Ray Scattering ◽  
Ion Energies ◽  
Scattering Technique

AbstractThe structural changes induced in single crystal silicon implanted with Krypton above the amorphisation threshold were studied by X-ray reflectivity together with Grazing Incidence Small Angle X-ray Scattering technique. Silicon samples were implanted with Krypton with two different ion energies. A well-defined layer, 220 nm thick of amorphous silicon, rich in Krypton, was formed below the top, undisturbed layer. A series of samples consist of as-implanted, relaxed, and a number of samples with increased level of defects induced by additional Kr implantation. Additional implantation caused changes in the films composition and thickness, which was well evidenced in reflectivity curve, while only minor changes of surface roughness and critical angle were detected in GISAXS spectra.

Application of Grazing-Incidence Small-Angle X-Ray Scattering Technique to Semiconducting Composite Materials

2005 ◽  
Vol 475-479 ◽  
pp. 1097-1100 ◽  
Author(s):  
T. Ogawa ◽  
H. Niwa ◽  
Hiroshi Okuda ◽  
Shojiro Ochiai
Keyword(s):  
Small Angle ◽  
Grazing Incidence ◽  
Two Dimensional ◽  
Dimensional Model ◽  
X Ray ◽  
X Ray Scattering ◽  
Angle Scattering ◽  
Two Dimensional Model ◽  
Scattering Technique ◽  
Best Fitting

Grazing-incidence small-angle scattering (GI-SAXS) technique was applied to self-assembled Ge islands capped with Si. GI-SAXS has a merit over TEM and AFM that the structure of islands buried in a cap layer for stabilization can be evaluated nondestructively. By analyzing the scattering patterns, the size of Ge islands was estimated to be about 5 nm in height and 26 nm in diameter, with the islands density of 4.2×1014/m2. From the best fitting of two-dimensional model intensity to the experiments, the shape of the islands was deduced

Debye–Scherrer rings from block copolymer films with powder-like order

2011 ◽  
Vol 44 (2) ◽  
pp. 370-379 ◽  
Author(s):  
Peter Busch ◽  
Markus Rauscher ◽  
Jean-François Moulin ◽  
Peter Müller-Buschbaum
Keyword(s):  
Small Angle ◽  
Critical Angle ◽  
Grazing Incidence ◽  
Distorted Wave ◽  
Distorted Wave Born Approximation ◽  
X Ray ◽  
Copolymer Films ◽  
X Ray Scattering ◽  
Ring Shape ◽  
Neutron Time

The powder-like orientation of lamellar domains in thin films of the diblock copolymer polystyrene-block-poly(methyl methacrylate) is investigated using grazing-incidence small-angle X-ray scattering (GISAXS) and grazing-incidence small-angle neutron scattering (GISANS). Conventional monochromatic GISANS and GISAXS measurements are compared with neutron time-of-flight GISANS. For angles of incidence and exit larger than the critical angle of total external reflection of the polymer, Debye–Scherrer rings are observed. The position of the Debye–Scherrer rings is described quantitatively based on a reduced version of the distorted-wave Born approximation. A strong distortion of the ring shape is caused by refraction and reflections from the film interfaces. Close to the critical angle, the ring shape collapses into a banana shape.

Microstructure variations induced by excess PbX2or AX within perovskite thin films

2017 ◽  
Vol 53 (96) ◽  
pp. 12966-12969 ◽  
Author(s):  
Guanhaojie Zheng ◽  
Cheng Zhu ◽  
Yihua Chen ◽  
Juchen Zhang ◽  
Qi Chen ◽  
...  
Keyword(s):  
Thin Films ◽  
Grazing Incidence ◽  
Stoichiometric Ratio ◽  
Wide Angle ◽  
Two Dimensional ◽  
X Ray ◽  
X Ray Scattering ◽  
Hybrid Perovskite ◽  
Scattering Technique ◽  
The Impact

We investigated the impact of stoichiometric ratio of PbX2/AX on microstructures within hybrid perovskite films, especially on the plane stacking directions, using the two-dimensional synchrotron radiation grazing incidence wide-angle X-ray scattering technique.

scholarly journals Additive Effect on the Structure of PEDOT:PSS Dispersions and Its Correlation with the Structure and Morphology of Thin Films

Polymers ◽  
2021 ◽  
Vol 14 (1) ◽  
pp. 141
Author(s):  
Edgar Gutierrez-Fernandez ◽  
Tiberio A. Ezquerra ◽  
Mari-Cruz García-Gutiérrez
Keyword(s):  
Thin Films ◽  
Boiling Point ◽  
Structural Changes ◽  
Phase Segregation ◽  
Grazing Incidence ◽  
Additive Concentration ◽  
X Ray ◽  
X Ray Scattering ◽  
High Boiling Point ◽  
Ray Scattering

