scholarly journals Nanostructure and compositional segregation of soft magnetic FeNi‐based nanocomposites with multiple nanocrystalline phases

2021 ◽  
Vol 36 (1) ◽  
pp. 105-113
Author(s):  
P. Ohodnicki ◽  
E.J. Kautz ◽  
A. Devaraj ◽  
Y. Yu ◽  
N. Aronhime ◽  
...  
Keyword(s):  
Atom Probe ◽  
Free Energies ◽  
Orientation Relationships ◽  
Soft Magnetic ◽  
Transmission Electron ◽  
Magnetic Metal ◽  
Show Evidence ◽  
Multi Phase ◽  
Nanocrystalline Phases

AbstractSoft magnetic metal amorphous nanocomposite alloys are produced through rapid solidification and thermal annealing yielding nanocrystals embedded within an amorphous precursor. Similar free energies in Co‐rich and FeNi‐based alloy systems result in multiple nanocrystalline phases being formed during devitrification. Studies of multi‐phase crystallization processes have been reported for Co‐rich alloys but relatively few have investigated FeNi‐based systems. A detailed characterization of compositional partitioning and microstructure of an optimally annealed FeNi‐based MANC (Fe70Ni30)80Nb4Si2B14 alloy is presented through complementary high‐resolution transmission electron microscopy (HRTEM) and atom probe tomography (APT). HRTEM demonstrates orientation relationships between FCC and BCC nanocrystals, suggesting heterogeneous nucleation of nanocrystals in the amorphous matrix or a cooperative mechanism of nucleation between BCC and FCC nanocrystallites. APT results show evidence for (i) the segregation of Fe and Ni between nanocrystals of different phases, (ii) B partitioning to the amorphous phase, and (iii) an Nb‐enriched shell surrounding nanocrystals.

Atom probe crystallography: Characterization of grain boundary orientation relationships in nanocrystalline aluminium

2011 ◽  
Vol 111 (6) ◽  
pp. 493-499 ◽  
Author(s):  
Michael P. Moody ◽  
Fengzai Tang ◽  
Baptiste Gault ◽  
Simon P. Ringer ◽  
Julie M. Cairney
Keyword(s):  
Grain Boundary ◽  
Atom Probe ◽  
Orientation Relationships ◽  
Boundary Orientation

scholarly journals Micro and Nanoscale Characterization of Complex Multilayer-Structured White Etching Layer in Rails

Metals ◽  
2018 ◽  
Vol 8 (10) ◽  
pp. 749 ◽  
Author(s):  
Jun Wu ◽  
Roumen Petrov ◽  
Sebastian Kölling ◽  
Paul Koenraad ◽  
Loic Malet ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Rail Steel ◽  
Electron Backscatter Diffraction ◽  
Thickness Distribution ◽  
Atom Probe ◽  
Transmission Electron ◽  
Nanoscale Characterization ◽  
Scale Characterization

Micro- to nano-scale characterization of the microstructures in the white etching layer (WEL), observed in a Dutch R260 Mn grade rail steel, was performed via various techniques. Retained austenite in the WEL was identified via electron backscatter diffraction (EBSD), automatic crystallographic orientation mapping in transmission electron microscopy (ACOM-TEM), and X-ray diffraction (XRD). EBSD and ACOM-TEM methods were used to quantify grains (size range: 50 nm–4 μm) in the WEL. Transmission electron microscopy (TEM) was used to identify complex heterogeneous microstructural morphologies in the WEL: Nano-twinning substructure with high dislocation density in the WEL close to the rail surface and untransformed cementite and dislocations in the WEL close to the pearlite matrix. Furthermore, atom probe tomography (APT) revealed a heterogeneous through-thickness distribution of alloying elements in the WEL. Accordingly, the WEL is considered a multi-layered martensitic microstructure. These findings are supported by the temperature calculations from the shape analysis of the manganese profile from APT measurements, related to manganese diffusion. The deformation characteristics of the WEL and the pearlite beneath the WEL are discussed based on the EBSD measurements. The role of deformation in the martensitic phase transformation for WEL formation is discussed.

