scholarly journals Metrological provision of measurement using NanoScan-3D microscopenanothercomer

2021 ◽  
Author(s):  
Viktor Denysiuk ◽  
Volodymyr Symonyuk ◽  
Yurii Lapchenko ◽  
Anton Tymoshchuk ◽  
Sofiia Cherniak
Keyword(s):  
Mechanical Properties ◽  
Scanning Probe Microscopy ◽  
Metrological Provision ◽  
Abrasion Resistance ◽  
Surface Relief ◽  
Scanning Probe ◽  
Main Element ◽  
Original Design ◽  
Thin Coatings ◽  
Measuring Techniques

A review of methods and instrumentation for the study of tribological and mechanical properties of the surface. It is established that the most common methods for studying these properties in the micro and nano-ranges are contact methods based on the interaction of the hard tip with the material under study. In scanning probe microscopy, a bimorph piezoceramic probe with a diamond tip is the main element of the measurement modules used for nanoindentation and sclerometry to comprehensively study the tribological and mechanical properties of the surface. The original design of the sensor allows to implement more than ten measuring techniques on one device. The operation of these devices in the semi-contact scanning probe-microscopic mode allows to obtain images of the surface relief and a map of the distribution of elastic properties. The indentation mode allows to measure hardness and modulus of elasticity, to estimate elastic recovery of material after indentation. The method allows to determine the abrasion resistance and hardness of the material, adhesion and thickness of thin coatings.

Sample stage designed for force modulation microscopy using a tip-mounted AFM scanner

The Analyst ◽  
2016 ◽  
Vol 141 (5) ◽  
pp. 1753-1760 ◽  
Author(s):  
Lu Lu ◽  
Song Xu ◽  
Donghui Zhang ◽  
Jayne C. Garno
Keyword(s):  
Mechanical Properties ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Force Modulation ◽  
Topographic Information

Among the modes of scanning probe microscopy (SPM), force modulation microscopy (FMM) is often used to acquire mechanical properties of samples concurrent with topographic information.

Optimum KOH Wet Etching of Cantilever Tip for Better Image Captured by Nanoeducator

2011 ◽  
Vol 84-85 ◽  
pp. 392-395
Author(s):  
Agus Geter Edy Sutjipto ◽  
Waleed Fekry Faris ◽  
Erry Y.T. Adesta ◽  
Hafizah Hanim
Keyword(s):  
Scanning Probe Microscopy ◽  
Atomic Scale ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Etching Time ◽  
Atomic Force ◽  
Measuring Techniques ◽  
Quality Image ◽  
Scanning Force ◽  
Microscopy Techniques

The development of the various scanning probe microscopy techniques has revolutionized the study of surface structure up to atomic scale. Among these techniques, Nanoeducator as scanning force microscope or SFM has been developed to allow the accomplishment of various measuring techniques both for scanning tunneling microscope (STM) and non-contact atomic force microscope (AFM). However, there is no exact guidance how to fabricate cantilever to gather the good image. In order to achieve the better cantilever for students, this paper emphasizes on tip’s processing by altering etching length parameter as tip plays an important role to achieve better quality image during scanning operation. This paper also provides a guide for undergraduate student to know better about this machine as well as the principle behind it for them to acquire better quality image for their works. It was found that the number of turning of tungsten and etching time could produce good tip of cantilever. It is recommended for lecturers, students and technician to consider about turning and time of etching to produce a better tip of cantilever in Nanoeducator.

scholarly journals Advanced Nanomeasuring Techniques for Surface Characterization

ISRN Optics ◽  
2012 ◽  
Vol 2012 ◽  
pp. 1-23 ◽  
Author(s):  
Salah H. R. Ali
Keyword(s):  
Scanning Probe Microscopy ◽  
Surface Characterization ◽  
Technical Committee ◽  
Scanning Probe ◽  
Nanometer Scale ◽  
Measuring Techniques ◽  
Basic Approaches ◽  
Computing Measuring ◽  
Areal Surface

Advanced precise and accurate nanomeasurement techniques play an important role to improve the function and quality of surface characterization. There are two basic approaches, the hard measuring techniques and the soft computing measuring techniques. The advanced soft measuring techniques include coordinate measuring machines, roundness testing facilities, surface roughness, interferometric methods, confocal optical microscopy, scanning probe microscopy, and computed tomography at the level of nanometer scale. On the other hand, a new technical committee in ISO is established to address characterization issues posed by the areal surface texture and measurement methods. This paper reviews the major advanced soft metrology techniques obtained by optical, tactile, and other means using instruments, classification schemes of them, and their applications in the engineering surfaces. Furthermore, future trends under development in this area are presented and discussed to display proposed solutions for the important issues that need to be addressed scientifically.

