Application of Electroceramic Thin Films to Optical Waveguide Devices

MRS Bulletin ◽  
1996 ◽  
Vol 21 (7) ◽  
pp. 53-58 ◽  
Author(s):  
David K. Fork ◽  
Florence Armani-Leplingard ◽  
John J. Kingston

Electro-optic devices such as fast (>20 GHz) modulators are one application of ferroelectric-oxide thin-film waveguides. A compact, blue laser source of a few milliwatts power capable of lasting thousands of hours is of great interest as applied to optical data storage and xerography. Ferroelectric-oxide thin films offer several potential advantages over bulk materials for optical waveguides, though no electroceramic thin-film devices have replaced bulk devices yet. Bulk waveguides are defined by ion exchange, which produces only a small index difference. Thin films therefore permit higher intensity per unit power in the guide, and hence larger nonlinear effects and shorter interaction lengths.

CrystEngComm ◽  
2015 ◽  
Vol 17 (27) ◽  
pp. 5026-5031 ◽  
Author(s):  
J. M. Cole ◽  
K. Y. M. Yeung ◽  
G. Pace ◽  
S. O. Sylvester ◽  
D. Mersch ◽  
...  

High-quality microcrystals of trans-[Ru(SO2)(NH3)4(H2O)][p-TolSO3]2 photoisomers are embedded within thin films of polyvinylacrylate, which presents opportunities for optical data storage applications.


2003 ◽  
Vol 803 ◽  
Author(s):  
J. Kalb ◽  
F. Spaepen ◽  
M. Wuttig

ABSTRACTBoth the crystal nucleation rate and the crystal growth velocity of sputtered amorphous Ag0.055In0.065Sb0.59Te0.29 and Ge4Sb1Te5 thin films used for optical data storage were determined as a function of temperature. Crystals were directly observed using ex-situ atomic force microscopy, and their change in size after each anneal was measured. Between 140°C and 185°C, these materials exhibited similar crystal growth characteristics, but differed in their crystal nucleation characteristics. These observations provide an explanation for the different re-crystallization mechanisms observed upon laser-induced crystallization of amorphous marks.


1991 ◽  
Author(s):  
Wilfried Lenth ◽  
William J. Kozlovsky ◽  
William P. Risk

2002 ◽  
Vol 728 ◽  
Author(s):  
Junji Tominaga ◽  
Dorothea Büchel ◽  
Christophe Mihalcea ◽  
Takayuki Shima ◽  
Toshio Fukaya

AbstractRF-magnetron sputtered thin films of silver oxide (AgOx) were recently applied to ultra-high density optical data storage. It has been elucidated that the AgOx film sandwiched by protection layers shows very attractive characteristics in strong light-scattering, local plasmon generation and super-resolution by focussing a laser beam on it. Especially, the combination with an active recording film (optical phase change or magneto-optical) used in the currently recordable optical disks improves the storage density and overcomes the diffraction limit. In this paper, we describe the basic characteristics of nano-scale light scattering centers generated in the AgOx films and the interaction with ultra-high density recorded mark patterns in a near-field region. In addition, we provide the structural transition of the AgOx film by thermal and laser annealing treatment.


1990 ◽  
Author(s):  
Andrew J. Strandjord ◽  
Steven P. Webb ◽  
Donald R. Beaman ◽  
Susan L. Carroll

2005 ◽  
Vol 283 (3-4) ◽  
pp. 444-449 ◽  
Author(s):  
Estelle Botzung-Appert ◽  
Julien Zaccaro ◽  
Cécile Gourgon ◽  
Yves Usson ◽  
Patrice L. Baldeck ◽  
...  

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