On the Role of Characterization in the Design of Interfaces in Nanoscale Materials Technology

2004 ◽  
Vol 10 (3) ◽  
pp. 324-335 ◽  
Author(s):  
S.P. Ringer ◽  
K.R. Ratinac
Keyword(s):  
Three Dimensional ◽  
Atom Probe ◽  
Turbine Rotor ◽  
Clay Nanocomposites ◽  
Multimodal Approach ◽  
Transmission Electron ◽  
Different Types ◽  
And Control

This work reviews recent research on the design and control of interfaces in engineering nanomaterials. Four case studies are presented that demonstrate the power of a multimodal approach to the characterization of different types of interfaces. We have used a combination of conventional, high resolution, and analytical transmission electron microscopy, microbeam electron diffraction, and three-dimensional atom probe to study polymer–clay nanocomposites, turbine rotor steels used for power generation, multicomponent aluminum alloys, and nanocrystalline magnetic materials.

Structure of Fe-Based Metallic Glass after Crystallization Process

2010 ◽  
Vol 163 ◽  
pp. 165-168 ◽  
Author(s):  
Ryszard Nowosielski ◽  
Rafał Babilas ◽  
Grzegorz Dercz ◽  
Lucjan Pająk
Keyword(s):  
Magnetic Properties ◽  
Metallic Glass ◽  
Structural Changes ◽  
Crystallization Process ◽  
X Ray Diffraction ◽  
Soft Magnetic ◽  
After Effects ◽  
Transmission Electron ◽  
Saturation Induction

The work presents a crystallization process of Fe-based amorphous alloy by characterization of the influence of annealing temperature on structural changes and magnetic properties of Fe72B20Si4Nb4 metallic glass. The studies were performed on the samples in the form of ribbons and rods. Crystallization behaviour of the studied alloy was examined by X-ray diffraction (XRD) and transmission electron microscopy (TEM) methods. The studies of soft magnetic properties of tested material involved magnetic permeability, saturation induction, coercive field and magnetic after-effects measurements.

NANO CHARACTERIZATION OF MATERIALS

2008 ◽  
Vol 18 (04) ◽  
pp. 861-878 ◽  
Author(s):  
DIETER K. SCHRODER
Keyword(s):  
Atom Probe ◽  
Electron Holography ◽  
Magnetic Exchange ◽  
Force Microscopy ◽  
Transmission Electron ◽  
Long Time ◽  
Ion Microscopy ◽  
Characterization Of Materials ◽  
User Friendly

Material characterization is challenged by continuously decreasing device dimensions placing significant demands on characterization instruments and measurement interpretation. Numerous techniques exist and a few are highlighted here. Some of these have existed for a long time, while others have only emerged from the laboratory recently. Generally they are more user-friendly and have reasonable turn-around times. The trend in many techniques is clearly toward characterization of smaller dimensions. Among the myriad of characterization techniques in use today, I will discuss recent advances in transmission electron microscopy (TEM), electron holography, magnetic exchange force microscopy (MExFM), atom probe ion field ion microscopy, and X-ray tomography. They have made significant advances in the last few years and in some cases have produced very impressive results. For example, TEM is now able to generate images with 0.05 nm resolution, allowing display of individual atoms. MExFM in conjunction with magnetic fields has demonstrated vertical resolution of 0.0015 nm. Helium ion microscopy is also highlighted because it contributes a new application of ion beams, which had been largely the domain of Rutherford backscattering. Progress in developing further advances in nm dimensional characterization will, no doubt, continue to satisfy the demand for such measurements in the future.

scholarly journals Atom Scale Characterization of the Near Apex Region of an Atomic Force Microscope Tip

2010 ◽  
Vol 16 (5) ◽  
pp. 636-642 ◽  
Author(s):  
Christopher J. Tourek ◽  
Sriram Sundararajan
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Atom Probe ◽  
Material Structure ◽  
Atomic Force ◽  
Transmission Electron ◽  
Afm Tips ◽  
Scale Characterization

AbstractThree-dimensional atom probe tomography (APT) is successfully used to analyze the near-apex regions of an atomic force microscope (AFM) tip. Atom scale material structure and chemistry from APT analysis for standard silicon AFM tips and silicon AFM tips coated with a thin film of Cu is presented. Comparison of the thin film data with that observed using transmission electron microscopy indicates that APT can be reliably used to investigate the material structure and chemistry of the apex of an AFM tip at near atomic scales.

Mass Balance and Atom Probe Tomography Characterization of Soft Magnetic (Fe65Co65)79.5B13Si2Nb4Cu1.5 Nanocomposites

2015 ◽  
Vol 51 (6) ◽  
pp. 1-4 ◽  
Author(s):  
Vincent DeGeorge ◽  
Arun Devaraj ◽  
Vladimir Keylin ◽  
Jun Cui ◽  
Michael E. McHenry
Keyword(s):  
Mass Balance ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Soft Magnetic
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