We reported on the interaction between poly(3,4-ethylenedioxythiophene):polystyrene sulfonate (PEDOT:PSS) and high-boiling-point additives in PEDOT:PSS aqueous dispersions and in the final polymer films with the aim of stablishing correlations between the structure of both inks and solid thin films. By Small-Angle X-ray Scattering (SAXS) using synchrotron radiation, it was found that the structural changes of dispersions of PEDOT:PSS with high-boiling-point additives can be explained as a two-step mechanism depending on the additive concentration. A compaction of PEDOT:PSS grains was observed at low concentrations while a swelling of the grains together with a phase segregation between PEDOT and PSS segments was evidenced at larger concentrations. Thin films’ morphology and structure were investigated by atomic force microscopy (AFM) and synchrotron Grazing Incidence Wide-Angle X-ray Scattering (GIWAXS) respectively. Our two-step model provides an explanation for the small and sharp domains of PEDOT:PSS thin films observed for low-additive concentrations (first step) and larger domains and roughness found for higher-additive concentrations (second step). A reduction of the ratio of PSS in PEDOT:PSS thin films upon the presence of additives was also observed. This can be related to a thinning of the PSS shells of PEDOT:PSS grains in the dispersion. The results discussed in this work provide the basis for a controlled tuning of PEDOT:PSS thin films structure and the subsequent electrical properties.

Treatment of grazing-incidence small-angle X-ray scattering data taken above the critical angle

2001 ◽  
Vol 34 (2) ◽  
pp. 152-156 ◽  
Author(s):  
A. Martorana ◽  
A Longo ◽  
F. d'Acapito ◽  
C. Maurizio ◽  
E. Cattaruzza ◽  
...  
Keyword(s):  
Small Angle ◽  
Critical Angle ◽  
Hard Spheres ◽  
Grazing Incidence ◽  
Sample Surface ◽  
Scattering Data ◽  
X Ray ◽  
X Ray Scattering ◽  
Incoming Beam ◽  
Ray Scattering

The equations taking into account refraction at the sample surface in grazing-incidence small-angle X-ray scattering (GISAXS) when the angle between the incoming beam and the sample surface is slightly larger than the critical angle are derived and discussed. It is demonstrated that the refraction of both the incoming and the scattered beam at the sample surface affects the GISAXS pattern and that, when a planar bidimensional detector perpendicular to the incoming beam is used, the effect depends on the azimuthal detector angle. The smearing of the pattern depending on the size of the illuminated sample area in grazing incidence is estimated by simulations with Cauchy functions of different widths. The possibility of integrating the recorded intensities over a suitable azimuthal angular range and then of making the correction for refraction is also analysed, employing simulations involving the intensity function of monodisperse interacting hard spheres. As a case study, the refraction correction is applied to the investigation of a Cu–Ni implant on silica glass.

scholarly journals Limitations of Structural Insight into Ultrafast Melting of Solid Materials with X-ray Diffraction Imaging

2021 ◽  
Vol 11 (11) ◽  
pp. 5157
Author(s):  
Victor Tkachenko ◽  
Malik M. Abdullah ◽  
Zoltan Jurek ◽  
Nikita Medvedev ◽  
Vladimir Lipp ◽  
...  
Keyword(s):  
Structural Changes ◽  
Imaging Techniques ◽  
Single Crystal Silicon ◽  
X Ray Diffraction ◽  
Solid Materials ◽  
Crystal Silicon ◽  
X Ray ◽  
Linac Coherent Light Source ◽  
Diffraction Imaging ◽  
Peak Fluence

In this work, we analyze the application of X-ray diffraction imaging techniques to follow ultrafast structural transitions in solid materials using the example of an X-ray pump–X-ray probe experiment with a single-crystal silicon performed at a Linac Coherent Light Source. Due to the spatially non-uniform profile of the X-ray beam, the diffractive signal recorded in this experiment included contributions from crystal parts experiencing different fluences from the peak fluence down to zero. With our theoretical model, we could identify specific processes contributing to the silicon melting in those crystal regions, i.e., the non-thermal and thermal melting whose occurrences depended on the locally absorbed X-ray doses. We then constructed the total volume-integrated signal by summing up the coherent signal contributions (amplitudes) from the various crystal regions and found that this significantly differed from the signals obtained for a few selected uniform fluence values, including the peak fluence. This shows that the diffraction imaging signal obtained for a structurally damaged material after an impact of a non-uniform X-ray pump pulse cannot be always interpreted as the material’s response to a pulse of a specific (e.g., peak) fluence as it is sometimes believed. This observation has to be taken into account in planning and interpreting future experiments investigating structural changes in materials with X-ray diffraction imaging.

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