Multimodal scanning probe imaging: nanoscale chemical analysis from biology to renewable energy

2015 ◽  
Vol 7 (17) ◽  
pp. 7106-7127 ◽  
Author(s):  
J. J. Bang ◽  
S. R. Russell ◽  
K. K. Rupp ◽  
S. A. Claridge
Keyword(s):  
Mechanical Properties ◽  
Renewable Energy ◽  
Chemical Analysis ◽  
Surface Chemistry ◽  
Surface Topography ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy

Multimodal scanning probe microscopy enables analysis of not only surface topography, but also surface chemistry, electrical, magnetic, and mechanical properties.

Imaging Mechanical Properties of Living Cells by Scanning Probe Microscopy

2007 ◽  
Vol 3 (1) ◽  
pp. 97-103 ◽  
Author(s):  
Hisashi Haga ◽  
Masafumi Nagayama ◽  
Kazushige Kawabata
Keyword(s):  
Mechanical Properties ◽  
Scanning Probe Microscopy ◽  
Living Cells ◽  
Scanning Probe ◽  
Probe Microscopy

Scanning probe microscopy of polymers in the field emission SEM

1996 ◽  
Vol 54 ◽  
pp. 876-877
Author(s):  
J. Brostin
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Sem Images ◽  
Thin Coatings ◽  
Probe Microscopy ◽  
Average Atomic Number ◽  
Electron Mode ◽  
Backscattered Electron

The field emission SEM (FESEM) is well suited for imaging polymer and other non-conductive surfaces. High resolution SEM images can be obtained without the application of a conductive coating when operated at low accelerating voltages. Compositional imaging in the backscattered electron mode is facilitated at low voltages by the incorporation of a microchannel plate (MCP) detector. The MCP equipped FESEM has been shown to be phenomenally sensitive to very small differences in average atomic number. Compositional contrasts are achieved in polymer and other low-Z composites that differ only in oxygen content. Those systems that completely lack intrinsic contrast can be differentially stained with ruthenium tetroxide vapors.These capabilities make the FESEM an ideal platform for locating phases and/or subtle features for scanning probe microscopy (SPM). Transparent, thin coatings or very fine, heterogeneously dispersed structures that cannot be readily located or observed with conventional light optics can generally be seen in the FESEM.

Mechanical Evaluation of Thermal Transitions in Polymer Nanofibres Using SPM

2007 ◽  
Vol 1025 ◽  
Author(s):  
Wei Wang ◽  
Shuangwu Li ◽  
Asa H. Barber
Keyword(s):  
Mechanical Properties ◽  
Surface Area ◽  
Scanning Probe Microscopy ◽  
Mechanical Performance ◽  
Fibre Diameter ◽  
Volume Ratio ◽  
Scanning Probe ◽  
Thermal Transitions ◽  
Small Fibre ◽  
Effects Of Temperature

AbstractPolymer nanofibres produced by electrospinning techniques have unique mechanical properties due to their large surface area to volume ratio and potentially high molecular orientation. The effects of temperature on mechanical properties is challenging to measure due to the small fibre diameters produced. In this paper, scanning probe microscopy (SPM) is successfully used to elucidate the mechanical performance of individual electrospun polyvinyl alcohol (PVA) nanofibres over a range of temperatures. As observed in the results, thermal transitions have a dramatic effect on the mechanical behaviour of the nanofibres and are highlighted using SPM techniques analogous to dynamic mechanical thermal analysis but at the nanoscale. Interestingly, nanofibre thermal transitions are shown to be mediated by fibre diameter and the driving force of reducing the surface area of the nanofibre.

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